A simple approach is proposed to describe the influence of the electromagnetic environment on the sequential single-electron tunneling in systems of ultrasmall tunnel junctions. As an application we consider a system of two junctions in series coupled to an Ohmic environment. An increase of the environment resistance (i) widens the Coulomb-blockade region and (ii) suppresses the peaks that the conductance shows as a function of the gate voltage. The environment is responsible for an unusual temperature dependence of these peaks, which may explain recent experiments with GaAs lateral microstructures.

Single-electron tunneling in systems of small junctions coupled to an electromagnetic environment

FALCI, Giuseppe;
1991-01-01

Abstract

A simple approach is proposed to describe the influence of the electromagnetic environment on the sequential single-electron tunneling in systems of ultrasmall tunnel junctions. As an application we consider a system of two junctions in series coupled to an Ohmic environment. An increase of the environment resistance (i) widens the Coulomb-blockade region and (ii) suppresses the peaks that the conductance shows as a function of the gate voltage. The environment is responsible for an unusual temperature dependence of these peaks, which may explain recent experiments with GaAs lateral microstructures.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11769/38261
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