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Mostrati risultati da 1 a 20 di 246
Titolo Data di pubblicazione Autore(i) File
Effect of O : Er concentration ratio on the structural, electrical, and optical properties of Si : Er : O layers grown by molecular beam epitaxy 1-gen-2000 Scalese, S; Franzo, G; Mirabella, Salvatore; Re, M; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Spinella, C; Carnera, A. file da validare
Si:Er:O layers grown by molecular beam epitaxy: Structural, electrical and optical properties 1-gen-2001 Scalese, S; Franzo, G; Mirabella, Salvatore; Re, M; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Camera, A. file da validare
Complete suppression of the transient enhanced diffusion of B implanted in preamorphized Si by interstitial trapping in a spatially separated C-rich layer 1-gen-2001 Napolitani, E; Coati, A; De Salvador, D; Carnera, A; Mirabella, Salvatore; Scalese, S; Priolo, Francesco file da validare
Structural characterisation and stability of Si1-xGex/Si(100) heterostructures grown by molecular beam epitaxy 1-gen-2001 Re, M; Scalese, S; Mirabella, Salvatore; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Berti, M; Coati, A; Drigo, A; Carnera, A; De Salvador, D; Spinella, C; La Mantia, A. file da validare
Interaction between self-interstitials and substitutional C in silicon: Interstitial trapping and C clustering mechanism 1-gen-2002 Mirabella, Salvatore; Coati, A; De Salvador, D; Napolitani, E; Mattoni, A; Bisognin, G; Berti, M; Carnera, A; Drigo, Av; Scalese, S; Pulvirenti, S; Terrasi, Antonio; Priolo, Francesco file da validare
Complete suppression of the Transient Enhanced Diffusion of B implanted in preamorphized silicon by interstitials trapping in a spatially separeted C-rich layer 1-gen-2002 E., Napolitani; A., Coati; D., De Salvador; A., Carnera; Mirabella, Salvatore; S., Scalese; Priolo, Francesco file da validare
Self-interstitials and substitutional C in silicon: Interstitial- trapping and C- clustering 1-gen-2002 Mirabella, Salvatore; S., Scalese; Terrasi, Antonio; Priolo, Francesco; A., Coati; D., De Salvador; E., Napolitani; M., Berti file da validare
Suppression of boron transient enhanced diffusion by C trapping 1-gen-2002 Mirabella, Salvatore; Coati, A; Scalese, S; De Salvador, D; Pulvirenti, S; Bisognin, G; Napolitani, E; Terrasi, Antonio; Berti, M; Carnera, A; Drigo, Av; Priolo, Francesco file da validare
Self-interstitials and substitutional C in silicon: Interstitial-trapping and C-clustering 1-gen-2002 Mirabella, Salvatore; Scalese, S; Terrasi, Antonio; Priolo, Francesco; Coati, A; De Salvador, D; Napolitani, E; Berti, M. file da validare
Modeling of self-interstitial diffusion in implanted molecular beam epitaxy silicon 1-gen-2002 De Salvador, D.; Mattoni, A.; Napolitani, E.; Drigo, A. V.; Mirabella, Salvatore; Priolo, F. file da validare
Direct observation of two-dimensional diffusion of the self-interstitials in crystalline Si 1-gen-2002 Giannazzo, F; Mirabella, Salvatore; Salvador, Dd; Napolitani, E; Raineri, V; Carnera, A; Drigo, Av; Terrasi, Antonio; Priolo, Francesco file da validare
Scanning capacitance microscopy of semiconductors for process and device characterisation 1-gen-2003 Raineri, V; Goghero, D; Giannazzo, F; Mirabella, Salvatore; Priolo, Francesco; Napolitani, E. file da validare
METHOD FOR SUPPRESSING TRANSIENT ENHANCED DIFFUSION OF DOPANTS IN SILICON 1-gen-2003 Napolitani, Enrico; Priolo, Francesco; Scalese, Silvia; Carnera, Alberto; Coati, Alessandro; SALVADOR DAVIDE, De; Mirabella, Salvatore file da validare
XPS and RBS investigations of Si-Er-O interactions on a Si(100)-2x1 surface 1-gen-2003 Scalese, S; Mirabella, Salvatore; Terrasi, Antonio file da validare
Dissolution kinetics of boron-interstitial clusters in silicon 1-gen-2003 Mirabella, Salvatore; Bruno, Elena; Priolo, Francesco; De Salvador, D; Napolitani, E; Drigo, Av; Carnera, A.
Carrier concentration and mobility in B doped Si1-xGex 1-gen-2003 Romano, Lucia; Napolitani, E; Privitera, V; Scalese, S; Terrasi, Antonio; Mirabella, Salvatore; Grimaldi, Maria Grazia
Scanning capacitance microscopy on ultranarrow doping profiles in Si 1-gen-2003 Giannazzo, F; Goghero, D; Raineri, V; Mirabella, Salvatore; Priolo, Francesco file da validare
Two-dimensional interstitial diffusion in silicon monitored by scanning capacitance microscopy 1-gen-2003 Giannazzo, F; Mirabella, Salvatore; Raineri, V; De Salvador, D; Napolitani, E; Terrasi, Antonio; Carnera, A; Drigo, Av; Priolo, Francesco file da validare
New insight on the interaction and diffusion properties of ion beam injected self-interstitials in crystalline silicon 1-gen-2003 De Salvador, D; Napolitani, E; Mirabella, Salvatore; Giannazzo, F; Raineri, V; Bisognin, G; Berti, M; Carnera, A; Drigo, Av; Terrasi, Antonio; Priolo, Francesco file da validare
Diffusion of ion beam injected self-interstitial defects in silicon layers grown by molecular beam epitaxy 1-gen-2004 De Salvador, D; Napolitani, E; Mirabella, Salvatore; Impellizzeri, G; Priolo, Francesco; Terrasi, Antonio; Bisognin, G; Berti, M; Drigo, Av; Carnera, A. file da validare
Mostrati risultati da 1 a 20 di 246
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