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Clustering and Ultra-Low-Energy Implanted B in Si during Post-implantation Annealing
file da validare1999-01-01 E., Schroer; V., Privitera; Priolo, Francesco; E., Napolitani; A., Carnera
Clustering of Ultra-Low Energy Implanted Boron in Silicon during Activation Annealing;
file da validare2000-01-01 E., Schroer; V., Privitera; Priolo, Francesco; E., Napolitani; A., Carnera; S., Moffat
Coherent backscattering of Raman light
2017-01-01 Fazio, B; Irrera, A; Pirotta, S; D'Andrea, C; Del Sorbo, S; LO FARO, MARIA JOSE' IRENE; Gucciardi, Pg; Iati, Ma; Saija, R; Patrini, M; Musumeci, Paolo; Vasi, Cs; Wiersma, Ds; Galli, M; Priolo, Francesco
Colloidal plasmonic back reflectors for light trapping in solar cells
file da validare2014-01-01 Mendes, Mj; Morawiec, S; Simone, F; Priolo, Francesco; Crupi, I.
Colloidal self-assembled nanosphere arrays for plasmon-enhanced light trapping in thin film silicon solar cells
file da validare2014-01-01 Mendes, Mj; Morawiec, S; Crupi, I; Simone, F; Priolo, Francesco
Complete suppression of the transient enhanced diffusion of B implanted in preamorphized Si by interstitial trapping in a spatially separated C-rich layer
file da validare2001-01-01 Napolitani, E; Coati, A; De Salvador, D; Carnera, A; Mirabella, Salvatore; Scalese, S; Priolo, Francesco
Concentration dependence of the Er3+ visible and infrared luminescence in Y2-xErxO3 thin films on Si
file da validare2009-01-01 LO SAVIO, R; Miritello, MARIA PILAR; Cardile, P; Priolo, Francesco
CONCENTRATION PROFILES AND ELECTRICAL CHARACTERIZATION OF HIGH-ENERGY PHOSPHORUS IMPLANTS IN (100) SILICON
file da validare1991-01-01 Galvagno, G; Cacciato, A; Benyaich, F; Raineri, V; Priolo, Francesco; Rimini, E; Capizzi, S; Romano, P.
CONCENTRATION-DEPENDENCE AND INTERFACIAL INSTABILITIES DURING ION-BEAM ANNEALING OF ARSENIC-DOPED SILICON
file da validare1990-01-01 Priolo, Francesco; Rimini, E; Spinella, C; Ferla, G.
CONDUCTIVITY CHANGES AND IMPURITY DEFECT INTERACTIONS IN ION-IMPLANTED AMORPHOUS-SILICON
file da validare1993-01-01 Coffa, S; Priolo, Francesco; Poate, Jm; Glarum, Sh
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Clustering and Ultra-Low-Energy Implanted B in Si during Post-implantation Annealing | 1-gen-1999 | E., Schroer; V., Privitera; Priolo, Francesco; E., Napolitani; A., Carnera | file da validare |
| Clustering of Ultra-Low Energy Implanted Boron in Silicon during Activation Annealing; | 1-gen-2000 | E., Schroer; V., Privitera; Priolo, Francesco; E., Napolitani; A., Carnera; S., Moffat | file da validare |
| Coherent backscattering of Raman light | 1-gen-2017 | Fazio, B; Irrera, A; Pirotta, S; D'Andrea, C; Del Sorbo, S; LO FARO, MARIA JOSE' IRENE; Gucciardi, Pg; Iati, Ma; Saija, R; Patrini, M; Musumeci, Paolo; Vasi, Cs; Wiersma, Ds; Galli, M; Priolo, Francesco | |
| Colloidal plasmonic back reflectors for light trapping in solar cells | 1-gen-2014 | Mendes, Mj; Morawiec, S; Simone, F; Priolo, Francesco; Crupi, I. | file da validare |
| Colloidal self-assembled nanosphere arrays for plasmon-enhanced light trapping in thin film silicon solar cells | 1-gen-2014 | Mendes, Mj; Morawiec, S; Crupi, I; Simone, F; Priolo, Francesco | file da validare |
| Complete suppression of the transient enhanced diffusion of B implanted in preamorphized Si by interstitial trapping in a spatially separated C-rich layer | 1-gen-2001 | Napolitani, E; Coati, A; De Salvador, D; Carnera, A; Mirabella, Salvatore; Scalese, S; Priolo, Francesco | file da validare |
| Concentration dependence of the Er3+ visible and infrared luminescence in Y2-xErxO3 thin films on Si | 1-gen-2009 | LO SAVIO, R; Miritello, MARIA PILAR; Cardile, P; Priolo, Francesco | file da validare |
| CONCENTRATION PROFILES AND ELECTRICAL CHARACTERIZATION OF HIGH-ENERGY PHOSPHORUS IMPLANTS IN (100) SILICON | 1-gen-1991 | Galvagno, G; Cacciato, A; Benyaich, F; Raineri, V; Priolo, Francesco; Rimini, E; Capizzi, S; Romano, P. | file da validare |
| CONCENTRATION-DEPENDENCE AND INTERFACIAL INSTABILITIES DURING ION-BEAM ANNEALING OF ARSENIC-DOPED SILICON | 1-gen-1990 | Priolo, Francesco; Rimini, E; Spinella, C; Ferla, G. | file da validare |
| CONDUCTIVITY CHANGES AND IMPURITY DEFECT INTERACTIONS IN ION-IMPLANTED AMORPHOUS-SILICON | 1-gen-1993 | Coffa, S; Priolo, Francesco; Poate, Jm; Glarum, Sh | file da validare |
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Tipologia
- 1 Contributo su Rivista 403
- 1 Contributo su Rivista::1.1 Arti... 402
- 1 Contributo su Rivista::1.5 Abst... 1
Data di pubblicazione
- 2020 - 2023 17
- 2010 - 2019 90
- 2000 - 2009 178
- 1990 - 1999 100
- 1987 - 1989 18
Rivista
- APPLIED PHYSICS LETTERS 68
- NUCLEAR INSTRUMENTS & METHODS IN ... 52
- JOURNAL OF APPLIED PHYSICS 39
- MATERIALS SCIENCE AND ENGINEERING... 20
- PHYSICAL REVIEW. B, CONDENSED MAT... 18
- JOURNAL OF VACUUM SCIENCE & TECHN... 10
- MATERIALS SCIENCE IN SEMICONDUCTO... 10
- JOURNAL OF LUMINESCENCE 9
- OPTICAL MATERIALS 9
- DIFFUSION AND DEFECT DATA, SOLID ... 8
Keyword
- Electrical and Electronic Enginee... 4
- Electronic 4
- luminescence 4
- Optical and Magnetic Materials 4
- Silicon 4
- silicon 4
- silicon nanowires 4
- biosensor 3
- Condensed Matter Physics 3
- Erbium 3
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- eng 288
- lat 1
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- reserved 72
- open 20
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