We consider a solid-state two-qubit gate Subject to relaxation processes originated by transverse and longitudinal fluctuations of the single-qubit Hamiltonians. We model each noise component as a bosonic bath characterized by a specific power spectrum. We specialize our analysis to a root i-SWAP gate implemented by Josephson qubits in a fixed coupling scheme. For high-frequency noise spectra extrapolated from single-qubit experiments we estimate the efficiency of the root i-SWAP gate from the decay of anti-correlations between single-qubit switching probabilities. (C) 2009 Elsevier B.V. All rights reserved.
Titolo: | Relaxation processes in solid-state two-qubit gates |
Autori interni: | |
Data di pubblicazione: | 2010 |
Rivista: | |
Citazione: | Relaxation processes in solid-state two-qubit gates / E. PALADINO; D'ARRIGO A; A. MASTELLONE; FALCI G. - In: PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES. - ISSN 1386-9477. - 42(2010), pp. 439-443. |
Handle: | http://hdl.handle.net/20.500.11769/3776 |
Appare nelle tipologie: | 1.1 Articolo in rivista |
File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.