statistiche ricercatore

Nome	#
A Transport and Reaction Model for Simulating Cluster Secondary Ion Mass Spectrometry Depth Profiles of Organic Solids	95
Chelating Surfaces for Native State Protein Patterning: the Human Serum Albumin Case	61
Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers	61
ToF-SIMS depth profiling of PS-b-PMMA block copolymers using Arn+, C60++ and Cs+ sputtering ions	60
A wavelet-PCA method saves high mass resolution information in data treatment of SIMS molecular depth profiles	59
Solvent-control of photoinduced electron transfer via hydrogen bonding in a molecular triad made of a dinuclear chromophore subunit	55
Improving the electrical performance of solution processed oligothiophene TFTs via structural similarity blending	54
Nanoscale Electrical Investigation of Layer-by-Layer Grown Molecular Wires	52
SIMS characterization of surface-modified nanostructured titania electrodes for solar energy conversion devices	52
Smart data treatment of ToFSIMS spectra and depth profiles of polymer‐based materials	37
ToFSIMS of polypyridine photoactive complexes on oxide surfaces of technological interest	37
Assembly and characterization of molecular films for energetics and electronics.	4
Molecular Wires: Nanoscale Electrical Investigation of Layer-by-Layer Grown Molecular Wires (Adv. Mater. 11/2014)	1
Totale	628

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2018/2019	6	0	0	0	0	0	0	0	0	0	0	2	4
2019/2020	94	25	3	17	8	13	0	11	0	9	0	7	1
2020/2021	81	4	7	9	0	24	1	13	2	7	0	10	4
2021/2022	121	9	20	1	4	30	4	11	3	9	2	3	25
2022/2023	217	12	23	6	36	25	30	4	28	43	3	6	1
2023/2024	67	4	20	2	5	2	17	2	10	2	3	0	0
Totale													628