Sfoglia per Autore
Breakdown voltages phenomena at molding compound-chip interface
file da validare2000-01-01 Scandurra, A; Zafarana, R; Tenya, Y; Pignataro, S
Moisture corrosion inhibitor layer for Al-alloy metallization layers for electronic devices and corresponding manufacturing method
file da validare2001-01-01 Curro', Giuseppe; Scandurra, Antonino
Polymeric composition for packaging a semiconductor electronic device and packaging obtained therefrom
file da validare2001-01-01 Zafarana, Roberto; Scandurra, Antonino; Pignataro, Salvatore; Tenya, Yuichi; Yoshizumi, Akira
Corrosion inhibition of Al metal in microelectronic devices assembled in plastic packages
file da validare2001-01-01 Scandurra, A; Curro, G; Frisina, F; Pignataro, S
Study of adhesion failure due to molding compound additives at chip surface in electronic devices
file da validare2001-01-01 Scandurra, A; Zafarana, R; Tenya, Y; Pignataro, S
Monolayers of simple organic molecules on silicon studied by surface tools
file da validare2002-01-01 Scandurra, A; Renna, L; Cerofolini, G; Pignataro, S
Growth process and chemical characterization of an ultrathin phosphate film grafted onto Al-alloy metallization surfaces relevant to microelectronic devices reliability
file da validare2002-01-01 Curro, G; Greco, R; Scandurra, A
Polymeric composition for packaging a semiconductor electronic device and packaging obtained therefrom
file da validare2003-01-01 Zafarana, Roberto; Scandurra, Antonino; Pignataro, Salvatore; Tenya, Yuichi; Yoshizumi, Akira
Moisture corrosion inhibitor layer for Al-alloy metallization layers, particularly for electronic devices and corresponding manufacturing method
file da validare2003-01-01 Currò, Giuseppe; Scandurra, Antonino
Effects of O2 and Ar-Plasma treatments on hydrogen and helium evolution in implanted silicon wafers during annealing
2003-01-01 D'Urso, Luisa; Gozzo, L; Scandurra, A; Puglisi, O.
Electrical transconduction through organic layers Si-C bonded to silicon substrates
file da validare2003-01-01 Scandurra, A; Indelli, G; Compagnini, Giuseppe Romano; Pignataro, S.
Ionic Polymer metal composites: manufacture,chemical and electrical characterization
file da validare2004-01-01 Bonomo, C.; Scandurra, A.; Giannone, P.; Graziani, Salvatore; Fortuna, L.; Pignataro, S.
Chemistry of green encapsulating molding compounds at interfaces with other materials in electronic devices
file da validare2004-01-01 Scandurra, A; Zafarana, R; Tenya, Y; Pignataro, S
The role of N in the resputtering inhibition of Si in W-Si-N reactively sputtered thin layers
file da validare2005-01-01 Vomiero, A; BOSCOLO MARCHI, E; Mariotto, G; DELLA MEA, G; Scandurra, A; Puglisi, Orazio Gaetano
XPS study of the molecular damage of polyimide precursor monomers deposited by glow discharge-induced sublimation
file da validare2005-01-01 G., MAGGIONI T; Negro, E; Carturana, S; Quaranta, A; Scandurra, A; Puglisi, Orazio Gaetano; Della, Meag
Effects of Heat Treatments on the Properties of Copper Phthalocyanine Films Deposited by Glow-Discharge-Induced Sublimation
file da validare2006-01-01 Maggioni, ; Carturan, S; Tonezzer, M; Bonafini, M; Vomiero, A; Quaranta, A; Maurizio, C; Giannici, ; Scandurra, A; D'Acapito, F; Della, M. E. A. G.; Puglisi, Orazio Gaetano
New method for the detection of enzyme immobilized on Si-based glucose biosensors
2006-01-01 Libertino, S; Aiello, V; Fiorenza, P; Fichera, M; Scandurra, A; Sinatra, Fulvia
Properties of Au/Si nanostructured films obtained by jet cooled cluster beam deposition
file da validare2006-01-01 Compagnini, Giuseppe Romano; D'Urso, Luisa; Cataliotti, R. S.; Puglisi, O.; Scandurra, A.; LA FATA, P.
