In this work we studied the As redistribution in SiO270 nm / Si30 nm /SiO270 nm multilayer during postimplantation annealing. By Rutherford backscattering spectrometry and Z-contrast transmission electron microscopy we found an As accumulation at the Si/SiO2 interfaces and at the Si grain boundaries with no segregation of the As in the Si layer. Such an effect could be qualitatively in agreement with a model that assumes a traps distribution into the Si in the first 2–3 nm above the SiO2 / Si interfaces and along the Si grain boundaries. In particular, the traps concentration at the Si/SiO2 interfaces was estimated in 1014 traps/cm2. © 2010 American Institute of Physics.
|Titolo:||As doping of Si-based low-dimensional systems|
|Data di pubblicazione:||2010|
|Appare nelle tipologie:||1.1 Articolo in rivista|