A novel nickel beta-diketonate adduct, Ni(tta)(2)center dot tmeda, has been synthesized using 2-thenoyltrifluoroacetone as the beta-diketonate and N,N,N,'N'-tetramethylethylendiamine as the Lewis base. It has been characterized by elemental analyses, IR, H-1 NMR, C-13 NMR spectroscopy and single-crystal X-ray diffraction studies. Physical and thermal properties of Ni(tta)(2)center dot tmeda precursor have been also extensively investigated. Its efficacy as a metal-organic chemical vapour deposition (MOCVD) precursor for the growth of nickel oxide films has been fully tested by applying it to the deposition of NiO films on quartz substrate. NiO thin films have been characterized by X-ray diffraction (XRD), scanning electron microscopy and UV spectroscopy.
Synthesis, characterization and application of Ni(tta)(2)center dot tmeda to MOCVD of nickel oxide thin films
MALANDRINO, Graziella;
2006-01-01
Abstract
A novel nickel beta-diketonate adduct, Ni(tta)(2)center dot tmeda, has been synthesized using 2-thenoyltrifluoroacetone as the beta-diketonate and N,N,N,'N'-tetramethylethylendiamine as the Lewis base. It has been characterized by elemental analyses, IR, H-1 NMR, C-13 NMR spectroscopy and single-crystal X-ray diffraction studies. Physical and thermal properties of Ni(tta)(2)center dot tmeda precursor have been also extensively investigated. Its efficacy as a metal-organic chemical vapour deposition (MOCVD) precursor for the growth of nickel oxide films has been fully tested by applying it to the deposition of NiO films on quartz substrate. NiO thin films have been characterized by X-ray diffraction (XRD), scanning electron microscopy and UV spectroscopy.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
