Time of flight secondary ion mass spectrometry (ToF-SIMS) allows the reliable analytical determination of organic and polymeric materials. Since a typical raw data may contain thousands of peaks, the amount of information to deal with is accordingly large, so that data reduction techniques become indispensable for extracting the most significant information from the given dataset. Here, the use of the wavelet-principal component analysis-based signal processing of giant raw data acquired during ToF-SIMS experiments is presented. The proposed procedure provides a straightforwardly "manageable" dataset without any binning procedure neither detailed integration. By studying the principal component analysis results, detailed and reliable information about the chemical composition of polymeric samples have been gathered.

Automated data mining of secondary ion mass spectrometry spectra

Tuccitto, Nunzio
2017-01-01

Abstract

Time of flight secondary ion mass spectrometry (ToF-SIMS) allows the reliable analytical determination of organic and polymeric materials. Since a typical raw data may contain thousands of peaks, the amount of information to deal with is accordingly large, so that data reduction techniques become indispensable for extracting the most significant information from the given dataset. Here, the use of the wavelet-principal component analysis-based signal processing of giant raw data acquired during ToF-SIMS experiments is presented. The proposed procedure provides a straightforwardly "manageable" dataset without any binning procedure neither detailed integration. By studying the principal component analysis results, detailed and reliable information about the chemical composition of polymeric samples have been gathered.
2017
PCA; Polymeric Surfaces; Surface Analysis; ToF-SIMS; Wavelet; Analytical Chemistry; Applied Mathematics
File in questo prodotto:
File Dimensione Formato  
Automated data mining of secondary ion mass spectrometry spectra.pdf

solo gestori archivio

Tipologia: Versione Editoriale (PDF)
Licenza: NON PUBBLICO - Accesso privato/ristretto
Dimensione 889.04 kB
Formato Adobe PDF
889.04 kB Adobe PDF   Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11769/314035
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 8
  • ???jsp.display-item.citation.isi??? 8
social impact