Low-temperature (400-800 degrees C) stabilisation of tetragonal zirconia, prepared by a hydroxide gel route and a metal oxalate method, both followed by low-temperature annealing, has been achieved by partial substitution of Zr4+ With Sb3+. XRD and Raman spectroscopy have been used for characterisation of the doped zirconia powders as well as for identification of the crystal symmetry. A transition from the tetragonal to the monoclinic phase takes place above 800 degrees C. XPS results provide evidence of pronounced Sb segregation upon increasing the firing temperatures. The grain size dependence upon the annealing temperature has been evaluated using the Scherrer equation. Particle morphology and size have been imaged directly by scanning electron microscopy.
Low-temperature stabilisation of tetragonal zirconia by antimony
GULINO, Antonino;
1996-01-01
Abstract
Low-temperature (400-800 degrees C) stabilisation of tetragonal zirconia, prepared by a hydroxide gel route and a metal oxalate method, both followed by low-temperature annealing, has been achieved by partial substitution of Zr4+ With Sb3+. XRD and Raman spectroscopy have been used for characterisation of the doped zirconia powders as well as for identification of the crystal symmetry. A transition from the tetragonal to the monoclinic phase takes place above 800 degrees C. XPS results provide evidence of pronounced Sb segregation upon increasing the firing temperatures. The grain size dependence upon the annealing temperature has been evaluated using the Scherrer equation. Particle morphology and size have been imaged directly by scanning electron microscopy.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
