This study presents the application of lateral (SEM/EDX, SAM, SIMS) and vertical (SAM, XPS, SIMS) high resolution techniques on materials in art- work of cultural heritage. Emphasis will be placed on how such techniques are now indispensable in a science-based approach to the characterization of materials and the rationalization of their degradation, this in itself being essential for conservation and useful for a dearer understanding of the artistic techniques used in the past.
Microanalytical characterization of art-work materials: Spatially resolved techniques
CILIBERTO, Enrico;SPOTO, Giuseppe
1995-01-01
Abstract
This study presents the application of lateral (SEM/EDX, SAM, SIMS) and vertical (SAM, XPS, SIMS) high resolution techniques on materials in art- work of cultural heritage. Emphasis will be placed on how such techniques are now indispensable in a science-based approach to the characterization of materials and the rationalization of their degradation, this in itself being essential for conservation and useful for a dearer understanding of the artistic techniques used in the past.File in questo prodotto:
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