Beamstopper-Integrated Sensors (BIS) based on silicon carbide (SiC) represent a novel class of compact, radiation hard devices that combine beam interception with real-time diagnostics. We present the first characterization of fourquadrant BIS designed for simultaneous intensity and position monitoring on synchrotron beamlines. Based on the established reliability of single-pixel BIS as intensity monitors at SLS, we demonstrate quadrant-resolved response and linearity with photon flux, despite minor contacting issues in one channel. These results establish SiC BIS as robust, visible-blind diagnostics, leading the way for deployment of position-sensitive BIS in high-brilliance undulator experiments.

Development of Novel, Radiation-Hard, Ultra-Compact Active Beamstops with Integrated 4-Quadrant X-ray Sensors for Scattering Experiments on High-Brilliance Undulator Beamlines

G. Trovato;N. La Rosa;S. Moscato;M. Camarda
2026-01-01

Abstract

Beamstopper-Integrated Sensors (BIS) based on silicon carbide (SiC) represent a novel class of compact, radiation hard devices that combine beam interception with real-time diagnostics. We present the first characterization of fourquadrant BIS designed for simultaneous intensity and position monitoring on synchrotron beamlines. Based on the established reliability of single-pixel BIS as intensity monitors at SLS, we demonstrate quadrant-resolved response and linearity with photon flux, despite minor contacting issues in one channel. These results establish SiC BIS as robust, visible-blind diagnostics, leading the way for deployment of position-sensitive BIS in high-brilliance undulator experiments.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11769/704231
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