Sfoglia per Autore
Effect of O : Er concentration ratio on the structural, electrical, and optical properties of Si : Er : O layers grown by molecular beam epitaxy
file da validare2000-01-01 Scalese, S; Franzo, G; Mirabella, Salvatore; Re, M; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Spinella, C; Carnera, A.
Si:Er:O layers grown by molecular beam epitaxy: Structural, electrical and optical properties
file da validare2001-01-01 Scalese, S; Franzo, G; Mirabella, Salvatore; Re, M; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Camera, A.
Complete suppression of the transient enhanced diffusion of B implanted in preamorphized Si by interstitial trapping in a spatially separated C-rich layer
file da validare2001-01-01 Napolitani, E; Coati, A; De Salvador, D; Carnera, A; Mirabella, Salvatore; Scalese, S; Priolo, Francesco
Structural characterisation and stability of Si1-xGex/Si(100) heterostructures grown by molecular beam epitaxy
file da validare2001-01-01 Re, M; Scalese, S; Mirabella, Salvatore; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Berti, M; Coati, A; Drigo, A; Carnera, A; De Salvador, D; Spinella, C; La Mantia, A.
Interaction between self-interstitials and substitutional C in silicon: Interstitial trapping and C clustering mechanism
file da validare2002-01-01 Mirabella, Salvatore; Coati, A; De Salvador, D; Napolitani, E; Mattoni, A; Bisognin, G; Berti, M; Carnera, A; Drigo, Av; Scalese, S; Pulvirenti, S; Terrasi, Antonio; Priolo, Francesco
Complete suppression of the Transient Enhanced Diffusion of B implanted in preamorphized silicon by interstitials trapping in a spatially separeted C-rich layer
file da validare2002-01-01 E., Napolitani; A., Coati; D., De Salvador; A., Carnera; Mirabella, Salvatore; S., Scalese; Priolo, Francesco
Self-interstitials and substitutional C in silicon: Interstitial- trapping and C- clustering
file da validare2002-01-01 Mirabella, Salvatore; S., Scalese; Terrasi, Antonio; Priolo, Francesco; A., Coati; D., De Salvador; E., Napolitani; M., Berti
Suppression of boron transient enhanced diffusion by C trapping
file da validare2002-01-01 Mirabella, Salvatore; Coati, A; Scalese, S; De Salvador, D; Pulvirenti, S; Bisognin, G; Napolitani, E; Terrasi, Antonio; Berti, M; Carnera, A; Drigo, Av; Priolo, Francesco
Self-interstitials and substitutional C in silicon: Interstitial-trapping and C-clustering
file da validare2002-01-01 Mirabella, Salvatore; Scalese, S; Terrasi, Antonio; Priolo, Francesco; Coati, A; De Salvador, D; Napolitani, E; Berti, M.
Modeling of self-interstitial diffusion in implanted molecular beam epitaxy silicon
file da validare2002-01-01 De Salvador, D.; Mattoni, A.; Napolitani, E.; Drigo, A. V.; Mirabella, Salvatore; Priolo, F.
Direct observation of two-dimensional diffusion of the self-interstitials in crystalline Si
file da validare2002-01-01 Giannazzo, F; Mirabella, Salvatore; Salvador, Dd; Napolitani, E; Raineri, V; Carnera, A; Drigo, Av; Terrasi, Antonio; Priolo, Francesco
Scanning capacitance microscopy of semiconductors for process and device characterisation
file da validare2003-01-01 Raineri, V; Goghero, D; Giannazzo, F; Mirabella, Salvatore; Priolo, Francesco; Napolitani, E.
METHOD FOR SUPPRESSING TRANSIENT ENHANCED DIFFUSION OF DOPANTS IN SILICON
file da validare2003-01-01 Napolitani, Enrico; Priolo, Francesco; Scalese, Silvia; Carnera, Alberto; Coati, Alessandro; SALVADOR DAVIDE, De; Mirabella, Salvatore
XPS and RBS investigations of Si-Er-O interactions on a Si(100)-2x1 surface
file da validare2003-01-01 Scalese, S; Mirabella, Salvatore; Terrasi, Antonio
Dissolution kinetics of boron-interstitial clusters in silicon
2003-01-01 Mirabella, Salvatore; Bruno, Elena; Priolo, Francesco; De Salvador, D; Napolitani, E; Drigo, Av; Carnera, A.
