Ferroelectric materials show the hysteresis effect; in particular, with a zero field there are two equally stable states of polarization PT allowing for the design of a binary-state device in the form of a ferroelectric capacitor (metal ferroelectric-metal) that can be reversed electrically. The characterization of ferroelectric devices consists of determining the hysteresis behavior and PT quantities. Industrial equipment for producing this kind of characterization is expensive, and complex systems are needed for specific tasks. This paper proposes a low-cost tool for addressing the properties of ferroelectric devices, which is useful for qualitative investigation in research laboratories.
Ferroelectric materials show the hysteresis effect; in particular, with a zero field there are two equally stable states of polarization ±Pr allowing for the design of a binary-state device in the form of a ferroelectric capacitor (metal ferroelectric-metal) that can be reversed electrically. The characterization of ferroelectric devices consists of determining the hysteresis behavior and ±Pr quantities. Industrial equipment for producing this kind of characterization is expensive, and complex systems are needed for specific tasks. This paper proposes a low-cost tool for addressing the properties of ferroelectric devices, which is useful for qualitative investigation in research laboratories.
Basic Measurements for the Characterization of Ferroelectric Devices
ANDO', Bruno;GRAZIANI, Salvatore
2005-01-01
Abstract
Ferroelectric materials show the hysteresis effect; in particular, with a zero field there are two equally stable states of polarization PT allowing for the design of a binary-state device in the form of a ferroelectric capacitor (metal ferroelectric-metal) that can be reversed electrically. The characterization of ferroelectric devices consists of determining the hysteresis behavior and PT quantities. Industrial equipment for producing this kind of characterization is expensive, and complex systems are needed for specific tasks. This paper proposes a low-cost tool for addressing the properties of ferroelectric devices, which is useful for qualitative investigation in research laboratories.File | Dimensione | Formato | |
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