We consider a solid-state two-qubit gate Subject to relaxation processes originated by transverse and longitudinal fluctuations of the single-qubit Hamiltonians. We model each noise component as a bosonic bath characterized by a specific power spectrum. We specialize our analysis to a root i-SWAP gate implemented by Josephson qubits in a fixed coupling scheme. For high-frequency noise spectra extrapolated from single-qubit experiments we estimate the efficiency of the root i-SWAP gate from the decay of anti-correlations between single-qubit switching probabilities. (C) 2009 Elsevier B.V. All rights reserved.

Relaxation processes in solid-state two-qubit gates

PALADINO, ELISABETTA;FALCI, Giuseppe
2010-01-01

Abstract

We consider a solid-state two-qubit gate Subject to relaxation processes originated by transverse and longitudinal fluctuations of the single-qubit Hamiltonians. We model each noise component as a bosonic bath characterized by a specific power spectrum. We specialize our analysis to a root i-SWAP gate implemented by Josephson qubits in a fixed coupling scheme. For high-frequency noise spectra extrapolated from single-qubit experiments we estimate the efficiency of the root i-SWAP gate from the decay of anti-correlations between single-qubit switching probabilities. (C) 2009 Elsevier B.V. All rights reserved.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11769/3776
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