Summary This chapter contains sections titled: Introduction Thin and Thick Layers: A Tentative Definition What Specific Information MS Techniques could Bring to thin and thick Films Analysis Compared to other Techniques? Main MS Techniques Applied to Thin/Thick Films Time of Sputtering/Speed of Acquisition Trade-Off Differences in Sputtering/Ionization Mechanisms between SIMS and GD-MS Pulse Shapes and how to Best Use Temporal Information for Pulsed Glow Discharge Mass Spectrometry Measurement and Data Interpretation in GD-TOFMS Practical Examples Conclusions List of Abbreviations References

Analysis of thin and thick films

Licciardello, A.;Tuccitto, N.;
2012-01-01

Abstract

Summary This chapter contains sections titled: Introduction Thin and Thick Layers: A Tentative Definition What Specific Information MS Techniques could Bring to thin and thick Films Analysis Compared to other Techniques? Main MS Techniques Applied to Thin/Thick Films Time of Sputtering/Speed of Acquisition Trade-Off Differences in Sputtering/Ionization Mechanisms between SIMS and GD-MS Pulse Shapes and how to Best Use Temporal Information for Pulsed Glow Discharge Mass Spectrometry Measurement and Data Interpretation in GD-TOFMS Practical Examples Conclusions List of Abbreviations References
2012
978-0-470-53673-5
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11769/76531
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