Carrier concentration and mobility in B doped Si1-xGex
2003-01-01 Romano, Lucia; Napolitani, E; Privitera, V; Scalese, S; Terrasi, Antonio; Mirabella, Salvatore; Grimaldi, Maria Grazia
Scanning capacitance microscopy on ultranarrow doping profiles in Si
file da validare2003-01-01 Giannazzo, F; Goghero, D; Raineri, V; Mirabella, Salvatore; Priolo, Francesco
Two-dimensional interstitial diffusion in silicon monitored by scanning capacitance microscopy
file da validare2003-01-01 Giannazzo, F; Mirabella, Salvatore; Raineri, V; De Salvador, D; Napolitani, E; Terrasi, Antonio; Carnera, A; Drigo, Av; Priolo, Francesco
New insight on the interaction and diffusion properties of ion beam injected self-interstitials in crystalline silicon
file da validare2003-01-01 De Salvador, D; Napolitani, E; Mirabella, Salvatore; Giannazzo, F; Raineri, V; Bisognin, G; Berti, M; Carnera, A; Drigo, Av; Terrasi, Antonio; Priolo, Francesco
Diffusion of ion beam injected self-interstitial defects in silicon layers grown by molecular beam epitaxy
file da validare2004-01-01 De Salvador, D; Napolitani, E; Mirabella, Salvatore; Impellizzeri, G; Priolo, Francesco; Terrasi, Antonio; Bisognin, G; Berti, M; Drigo, Av; Carnera, A.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Effect of O : Er concentration ratio on the structural, electrical, and optical properties of Si : Er : O layers grown by molecular beam epitaxy | 1-gen-2000 | Scalese, S; Franzo, G; Mirabella, Salvatore; Re, M; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Spinella, C; Carnera, A. | file da validare |
Si:Er:O layers grown by molecular beam epitaxy: Structural, electrical and optical properties | 1-gen-2001 | Scalese, S; Franzo, G; Mirabella, Salvatore; Re, M; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Camera, A. | file da validare |
Complete suppression of the transient enhanced diffusion of B implanted in preamorphized Si by interstitial trapping in a spatially separated C-rich layer | 1-gen-2001 | Napolitani, E; Coati, A; De Salvador, D; Carnera, A; Mirabella, Salvatore; Scalese, S; Priolo, Francesco | file da validare |
Structural characterisation and stability of Si1-xGex/Si(100) heterostructures grown by molecular beam epitaxy | 1-gen-2001 | Re, M; Scalese, S; Mirabella, Salvatore; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Berti, M; Coati, A; Drigo, A; Carnera, A; De Salvador, D; Spinella, C; La Mantia, A. | file da validare |
Interaction between self-interstitials and substitutional C in silicon: Interstitial trapping and C clustering mechanism | 1-gen-2002 | Mirabella, Salvatore; Coati, A; De Salvador, D; Napolitani, E; Mattoni, A; Bisognin, G; Berti, M; Carnera, A; Drigo, Av; Scalese, S; Pulvirenti, S; Terrasi, Antonio; Priolo, Francesco | file da validare |
Complete suppression of the Transient Enhanced Diffusion of B implanted in preamorphized silicon by interstitials trapping in a spatially separeted C-rich layer | 1-gen-2002 | E., Napolitani; A., Coati; D., De Salvador; A., Carnera; Mirabella, Salvatore; S., Scalese; Priolo, Francesco | file da validare |
Self-interstitials and substitutional C in silicon: Interstitial- trapping and C- clustering | 1-gen-2002 | Mirabella, Salvatore; S., Scalese; Terrasi, Antonio; Priolo, Francesco; A., Coati; D., De Salvador; E., Napolitani; M., Berti | file da validare |
