BOMBACE, ALESSANDRA VITTORIA
BOMBACE, ALESSANDRA VITTORIA
Università degli Studi di CATANIA
A transport and reaction model for simulating secondary ion mass spectrometry depth profiles of polymeric materials
file da validare2019-01-01 Tuccitto, Nunzio; Valenti, Andrea; Bombace, Alessandra; Licciardello, Antonino
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry
file da validare2019-01-01 Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS
file da validare2018-01-01 Valenti, Andrea; Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Torrisi, Alberto; Licciardello, Antonino
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers
2018-01-01 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Extracting latent chemical information from ToFSIMS data arising from chemical imaging
file da validare2018-01-01 Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions
file da validare2017-01-01 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry
file da validare2018-01-01 Bombace, ALESSANDRA VITTORIA; Tuccitto, Nunzio; Torrisi, Alberto; Licciardello, Antonino
Nunzio Tuccitto, Alessandra Bombace, Alberto Torrisi, Antonino Licciardello
file da validare2018-01-01 Tuccitto, N.; Li Destri, G.; Messina, G. R.; Bombace, A.; Licciardello, A.; Marletta, Grazia
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra
2019-01-01 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino; Lo Sciuto, Grazia; Capizzi, Giacomo; Woźniak, Marcin
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset
2021-01-01 Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Auditore, Alessandro; Valenti, ANDREA MARIA GERARDO; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino
ToF-SIMS IMAGING AND DATA MINING APPROACHES FOR ORGANIC STRUCTURED SAMPLES
2021-05-13 Bombace, ALESSANDRA VITTORIA
ToFSIMS characterization of conductive molecular wires assembled onto oxide substrates
file da validare2018-01-01 Bombace, ALESSANDRA VITTORIA; Tuccitto, Nunzio; Valenti, ANDREA MARIA GERARDO; Torrisi, Alberto; Licciardello, Antonino
User-independent protocols for the analysis of complex ToFSIMSdatasets without mass binning, peak picking and peak integration
file da validare2018-01-01 Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A transport and reaction model for simulating secondary ion mass spectrometry depth profiles of polymeric materials | 1-gen-2019 | Tuccitto, Nunzio; Valenti, Andrea; Bombace, Alessandra; Licciardello, Antonino | file da validare |
| Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry | 1-gen-2019 | Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino | file da validare |
| Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS | 1-gen-2018 | Valenti, Andrea; Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Torrisi, Alberto; Licciardello, Antonino | file da validare |
| Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers | 1-gen-2018 | Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino | |
| Extracting latent chemical information from ToFSIMS data arising from chemical imaging | 1-gen-2018 | Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino | file da validare |
| Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions | 1-gen-2017 | Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino | file da validare |
| Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry | 1-gen-2018 | Bombace, ALESSANDRA VITTORIA; Tuccitto, Nunzio; Torrisi, Alberto; Licciardello, Antonino | file da validare |
| Nunzio Tuccitto, Alessandra Bombace, Alberto Torrisi, Antonino Licciardello | 1-gen-2018 | Tuccitto, N.; Li Destri, G.; Messina, G. R.; Bombace, A.; Licciardello, A.; Marletta, Grazia | file da validare |
| Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra | 1-gen-2019 | Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino; Lo Sciuto, Grazia; Capizzi, Giacomo; Woźniak, Marcin | |
| Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset | 1-gen-2021 | Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Auditore, Alessandro; Valenti, ANDREA MARIA GERARDO; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino | |
| ToF-SIMS IMAGING AND DATA MINING APPROACHES FOR ORGANIC STRUCTURED SAMPLES | 13-mag-2021 | Bombace, ALESSANDRA VITTORIA | |
| ToFSIMS characterization of conductive molecular wires assembled onto oxide substrates | 1-gen-2018 | Bombace, ALESSANDRA VITTORIA; Tuccitto, Nunzio; Valenti, ANDREA MARIA GERARDO; Torrisi, Alberto; Licciardello, Antonino | file da validare |
| User-independent protocols for the analysis of complex ToFSIMSdatasets without mass binning, peak picking and peak integration | 1-gen-2018 | Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino | file da validare |