The Cd(C5F6HO2)(2)&BULL; polyether adducts were used in MOCVD experiments of cadmium oxide, on optical transparent SiO2 substrates. Very mild heating (44-74 &DEG; C resulted in, thermal stable, liquid compounds that can be easily evaporated. XRD measurements provided evidence of cubic highly textured CdO(1 0 0) films. The surface atomic composition was investigated by XPS analysis. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%. Resistivity measurements of CdO thin films showed that they are highly conducting. ESR analysis suggests the presence of Cd+ ions, on the site of Cd2+ arising from polaronic self-trapping of electrons introduced by oxygen deficiency at Cd2+ sites to generate localised 5s(1) states. © 2004 Elsevier B.V. All rights reserved.
|Titolo:||CdO thin films: a study of their electronic structure by electron spin resonance spectroscopy|
|Data di pubblicazione:||2005|
|Citazione:||CdO thin films: a study of their electronic structure by electron spin resonance spectroscopy / Gulino A; Tabbi G. - In: APPLIED SURFACE SCIENCE. - ISSN 0169-4332. - 245:1-4(2005), pp. 322-327.|
|Appare nelle tipologie:||1.1 Articolo in rivista|