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Mostrati risultati da 21 a 40 di 101
Titolo Data di pubblicazione Autore(i) File
Na-surface segregation and oxygen depletion in particle bombardment of alkaline glasses 1-gen-1988 Torrisi, Alberto; Marletta, Giovanni; Licciardello, Antonino; Puglisi, O. file da validare
STRUCTURAL-PROPERTIES OF THERMAL EVAPORATED SNTE THIN-FILMS 1-gen-1988 Burrafato, G; Troja, So; Turrisi, E; Marletta, Giovanni; Torrisi, Alberto file da validare
SIMS DEPTH PROFILING OF SI/SIO2/SI LAYERS BY USING SELF-SPUTTERED GA+ FROM A GALLIUM LIQUID-METAL ION-SOURCE 1-gen-1989 Licciardello, Antonino; Torrisi, Alberto; Pignataro, S. file da validare
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 1-gen-1989 Werner, Hw; Torrisi, Alberto file da validare
Structural and Electrical Effects on (Al-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 1-gen-1990 Santangelo, A.; Lanza, P.; Viscuso, O.; Magro, C.; Scandurra, A.; Licciardello, A.; Torrisi, A. file da validare
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 1-gen-1990 Werner, Hw; Torrisi, Alberto file da validare
Structural and electrical effects od (Al-Si) n+ ohmic contact of in situ silicon cleaning bi Ar+ ion bombardment 1-gen-1991 Santangelo, A; Lanza, P; Viscuso, O; Magro, C; Scandurra, A; Licciardello, A; Torrisi, Alberto file da validare
Structural and Electrical Effects on (A1-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 1-gen-1991 Santangelo, A; Lanza, P; Viscuso, O; Magro, C; Scandurra, A; Licciardello, Antonino; Torrisi, A. file da validare
THE REACTION OF AMORPHOUS CO-ZR LAYERS WITH SI(100) AND SIO2 SUBSTRATES BY ANNEALING IN VACUUM AND NH3 1-gen-1991 Duchateau, Jpwb; Kuiper, Aet; Willemsen, Mfc; Torrisi, Alberto; Vanderkolk, Gj file da validare
SIMS and SNMS study of the interface between Al-1%Si alloy and sputter cleaned silicon surface 1-gen-1992 Licciardello, Antonino; Torrisi, Alberto; Scandurra, A; Santangelo, A. file da validare
Microbial attack on basalts from Etna region: a SIMS and IR study 1-gen-1992 S., Lanza; S., Sergi; F., Stagno; M., Triscari; S., Grasso; C., Gugliandolo; T., Maugeri; Ciliberto, Enrico; I., Fragala; Torrisi, Alberto file da validare
SNMS and imaging SIMS study of the interface between Al99Si1 alloy and sputter cleaned silicon interface 1-gen-1992 Torrisi, Alberto; Scandurra, A; Santangelo, A; Licciardello, A. file da validare
Fatigue failure in Pb(95.5)Sn(2)Ag(2.5) solder joints: a combined SIMS/XRD study 1-gen-1992 Scandurra, A.; Torrisi, Alberto; Spoto, Giuseppe; Fragalà, I; Puglisi, O. file da validare
FATIGUE FAILURE IN PB-SN-AG ALLOY DURING PLASTIC-DEFORMATION - A 3D-SIMS IMAGING STUDY 1-gen-1992 Scandurra, A; Licciardello, Antonino; Torrisi, Alberto; Lamantia, A; Puglisi, O. file da validare
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 1-gen-1993 Scandurra, A; Galvagno, G; Raineri, V; Frisina, F; Torrisi, Alberto file da validare
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 1-gen-1993 Galvagno, G; Scandurra, A; Raineri, V; Spinella, C; Torrisi, Alberto; Laferla, A; Sciascia, V; Rimini, E. file da validare
Evaluation of matrix effects in SIMS quantification of AlxGa1-xAs/GaAs heterostructures - a SNMS approach 1-gen-1994 Torrisi, Alberto; Scandurra, A; Licciardello, Antonino file da validare
THE REACTION OF EXTREMELY THIN CO-ZR AND PD-TA LAYERS WITH SI(100) 1-gen-1994 Torrisi, Alberto; Duchateau, Jpwb; Vanderkolk, Gj file da validare
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania 1-gen-1996 Torrisi, Alberto; Arena, Giuseppe; Bellia, G; Contino, Annalinda; Falco, G; Grasso, L; Ingrassia, Salvatore file da validare
Ion versus neutral irradiation of thin films of amorphous SiO2: an in situ photoelectron spectroscopic study 1-gen-1996 Licciardello, A.; Ancarani, V.; Torrisi, Alberto; Cantiano, M.; Puglisi, Orazio Gaetano file da validare
Mostrati risultati da 21 a 40 di 101
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