SiC Schottky detectors, having a superficial active zone up to 80 micron depths and a thin surface metallization, are adapt to detect high energetic ions. In order to demonstrate their detection ability with high-energy resolution, a helium Rutherford backscattering spectroscopy (RBS) was employed to evaluate their detection efficiency, energy resolution in the region 1.0 – 6.0 MeV alpha ions, depth resolution and dependence on the ion beam current. The detector parameters dependencies on the surface passivation layers, ion energy and current are presented. The comparison of RBS analysis using a traditional barrier silicon detector is investigated, and the differences with SiC detector is presented and discussed.

SiC detector for high helium energy spectroscopy

Calcagno, L.;
2018

Abstract

SiC Schottky detectors, having a superficial active zone up to 80 micron depths and a thin surface metallization, are adapt to detect high energetic ions. In order to demonstrate their detection ability with high-energy resolution, a helium Rutherford backscattering spectroscopy (RBS) was employed to evaluate their detection efficiency, energy resolution in the region 1.0 – 6.0 MeV alpha ions, depth resolution and dependence on the ion beam current. The detector parameters dependencies on the surface passivation layers, ion energy and current are presented. The comparison of RBS analysis using a traditional barrier silicon detector is investigated, and the differences with SiC detector is presented and discussed.
High energy ions; Ion detection; Kinematic factor; RBS analysis; SiC detector; Nuclear and High Energy Physics; Instrumentation
File in questo prodotto:
File Dimensione Formato  
NIMA2018.pdf

non disponibili

Tipologia: Versione Editoriale (PDF)
Dimensione 1.67 MB
Formato Adobe PDF
1.67 MB Adobe PDF   Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11769/357621
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 5
  • ???jsp.display-item.citation.isi??? 5
social impact