The C-60 erosion behaviour of poly(methyl)methacrylate (PMMA), poly(alpha-methyl) styrene (PAMS) and polystyrene (PS) has been studied at various temperatures and compared with that under Ga+ irradiation. Strong variations of erosion yields are observed, indicating that chemical degradation mechanisms are operating. In particular, our results suggest that fast depolymerization mechanisms are important in leaving the surface of the sputter crater virtually undamaged. Since such mechanisms are connected with the chemical nature of the polymer, the possibility of performing molecular depth profiling of polymers with C-60 appears to depend strongly on the chemical nature of the system under study. (c) 2006 Elsevier B.V. All rights reserved.
The C-60 erosion behaviour of poly(methyl)methacrylate (PMMA), poly(alpha-methyl) styrene (PAMS) and polystyrene (PS) has been studied at various temperatures and compared with that under Ga+ irradiation. Strong variations of erosion yields are observed, indicating that chemical degradation mechanisms are operating. In particular, our results suggest that fast depolymerization mechanisms are important in leaving the surface of the sputter crater virtually undamaged. Since such mechanisms are connected with the chemical nature of the polymer, the possibility of performing molecular depth profiling of polymers with C-60 appears to depend strongly on the chemical nature of the system under study. (c) 2006 Elsevier B.V. All rights reserved.
Chemical effects in C-60 irradiation of polymers
TUCCITTO, NUNZIO;LICCIARDELLO, Antonino
2006-01-01
Abstract
The C-60 erosion behaviour of poly(methyl)methacrylate (PMMA), poly(alpha-methyl) styrene (PAMS) and polystyrene (PS) has been studied at various temperatures and compared with that under Ga+ irradiation. Strong variations of erosion yields are observed, indicating that chemical degradation mechanisms are operating. In particular, our results suggest that fast depolymerization mechanisms are important in leaving the surface of the sputter crater virtually undamaged. Since such mechanisms are connected with the chemical nature of the polymer, the possibility of performing molecular depth profiling of polymers with C-60 appears to depend strongly on the chemical nature of the system under study. (c) 2006 Elsevier B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
