The paper deals with the reliability assessment of low voltage Super-junction MOSFETs for motor controlapplications in the automotive field. Thermo-mechanical stresses generated on the source metallization havebeen recognized as the main mechanism of ageing in these applications and the cause of a high rate ofpremature failures. Therefore, the effects of short-circuit conditions and repetitive avalanche operations on thelifetime are investigated using an experimental thermodynamic analysis of the temperature evolution over thesource metallization. A comparison in terms of expected lifetime under short circuit and repeated avalancheoperations with traditional Gate Trench MOSFETS having similar characteristics is finally accomplished.
Lifetime estimation of Super-junction Power MOSFETs under short circuit and repeated avalanche operations
TESTA, Antonio;PATANE', Salvatore;
2010-01-01
Abstract
The paper deals with the reliability assessment of low voltage Super-junction MOSFETs for motor controlapplications in the automotive field. Thermo-mechanical stresses generated on the source metallization havebeen recognized as the main mechanism of ageing in these applications and the cause of a high rate ofpremature failures. Therefore, the effects of short-circuit conditions and repetitive avalanche operations on thelifetime are investigated using an experimental thermodynamic analysis of the temperature evolution over thesource metallization. A comparison in terms of expected lifetime under short circuit and repeated avalancheoperations with traditional Gate Trench MOSFETS having similar characteristics is finally accomplished.| File | Dimensione | Formato | |
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