We consider a solid-state two-qubit gate Subject to relaxation processes originated by transverse and longitudinal fluctuations of the single-qubit Hamiltonians. We model each noise component as a bosonic bath characterized by a specific power spectrum. We specialize our analysis to a root i-SWAP gate implemented by Josephson qubits in a fixed coupling scheme. For high-frequency noise spectra extrapolated from single-qubit experiments we estimate the efficiency of the root i-SWAP gate from the decay of anti-correlations between single-qubit switching probabilities. (C) 2009 Elsevier B.V. All rights reserved.
Relaxation processes in solid-state two-qubit gates
PALADINO, ELISABETTA;FALCI, Giuseppe
2010-01-01
Abstract
We consider a solid-state two-qubit gate Subject to relaxation processes originated by transverse and longitudinal fluctuations of the single-qubit Hamiltonians. We model each noise component as a bosonic bath characterized by a specific power spectrum. We specialize our analysis to a root i-SWAP gate implemented by Josephson qubits in a fixed coupling scheme. For high-frequency noise spectra extrapolated from single-qubit experiments we estimate the efficiency of the root i-SWAP gate from the decay of anti-correlations between single-qubit switching probabilities. (C) 2009 Elsevier B.V. All rights reserved.File in questo prodotto:
File | Dimensione | Formato | |
---|---|---|---|
210-paladino-physicaE-relaxation.pdf
solo gestori archivio
Tipologia:
Versione Editoriale (PDF)
Licenza:
NON PUBBLICO - Accesso privato/ristretto
Dimensione
251.86 kB
Formato
Adobe PDF
|
251.86 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.