ToF-SIMS has been employed to monitor the changes in molecular weight which occur on UV irradiation in a polystyrene standard (MW 1700) as a thin film on silver. The ToF-SIMS spectrum of unirradiated polystyrene is also described. Polysiloxane contamination was present in some of the polystyrene samples studied; no effort was made to remove this contamination as it was considered to be part of the system under analysis and proved useful in confirming the role of the phenyl substituent in the photodegradation of polystyrene. Implications of this study, the possible development of the technique described and its application to real polymer surfaces are discussed.
The Surface Photooxidation of Polystyrene, Part I: The Application of ToF-SIMS to Monitor Changes in Polymer Chain Lenght
BOTTINO, Francesco;POLLICINO, Antonino;RECCA, Antonino
1992-01-01
Abstract
ToF-SIMS has been employed to monitor the changes in molecular weight which occur on UV irradiation in a polystyrene standard (MW 1700) as a thin film on silver. The ToF-SIMS spectrum of unirradiated polystyrene is also described. Polysiloxane contamination was present in some of the polystyrene samples studied; no effort was made to remove this contamination as it was considered to be part of the system under analysis and proved useful in confirming the role of the phenyl substituent in the photodegradation of polystyrene. Implications of this study, the possible development of the technique described and its application to real polymer surfaces are discussed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