Suppression of boron transient enhanced diffusion by C trapping | 1-gen-2002 | Mirabella, Salvatore; Coati, A; Scalese, S; De Salvador, D; Pulvirenti, S; Bisognin, G; Napolitani, E; Terrasi, Antonio; Berti, M; Carnera, A; Drigo, Av; Priolo, Francesco | file da validare |
Self-interstitials and substitutional C in silicon: Interstitial-trapping and C-clustering | 1-gen-2002 | Mirabella, Salvatore; Scalese, S; Terrasi, Antonio; Priolo, Francesco; Coati, A; De Salvador, D; Napolitani, E; Berti, M. | file da validare |
Modeling of self-interstitial diffusion in implanted molecular beam epitaxy silicon | 1-gen-2002 | De Salvador, D.; Mattoni, A.; Napolitani, E.; Drigo, A. V.; Mirabella, Salvatore; Priolo, F. | file da validare |
Direct observation of two-dimensional diffusion of the self-interstitials in crystalline Si | 1-gen-2002 | Giannazzo, F; Mirabella, Salvatore; Salvador, Dd; Napolitani, E; Raineri, V; Carnera, A; Drigo, Av; Terrasi, Antonio; Priolo, Francesco | file da validare |
Scanning capacitance microscopy of semiconductors for process and device characterisation | 1-gen-2003 | Raineri, V; Goghero, D; Giannazzo, F; Mirabella, Salvatore; Priolo, Francesco; Napolitani, E. | file da validare |
METHOD FOR SUPPRESSING TRANSIENT ENHANCED DIFFUSION OF DOPANTS IN SILICON | 1-gen-2003 | Napolitani, Enrico; Priolo, Francesco; Scalese, Silvia; Carnera, Alberto; Coati, Alessandro; SALVADOR DAVIDE, De; Mirabella, Salvatore | file da validare |
XPS and RBS investigations of Si-Er-O interactions on a Si(100)-2x1 surface | 1-gen-2003 | Scalese, S; Mirabella, Salvatore; Terrasi, Antonio | file da validare |
Dissolution kinetics of boron-interstitial clusters in silicon | 1-gen-2003 | Mirabella, Salvatore; Bruno, Elena; Priolo, Francesco; De Salvador, D; Napolitani, E; Drigo, Av; Carnera, A. | |
Carrier concentration and mobility in B doped Si1-xGex | 1-gen-2003 | Romano, Lucia; Napolitani, E; Privitera, V; Scalese, S; Terrasi, Antonio; Mirabella, Salvatore; Grimaldi, Maria Grazia | |
Scanning capacitance microscopy on ultranarrow doping profiles in Si | 1-gen-2003 | Giannazzo, F; Goghero, D; Raineri, V; Mirabella, Salvatore; Priolo, Francesco | file da validare |
Two-dimensional interstitial diffusion in silicon monitored by scanning capacitance microscopy | 1-gen-2003 | Giannazzo, F; Mirabella, Salvatore; Raineri, V; De Salvador, D; Napolitani, E; Terrasi, Antonio; Carnera, A; Drigo, Av; Priolo, Francesco | file da validare |
New insight on the interaction and diffusion properties of ion beam injected self-interstitials in crystalline silicon | 1-gen-2003 | De Salvador, D; Napolitani, E; Mirabella, Salvatore; Giannazzo, F; Raineri, V; Bisognin, G; Berti, M; Carnera, A; Drigo, Av; Terrasi, Antonio; Priolo, Francesco | file da validare |
Diffusion of ion beam injected self-interstitial defects in silicon layers grown by molecular beam epitaxy | 1-gen-2004 | De Salvador, D; Napolitani, E; Mirabella, Salvatore; Impellizzeri, G; Priolo, Francesco; Terrasi, Antonio; Bisognin, G; Berti, M; Drigo, Av; Carnera, A. | file da validare |
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