BOMBACE, ALESSANDRA

BOMBACE, ALESSANDRA  

SCIENZE CHIMICHE  

Risultati 1 - 11 di 11 (tempo di esecuzione: 0.011 secondi).
Titolo Data di pubblicazione Autore(i) File
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 1-gen-2019 Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 1-gen-2018 Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 1-gen-2018 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Extracting latent chemical information from ToF­SIMS data arising from chemical imaging 1-gen-2018 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions 1-gen-2017 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry 1-gen-2018 Bombace, Alessandra; Tuccitto, Nunzio; Torrisi, Alberto; Licciardello, Antonino
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra 1-gen-2019 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino; Lo Sciuto, Grazia; Capizzi, Giacomo; Woźniak, Marcin
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset 1-gen-2021 Tuccitto, Nunzio; Bombace, Alessandra; Auditore, Alessandro; Valenti, ANDREA MARIA GERARDO; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino
ToF­SIMS characterization of conductive molecular wires assembled onto oxide substrates 1-gen-2018 Bombace, Alessandra; Tuccitto, Nunzio; Valenti, ANDREA MARIA GERARDO; Torrisi, Alberto; Licciardello, Antonino
A transport and reaction model for simulating secondary ion mass spectrometry depth profiles of polymeric materials 1-gen-2019 Tuccitto, Nunzio; Valenti, Andrea; Bombace, Alessandra; Licciardello, Antonino
User­-independent protocols for the analysis of complex ToF­SIMSdatasets without mass binning, peak picking and peak integration 1-gen-2018 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Capizzi, Giacomo; Licciardello, Antonino