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EnglishThe Cd(C5F6HO2)(2)• polyether adducts were used in MOCVD experiments of cadmium oxide, on optical transparent SiO2 substrates. Very mild heating (44-74 ° C resulted in, thermal stable, liquid compounds that can be easily evaporated. XRD measurements provided evidence of cubic highly textured CdO(1 0 0) films. The surface atomic composition was investigated by XPS analysis. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%. Resistivity measurements of CdO thin films showed that they are highly conducting. ESR analysis suggests the presence of Cd+ ions, on the site of Cd2+ arising from polaronic self-trapping of electrons introduced by oxygen deficiency at Cd2+ sites to generate localised 5s(1) states. © 2004 Elsevier B.V. All rights reserved.
| Titolo: | CdO thin films: a study of their electronic structure by electron spin resonance spectroscopy | |
| Autori interni: | ||
| Data di pubblicazione: | 2005 | |
| Rivista: | ||
| Handle: | http://hdl.handle.net/20.500.11769/13320 | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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