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Titolo Data di pubblicazione Autore(i) File
FORMATION OF EPITAXIAL GAMMA-FESI(2) AND BETA-FESI(2) LAYERS ON (111) SI 1-gen-1994 Grimaldi, Maria Grazia; Franzo, G; Ravesi, S; Terrasi, Antonio; Spinella, C; Lamantia, A. file da validare
AR+ BOMBARDMENT OF SI(100) IN OXYGEN ATMOSPHERE - ROOM-TEMPERATURE OXIDE FORMATION STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY 1-gen-1995 Terrasi, Antonio; Coluzza, C; Margaritondo, G. file da validare
ION-BEAM-ASSISTED DEPOSITION OF AL FILMS ON SI 1-gen-1995 Terrasi, Antonio; Ravesi, S; Marcellino, C; Spinella, C; Pannitteri, S. file da validare
TEMPERATURE-DEPENDENCE OF ELECTRONIC STATES IN (TASE4)(2)I 1-gen-1995 Terrasi, Antonio; Marsi, M; Berger, H; Margaritondo, G; Kelley, Rj; Onellion, M. file da validare
Progress in understanding VUV photoemission in low-dimensionality systems 1-gen-1996 Berger, H; Larosa, S; Terrasi, Antonio; Marsi, M; Collins, I; Kelley, Rj; Quitmann, C; Ma, Ja; Kendziora, C; Skelton, E; Onellion, M; Margaritondo, G. file da validare
Silicon oxide thin films obtained by Ar+ bombardment of Si(100) in oxygen atmosphere at room temperature 1-gen-1996 Terrasi, Antonio; Almeida, J; Coluzza, C; Margaritondo, G. file da validare
Schottky barrier at the Au/Gap(110) interface 1-gen-1996 Fanfoni, M; Goletti, C; Chiaradia, P; Ng, W; Cerrina, F; Hwu, Y; Terrasi, Antonio; Margaritondo, G. file da validare
Incomplete charge-density-wave gap opening in orthorhombic Mo4O11 1-gen-1996 Terrasi, Antonio; Marsi, M; Berger, H; Gauthier, F; Forro, L; Margaritondo, G; Kelley, Rj; Onellion, M. file da validare
Evolution of the local environment around Er upon thermal annealing in Er and O co-implanted Si 1-gen-1997 Terrasi, Antonio; Franzo, G; Coffa, S; Priolo, Francesco; Dacapito, F; Mobilio, S. file da validare
EXAFS investigation of Co sites in CoSi2 film grown by ion beam-assisted deposition 1-gen-1997 Terrasi, Antonio; La Via, F; D'Acapito, F; Mobilio, S. file da validare
Au/GaAs(100) interface Schottky barrier modification by a silicon nitride intralayer 1-gen-1997 Almeida, J; Coluzza, C; Dellorto, T; Margaritondo, G; Terrasi, Antonio; Ivanco, J. file da validare
EXAFS investigation of Co sites in CoSi2 film grown by ion beam assisted deposition 1-gen-1997 Terrasi, A.; La Via, F.; D(')Acapito, F.; Mobilio, S. file da validare
Temperature dependence of electronic states in (TaSe4)(2)I - Reply 1-gen-1997 Terrasi, Antonio; Marsi, M; Berger, H; Margaritondo, G; Kelley, Rj; Onellion, M. file da validare
EXAFS analysis of Er sites in Er-O and Er-F co-doped crystalline Si 1-gen-1998 Terrasi, Antonio; Priolo, Francesco; Franzo, G; Coffa, S; D'Acapito, F; Mobilio, S. file da validare
Electrical characterization of Au/SiOx/n-GaAs junctions 1-gen-1998 Ivaneo, J; Horvath, Zj; Van Tuyen, V; Coluzza, C; Almeida, J; Terrasi, Antonio; Pecz, B; Vincze, G; Margaritondo, G. file da validare
Precipitation of As in thermally oxidized ion-implanted Si crystals 1-gen-1998 Terrasi, Antonio; Rimini, E; Raineri, V; Iacona, F; La Via, F; Colonna, S; Mobilio, S. file da validare
Arsenic redistribution at the SiO2/Si interface during oxidation of implanted silicon 1-gen-1998 Iacona, F; Raineri, V; La Via, F; Terrasi, Antonio; Rimini, E. file da validare
Electrical and thermal transient during dielectric breakdown of thin oxides in metal-SiO2-silicon capacitors 1-gen-1998 Lombardo, S; Crupi, F; La Magna, A; Spinella, C; Terrasi, Antonio; La Mantia, A; Neri, B. file da validare
EXAFS Analysis of Er Sites in Er-O and Er-F Co-doped Crystalline Si 1-gen-1999 Terrasi, Antonio; Priolo, Francesco; G., Franzò; S., Coffa; F., D'Acapito; S., Mobilio file da validare
Effect of O : Er concentration ratio on the structural, electrical, and optical properties of Si : Er : O layers grown by molecular beam epitaxy 1-gen-2000 Scalese, S; Franzo, G; Mirabella, Salvatore; Re, M; Terrasi, Antonio; Priolo, Francesco; Rimini, E; Spinella, C; Carnera, A. file da validare
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