Superconducting La2-xBaxCuO4+delta d ( LBCO) films have been deposited on 10 x 10 mm(2) ( 100) LaAlO3 substrates using an in- situ MOCVD process and adopting the multi- component single source approach. Highly c- axis oriented films are fabricated and X- ray diffraction ( XRD) ( 103) pole figures point to the epitaxial nature of the LBCO films. Scanning electron and atomic force microscopy images show highly homogeneous surfaces. Energy dispersive ( EDX) and wavelength dispersive X- ray ( WDX) analyses show a good homogeneity over all the 10 x 10 mm(2) substrate and the absence of any F or C contaminations.

Synthesis and characterization of La2-xBaxCuO4+delta thin film through a simple MOCVD approach

MALANDRINO, Graziella;
2005

Abstract

Superconducting La2-xBaxCuO4+delta d ( LBCO) films have been deposited on 10 x 10 mm(2) ( 100) LaAlO3 substrates using an in- situ MOCVD process and adopting the multi- component single source approach. Highly c- axis oriented films are fabricated and X- ray diffraction ( XRD) ( 103) pole figures point to the epitaxial nature of the LBCO films. Scanning electron and atomic force microscopy images show highly homogeneous surfaces. Energy dispersive ( EDX) and wavelength dispersive X- ray ( WDX) analyses show a good homogeneity over all the 10 x 10 mm(2) substrate and the absence of any F or C contaminations.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.11769/60079
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