In this paper, an ultra-compact model for nanometer MOS transistors is proposed. Starting from modified and more accurate versions of classical compact models, all the main physical effects that are predominant in nanometer technologies are included in an extremely simple way. Model effectiveness is verified through simulations in a 65-nm CMOS technology.

An ultra-compact MOS model in nanometer technologies

GIUSTOLISI, Gianluca;PALUMBO, Gaetano
2011-01-01

Abstract

In this paper, an ultra-compact model for nanometer MOS transistors is proposed. Starting from modified and more accurate versions of classical compact models, all the main physical effects that are predominant in nanometer technologies are included in an extremely simple way. Model effectiveness is verified through simulations in a 65-nm CMOS technology.
2011
978-1-4577-0617-2
978-1-4577-0618-9
978-1-4577-0616-5
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11769/83001
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