Four novel Cd(C5F6HO2)(2).polyether adducts were prepared through simple procedures with stoichiometric quantities of cadmium oxide, hexafluoroacetylacetone C5F6H2O2, and different polyethers. The products were characterized by elemental analysis, X-ray single-crystal analysis, mass spectra, NMR spectra, thermal measurements, and infrared transmittance spectroscopy. X-ray single-crystal data of the Cd(C5F6HO2)(2).polyether adducts showed that all the oxygen atoms of the polyether molecules coordinate the cadmium cation. Very mild heating (44-74 degreesC) resulted in thermal stable, liquid compounds which, in turn, can be easily evaporated. Gas-phase deposition experiments, in a low-pressure horizontal hot-wall reactor, on SiO2 substrates, resulted in CdO films. XRD measurements provided evidence that they consist of cubic, (100)-oriented, crystals. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%.

Synthesis and characterization of liquid MOCVD precursors for thin films of cadmium oxide

GULINO, Antonino;
2002-01-01

Abstract

Four novel Cd(C5F6HO2)(2).polyether adducts were prepared through simple procedures with stoichiometric quantities of cadmium oxide, hexafluoroacetylacetone C5F6H2O2, and different polyethers. The products were characterized by elemental analysis, X-ray single-crystal analysis, mass spectra, NMR spectra, thermal measurements, and infrared transmittance spectroscopy. X-ray single-crystal data of the Cd(C5F6HO2)(2).polyether adducts showed that all the oxygen atoms of the polyether molecules coordinate the cadmium cation. Very mild heating (44-74 degreesC) resulted in thermal stable, liquid compounds which, in turn, can be easily evaporated. Gas-phase deposition experiments, in a low-pressure horizontal hot-wall reactor, on SiO2 substrates, resulted in CdO films. XRD measurements provided evidence that they consist of cubic, (100)-oriented, crystals. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%.
2002
CdO; film; XPS
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11769/52361
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