SPAMPINATO, VALENTINA
SPAMPINATO, VALENTINA
SCIENZE CHIMICHE
[Co/Ni]-CoFeB hybrid free layer stack materials for high density magnetic random access memory applications
file da validare2016-01-01 Liu, E.; Swerts, J.; Couet, S.; Mertens, S.; Tomczak, Y.; Lin, T.; Spampinato, V.; Franquet, A.; Van Elshocht, S.; Kar, G.; Furnemont, A.; De Boeck, J.
A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices
file da validare2020-01-01 Spampinato, V.; Dialameh, M.; Franquet, A.; Fleischmann, C.; Conard, T.; Van Der Heide, P.; Vandervorst, W.
A flexible organic memory device with a clearly disclosed resistive switching mechanism
file da validare2019-01-01 Casula, G.; Busby, Y.; Franquet, A.; Spampinato, V.; Houssiau, L.; Bonfiglio, A.; Cosseddu, P.
A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication
file da validare2022-01-01 Kruv, A.; Gonzalez, M.; Okudur, O. O.; Spampinato, V.; Franquet, A.; Palayam, S. V.; Arreghini, A.; Van den bosch, G.; Rosmeulen, M.; De Wolf, I.
Al rich PVD protective coatings: A promising approach to prevent T91 steel corrosion in stagnant liquid lead
file da validare2019-01-01 Miorin, E.; Montagner, F.; Zin, V.; Giuranno, D.; Ricci, E.; Pedroni, M.; Spampinato, V.; Vassallo, E.; Deambrosis, S. M.
Area-Selective Atomic Layer Deposition of TiN Using Trimethoxy(octadecyl)silane as a Passivation Layer
file da validare2020-01-01 Zheng, Li; He, Wei; Spampinato, Valentina; Franquet, Alexis; Sergeant, Stefanie; Gendt, Stefan De; Armini, Silvia
Black-silicon production process by CF4/H2plasma
file da validare2016-01-01 Vassallo, E.; Pedroni, M.; Pietralunga, S. M.; Caniello, R.; Cremona, A.; Di Fonzo, F.; Ghezzi, F.; Inzoli, F.; Monteleone, G.; Nava, G.; Spampinato, V.; Tagliaferri, A.; Zani, M.; Angella, G.
Carbon nanotube EUV pellicle tunability and performance in a scanner-like environment
file da validare2021-01-01 Timmermans, M. Y.; Pollentier, I.; Korytov, M.; Nuytten, T.; Sergeant, S.; Conard, T.; Meersschaut, J.; Zhang, Y.; Dialameh, M.; Alaerts, W.; Jazaeri, E.; Spampinato, V.; Franquet, A.; Brems, S.; Huyghebaert, C.; Gallagher, E. E.
Characterisation of nanomaterial hydrophobicity using engineered surfaces
file da validare2017-01-01 Desmet, C.; Valsesia, A.; Oddo, A.; Ceccone, G.; Spampinato, V.; Rossi, F.; Colpo, P.
CNT EUV pellicle tunability and performance in a scanner-like environment
file da validare2021-01-01 Timmermans, M. Y.; Pollentier, I.; Korytov, M.; Nuytten, T.; Sergeant, S.; Conard, T.; Meersschaut, J.; Zhang, Y.; Dialameh, M.; Alaerts, W.; Jazaeri, E.; Spampinato, V.; Franquet, A.; Brems, S.; Huyghebaert, C.; Gallagher, E. E.
Combined AFM and ToF-SIMS analyses for the study of filaments in organic resistive switching memories
file da validare2018-01-01 Busby, Y.; Franquet, A.; Spampinato, V.; Casula, G.; Bonfiglio, A.; Cosseddu, P.; Pireaux, J. -J.; Houssiau, L.
Controlled Density Patterning of Tolylterpyridine-Tagged Oligonucleotides
file da validare2011-01-01 Tuccitto, Nunzio; Giamblanco, N; Ghosh, S; Spampinato, V; Labbe, P; Dumy, P; Quici, S; Marletta, Giovanni; Defrancq, E; Licciardello, Antonino
Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study. (Journal of Physical Chemistry B (2015) 119 (33) (10784-10797) DOI: 10.1021/acs.jpcb.5b05625)
file da validare2015-01-01 Shard, A. G.; Havelund, R.; Spencer, S. J.; Gilmore, I. S.; Alexander, M. R.; Angerer, T. B.; Aoyagi, S.; Barnes, J. -P.; Benayad, A.; Bernasik, A.; Ceccone, G.; Counsell, J. D. P.; Deeks, C.; Fletcher, J. S.; Graham, D. J.; Heuser, C.; Lee, T. G.; Marie, C.; Marzec, M. M.; Mishra, G.; Rading, D.; Renault, O.; Scurr, D. J.; Shon, H. K.; Spampinato, V.; Tian, H.; Wang, F.; Winograd, N.; Wu, K.; Wucher, A.; Zhou, Y.; Zhu, Z.; Cristaudo, V.; Poleunis, C.
Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization
file da validare2023-01-01 Spampinato, V.; Shi, Y.; Serron, J.; Minj, A.; Groven, B.; Hantschel, T.; van der Heide, P.; Franquet, A.
Defect Mitigation in Area-Selective Atomic Layer Deposition of Ruthenium on Titanium Nitride/Dielectric Nanopatterns
file da validare2019-01-01 Soethoudt, J.; Hody, H.; Spampinato, V.; Franquet, A.; Briggs, B.; Chan, B. T.; Delabie, A.
Direct imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors
file da validare2018-01-01 Op De Beeck, J.; Labyedh, N.; Sepúlveda, A.; Spampinato, V.; Franquet, A.; Conard, T.; Vereecken, P. M.; Celano, U.
Effect of alumina coatings on corrosion protection of steels in molten lead
file da validare2018-01-01 Vassallo, E.; Pedroni, M.; Spampinato, V.; Deambrosis, S. M.; Miorin, E.; Ricci, E.; Zin, V.
Effects of Cs+ and Arn+ ion bombardment on the damage of graphite crystals
file da validare2022-01-01 De Rosa, S.; Branchini, P.; Spampinato, V.; Franquet, A.; Bussetti, G.; Tortora, L.
Efficient long-range conduction in cable bacteria through nickel protein wires
file da validare2021-01-01 Boschker, H. T. S.; Cook, P. L. M.; Polerecky, L.; Eachambadi, R. T.; Lozano, H.; Hidalgo-Martinez, S.; Khalenkow, D.; Spampinato, V.; Claes, N.; Kundu, P.; Wang, D.; Bals, S.; Sand, K. K.; Cavezza, F.; Hauffman, T.; Bjerg, J. T.; Skirtach, A. G.; Kochan, K.; Mckee, M.; Wood, B.; Bedolla, D.; Gianoncelli, A.; Geerlings, N. M. J.; Van Gerven, N.; Remaut, H.; Geelhoed, J. S.; Millan-Solsona, R.; Fumagalli, L.; Nielsen, L. P.; Franquet, A.; Manca, J. V.; Gomila, G.; Meysman, F. J. R.
Enhanced Laterally Resolved ToF-SIMS and AFM Imaging of the Electrically Conductive Structures in Cable Bacteria
file da validare2021-01-01 Thiruvallur Eachambadi, R.; Boschker, H. T. S.; Franquet, A.; Spampinato, V.; Hidalgo-Martinez, S.; Valcke, R.; Meysman, F. J. R.; Manca, J. V.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| [Co/Ni]-CoFeB hybrid free layer stack materials for high density magnetic random access memory applications | 1-gen-2016 | Liu, E.; Swerts, J.; Couet, S.; Mertens, S.; Tomczak, Y.; Lin, T.; Spampinato, V.; Franquet, A.; Van Elshocht, S.; Kar, G.; Furnemont, A.; De Boeck, J. | file da validare |
| A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices | 1-gen-2020 | Spampinato, V.; Dialameh, M.; Franquet, A.; Fleischmann, C.; Conard, T.; Van Der Heide, P.; Vandervorst, W. | file da validare |
| A flexible organic memory device with a clearly disclosed resistive switching mechanism | 1-gen-2019 | Casula, G.; Busby, Y.; Franquet, A.; Spampinato, V.; Houssiau, L.; Bonfiglio, A.; Cosseddu, P. | file da validare |
| A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication | 1-gen-2022 | Kruv, A.; Gonzalez, M.; Okudur, O. O.; Spampinato, V.; Franquet, A.; Palayam, S. V.; Arreghini, A.; Van den bosch, G.; Rosmeulen, M.; De Wolf, I. | file da validare |
| Al rich PVD protective coatings: A promising approach to prevent T91 steel corrosion in stagnant liquid lead | 1-gen-2019 | Miorin, E.; Montagner, F.; Zin, V.; Giuranno, D.; Ricci, E.; Pedroni, M.; Spampinato, V.; Vassallo, E.; Deambrosis, S. M. | file da validare |
| Area-Selective Atomic Layer Deposition of TiN Using Trimethoxy(octadecyl)silane as a Passivation Layer | 1-gen-2020 | Zheng, Li; He, Wei; Spampinato, Valentina; Franquet, Alexis; Sergeant, Stefanie; Gendt, Stefan De; Armini, Silvia | file da validare |
| Black-silicon production process by CF4/H2plasma | 1-gen-2016 | Vassallo, E.; Pedroni, M.; Pietralunga, S. M.; Caniello, R.; Cremona, A.; Di Fonzo, F.; Ghezzi, F.; Inzoli, F.; Monteleone, G.; Nava, G.; Spampinato, V.; Tagliaferri, A.; Zani, M.; Angella, G. | file da validare |
