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EnglishA simple and effective pulse shape discrimination technique is applied to a silicon strip detector array. Excellent charge identification from H up to the Ni projectile has been obtained and isotope separation up to N has also been observed. The method we systematically studied is essentially based on a suitable setting of the constant fraction discriminators, and its main advantage is that no additional electronic modules are needed compared to the ones used in the standard TOF technique. (C) 2001 Elsevier Science B.V. All rights reserved.
A simple and effective pulse shape discrimination technique is applied to a silicon strip detector array. Excellent charge identification from H up to the Ni projectile has been obtained and isotope separation up to N has also been observed. The method we systematically studied is essentially based on a suitable setting of the constant fraction discriminators, and its main advantage is that no additional electronic modules are needed compared to the ones used in the standard TOF technique. (C) 2001 Elsevier Science B.V. All rights reserved.
| Titolo: | Pulse shape discrimination of charged particles with a silicon strip detector | |
| Autori interni: | ||
| Data di pubblicazione: | 2001 | |
| Rivista: | ||
| Abstract: | A simple and effective pulse shape discrimination technique is applied to a silicon strip detector array. Excellent charge identification from H up to the Ni projectile has been obtained and isotope separation up to N has also been observed. The method we systematically studied is essentially based on a suitable setting of the constant fraction discriminators, and its main advantage is that no additional electronic modules are needed compared to the ones used in the standard TOF technique. (C) 2001 Elsevier Science B.V. All rights reserved. | |
| Handle: | http://hdl.handle.net/20.500.11769/14890 | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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