TERRASI, Antonio

TERRASI, Antonio  

FISICA ED ASTRONOMIA "ETTORE MAJORANA"  

Risultati 1 - 20 di 125 (tempo di esecuzione: 0.027 secondi).
Titolo Data di pubblicazione Autore(i) File
Ag cluster beam deposition for TCO/Ag/TCO multilayer 1-gen-2019 Torrisi, G.; Cavaliere, E.; Banfi, F.; Benetti, G.; Raciti, R.; Gavioli, L.; Terrasi, A.
Amorphous-crystalline interface evolution during Solid Phase Epitaxy Regrowth of SiGe films amorphized by ion implantation 1-gen-2007 D'Angelo, D; PIRO A., M; Mirabella, Salvatore; Bongiorno, C; Romano, Lucia; Terrasi, Antonio; Grimaldi, Maria Grazia
Anomalous and normal Hall effect in hydrogenated amorphous Si prepared by plasma enhanced chemical vapor deposition 1-gen-2010 Crupi, I; Mirabella, Salvatore; D'Angelo, D; Gibilisco, S; Grasso, A; Di Marco, S; Simone, F; Terrasi, Antonio
ANOMALOUS AU/SI BARRIER MODIFICATION BY A CAF2 INTRALAYER 1-gen-1994 Dellorto, T; Almeida, J; Terrasi, Antonio; Marsi, M; Coluzza, C; Margaritondo, G; Perfetti, P.
AR+ BOMBARDMENT OF SI(100) IN OXYGEN ATMOSPHERE - ROOM-TEMPERATURE OXIDE FORMATION STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY 1-gen-1995 Terrasi, Antonio; Coluzza, C; Margaritondo, G.
Arsenic redistribution at the SiO2/Si interface during oxidation of implanted silicon 1-gen-1998 Iacona, F; Raineri, V; La Via, F; Terrasi, Antonio; Rimini, E.
Au/GaAs(100) interface Schottky barrier modification by a silicon nitride intralayer 1-gen-1997 Almeida, J; Coluzza, C; Dellorto, T; Margaritondo, G; Terrasi, Antonio; Ivanco, J.
Carrier concentration and mobility in B doped Si1-xGex 1-gen-2003 Romano, Lucia; Napolitani, E; Privitera, V; Scalese, S; Terrasi, Antonio; Mirabella, Salvatore; Grimaldi, Maria Grazia
Colloidal-structured metallic micro-grids: High performance transparent electrodes in the red and infrared range 1-gen-2019 Torrisi, G.; Luis, J. S.; Sanchez-Sobrado, O.; Raciti, R.; Mendes, M. J.; Aguas, H.; Fortunato, E.; Martins, R.; Terrasi, A.
Conductive Free Standing Polymer Paste Synthesized by Acid Induced Phase Separation 1-gen-2018 Lombardo, V.; Di Franco, S.; D'Urso, L.; La Magna, A.; Terrasi, A.; Puglisi, R. A.
CONTROLLED MODIFICATION OF HETEROJUNCTION BAND LINEUPS BY DIFFUSIVE INTRALAYERS 1-gen-1990 Mckinley, Jt; Hwu, Y; Rioux, D; Terrasi, Antonio; Zanini, F; Margaritondo, G; Debska, U; Furdyna, Jk
Defects in Ge caused by sub-amorphizing self-implantation: Formation and dissolution 1-gen-2010 Bisognin, G; Vangelista, S; Mastromatteo, M; Napolitani, E; De Salvador, D; Carnera, A; Berti, M; Bruno, Elena; Scapellato, G; Terrasi, Antonio
Detailed arsenic concentration profiles at Si/SiO2 interfaces 1-gen-2008 Pei, L; Duscher, ; Steen, C; Pichler, P; Ssel, Hr; Napolitani, E; DE SALVADOR, D; Piro, Am; Terrasi, Antonio; Severac, F; Cristiano, F; Ravichandra, K; Gupta, N; Windl, W.
Dewetted Gold Nanostructures onto Exfoliated Graphene Paper as High Efficient Glucose Sensor 1-gen-2019 Scandurra, Antonino; Ruffino, Francesco; Censabella, Maria; Terrasi, Antonio; Grimaldi, Maria Grazia
Diffusion of ion beam injected self-interstitial defects in silicon layers grown by molecular beam epitaxy 1-gen-2004 De Salvador, D; Napolitani, E; Mirabella, Salvatore; Impellizzeri, G; Priolo, Francesco; Terrasi, Antonio; Bisognin, G; Berti, M; Drigo, Av; Carnera, A.
Direct observation of two-dimensional diffusion of the self-interstitials in crystalline Si 1-gen-2002 Giannazzo, F; Mirabella, Salvatore; Salvador, Dd; Napolitani, E; Raineri, V; Carnera, A; Drigo, Av; Terrasi, Antonio; Priolo, Francesco
Dry oxidation of MBE-SiGe films: rate enhancement, Ge redistribution and defect injection 1-gen-2005 Spadafora, M; Terrasi, Antonio; Mirabella, Salvatore; Piro, A; Grimaldi, Maria Grazia; Scalese, S; Napolitani, E; Di Marino, M; De Salvador, D; Carnera, A.
Effect of O : Er concentration ratio on the structural, electrical, and optical properties of Si : Er : O layers grown by molecular beam epitaxy 1-gen-2000 Scalese, S; Franzo, G; Mirabella, Salvatore; Re, M; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Spinella, C; Carnera, A.
Electrical and thermal transient during dielectric breakdown of thin oxides in metal-SiO2-silicon capacitors 1-gen-1998 Lombardo, S; Crupi, F; La Magna, A; Spinella, C; Terrasi, Antonio; La Mantia, A; Neri, B.
Electrical characterization of Au/SiOx/n-GaAs junctions 1-gen-1998 Ivaneo, J; Horvath, Zj; Van Tuyen, V; Coluzza, C; Almeida, J; Terrasi, Antonio; Pecz, B; Vincze, G; Margaritondo, G.