| Carbon nanotube EUV pellicle tunability and performance in a scanner-like environment | 1-gen-2021 | Timmermans, M. Y.; Pollentier, I.; Korytov, M.; Nuytten, T.; Sergeant, S.; Conard, T.; Meersschaut, J.; Zhang, Y.; Dialameh, M.; Alaerts, W.; Jazaeri, E.; Spampinato, V.; Franquet, A.; Brems, S.; Huyghebaert, C.; Gallagher, E. E. | file da validare |
| Characterisation of nanomaterial hydrophobicity using engineered surfaces | 1-gen-2017 | Desmet, C.; Valsesia, A.; Oddo, A.; Ceccone, G.; Spampinato, V.; Rossi, F.; Colpo, P. | file da validare |
| CNT EUV pellicle tunability and performance in a scanner-like environment | 1-gen-2021 | Timmermans, M. Y.; Pollentier, I.; Korytov, M.; Nuytten, T.; Sergeant, S.; Conard, T.; Meersschaut, J.; Zhang, Y.; Dialameh, M.; Alaerts, W.; Jazaeri, E.; Spampinato, V.; Franquet, A.; Brems, S.; Huyghebaert, C.; Gallagher, E. E. | file da validare |
| Combined AFM and ToF-SIMS analyses for the study of filaments in organic resistive switching memories | 1-gen-2018 | Busby, Y.; Franquet, A.; Spampinato, V.; Casula, G.; Bonfiglio, A.; Cosseddu, P.; Pireaux, J. -J.; Houssiau, L. | file da validare |
| Controlled Density Patterning of Tolylterpyridine-Tagged Oligonucleotides | 1-gen-2011 | Tuccitto, Nunzio; Giamblanco, N; Ghosh, S; Spampinato, V; Labbe, P; Dumy, P; Quici, S; Marletta, Giovanni; Defrancq, E; Licciardello, Antonino | file da validare |
| Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study. (Journal of Physical Chemistry B (2015) 119 (33) (10784-10797) DOI: 10.1021/acs.jpcb.5b05625) | 1-gen-2015 | Shard, A. G.; Havelund, R.; Spencer, S. J.; Gilmore, I. S.; Alexander, M. R.; Angerer, T. B.; Aoyagi, S.; Barnes, J. -P.; Benayad, A.; Bernasik, A.; Ceccone, G.; Counsell, J. D. P.; Deeks, C.; Fletcher, J. S.; Graham, D. J.; Heuser, C.; Lee, T. G.; Marie, C.; Marzec, M. M.; Mishra, G.; Rading, D.; Renault, O.; Scurr, D. J.; Shon, H. K.; Spampinato, V.; Tian, H.; Wang, F.; Winograd, N.; Wu, K.; Wucher, A.; Zhou, Y.; Zhu, Z.; Cristaudo, V.; Poleunis, C. | file da validare |
| Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization | 1-gen-2023 | Spampinato, V.; Shi, Y.; Serron, J.; Minj, A.; Groven, B.; Hantschel, T.; van der Heide, P.; Franquet, A. | file da validare |
| Defect Mitigation in Area-Selective Atomic Layer Deposition of Ruthenium on Titanium Nitride/Dielectric Nanopatterns | 1-gen-2019 | Soethoudt, J.; Hody, H.; Spampinato, V.; Franquet, A.; Briggs, B.; Chan, B. T.; Delabie, A. | file da validare |
| Direct imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors | 1-gen-2018 | Op De Beeck, J.; Labyedh, N.; Sepúlveda, A.; Spampinato, V.; Franquet, A.; Conard, T.; Vereecken, P. M.; Celano, U. | file da validare |
| Effect of alumina coatings on corrosion protection of steels in molten lead | 1-gen-2018 | Vassallo, E.; Pedroni, M.; Spampinato, V.; Deambrosis, S. M.; Miorin, E.; Ricci, E.; Zin, V. | file da validare |
| Effects of Cs+ and Arn+ ion bombardment on the damage of graphite crystals | 1-gen-2022 | De Rosa, S.; Branchini, P.; Spampinato, V.; Franquet, A.; Bussetti, G.; Tortora, L. | file da validare |
| Efficient long-range conduction in cable bacteria through nickel protein wires | 1-gen-2021 | Boschker, H. T. S.; Cook, P. L. M.; Polerecky, L.; Eachambadi, R. T.; Lozano, H.; Hidalgo-Martinez, S.; Khalenkow, D.; Spampinato, V.; Claes, N.; Kundu, P.; Wang, D.; Bals, S.; Sand, K. K.; Cavezza, F.; Hauffman, T.; Bjerg, J. T.; Skirtach, A. G.; Kochan, K.; Mckee, M.; Wood, B.; Bedolla, D.; Gianoncelli, A.; Geerlings, N. M. J.; Van Gerven, N.; Remaut, H.; Geelhoed, J. S.; Millan-Solsona, R.; Fumagalli, L.; Nielsen, L. P.; Franquet, A.; Manca, J. V.; Gomila, G.; Meysman, F. J. R. | file da validare |
| Enhanced Laterally Resolved ToF-SIMS and AFM Imaging of the Electrically Conductive Structures in Cable Bacteria | 1-gen-2021 | Thiruvallur Eachambadi, R.; Boschker, H. T. S.; Franquet, A.; Spampinato, V.; Hidalgo-Martinez, S.; Valcke, R.; Meysman, F. J. R.; Manca, J. V. | file da validare |