Angular-dependent X-ray photoelectron spectroscopy (ADXPS) was applied to study ultra-thin films of polyamic acid (BTDA-ODA type) prepared by the spin-coating technique. The ADXPS data are used to test the performances of a profile reconstruction method to study the characterizing parameters of polymer/metal interfaces. In particular, the process of interface formation and the effects of the in-situ imidization on the structure of the polymer films were studied for naturally passivated and thermally oxidized Ni substrates. The application of the proposed profile reconstruction method shows that it is possible to obtain a reliable evaluation of thickness and homogeneity of the polymeric overlayers. Furthermore, the method provides a good tool to estimate the atomic-scale roughness of the polymer/metal interfaces.
ADXPS STUDY OF THE CHEMICAL-STRUCTURE OF POLYAMIC ACID/NI AND POLYIMIDE/NI INTERFACES
MARLETTA, Giovanni;
1994-01-01
Abstract
Angular-dependent X-ray photoelectron spectroscopy (ADXPS) was applied to study ultra-thin films of polyamic acid (BTDA-ODA type) prepared by the spin-coating technique. The ADXPS data are used to test the performances of a profile reconstruction method to study the characterizing parameters of polymer/metal interfaces. In particular, the process of interface formation and the effects of the in-situ imidization on the structure of the polymer films were studied for naturally passivated and thermally oxidized Ni substrates. The application of the proposed profile reconstruction method shows that it is possible to obtain a reliable evaluation of thickness and homogeneity of the polymeric overlayers. Furthermore, the method provides a good tool to estimate the atomic-scale roughness of the polymer/metal interfaces.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