Curing and electrical conductivity of conductive glues for die attach in microelectronics
file da validare2006-01-01 Scandurra, A; Cavallaro, A; Pignataro, S; Tiziani, R; Gobbato, L; Cognetti, C
Structural properties of reactively sputtered W-Si-N thin films
file da validare2007-01-01 Vomiero, A; BOSCOLO MARCHI E., QUARANTA A; Della, Mea; G, ; Brusa, R. S.; Mariotto, G; Felisari, L; Frabboni, S; Tonini, R; Ottaviani, G; Mattei, G; Scandurra, A; Puglisi, Orazio Gaetano
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Breakdown voltages phenomena at molding compound-chip interface | 1-gen-2000 | Scandurra, A; Zafarana, R; Tenya, Y; Pignataro, S | file da validare |
Moisture corrosion inhibitor layer for Al-alloy metallization layers for electronic devices and corresponding manufacturing method | 1-gen-2001 | Curro', Giuseppe; Scandurra, Antonino | file da validare |
Polymeric composition for packaging a semiconductor electronic device and packaging obtained therefrom | 1-gen-2001 | Zafarana, Roberto; Scandurra, Antonino; Pignataro, Salvatore; Tenya, Yuichi; Yoshizumi, Akira | file da validare |
Corrosion inhibition of Al metal in microelectronic devices assembled in plastic packages | 1-gen-2001 | Scandurra, A; Curro, G; Frisina, F; Pignataro, S | file da validare |
Study of adhesion failure due to molding compound additives at chip surface in electronic devices | 1-gen-2001 | Scandurra, A; Zafarana, R; Tenya, Y; Pignataro, S | file da validare |
Monolayers of simple organic molecules on silicon studied by surface tools | 1-gen-2002 | Scandurra, A; Renna, L; Cerofolini, G; Pignataro, S | file da validare |
Growth process and chemical characterization of an ultrathin phosphate film grafted onto Al-alloy metallization surfaces relevant to microelectronic devices reliability | 1-gen-2002 | Curro, G; Greco, R; Scandurra, A | file da validare |
Polymeric composition for packaging a semiconductor electronic device and packaging obtained therefrom | 1-gen-2003 | Zafarana, Roberto; Scandurra, Antonino; Pignataro, Salvatore; Tenya, Yuichi; Yoshizumi, Akira | file da validare |
Moisture corrosion inhibitor layer for Al-alloy metallization layers, particularly for electronic devices and corresponding manufacturing method | 1-gen-2003 | Currò, Giuseppe; Scandurra, Antonino | file da validare |
Effects of O2 and Ar-Plasma treatments on hydrogen and helium evolution in implanted silicon wafers during annealing | 1-gen-2003 | D'Urso, Luisa; Gozzo, L; Scandurra, A; Puglisi, O. | |
Electrical transconduction through organic layers Si-C bonded to silicon substrates | 1-gen-2003 | Scandurra, A; Indelli, G; Compagnini, Giuseppe Romano; Pignataro, S. | file da validare |
Ionic Polymer metal composites: manufacture,chemical and electrical characterization | 1-gen-2004 | Bonomo, C.; Scandurra, A.; Giannone, P.; Graziani, Salvatore; Fortuna, L.; Pignataro, S. | file da validare |
Chemistry of green encapsulating molding compounds at interfaces with other materials in electronic devices | 1-gen-2004 | Scandurra, A; Zafarana, R; Tenya, Y; Pignataro, S | file da validare |
The role of N in the resputtering inhibition of Si in W-Si-N reactively sputtered thin layers | 1-gen-2005 | Vomiero, A; BOSCOLO MARCHI, E; Mariotto, G; DELLA MEA, G; Scandurra, A; Puglisi, Orazio Gaetano | file da validare |
XPS study of the molecular damage of polyimide precursor monomers deposited by glow discharge-induced sublimation | 1-gen-2005 | G., MAGGIONI T; Negro, E; Carturana, S; Quaranta, A; Scandurra, A; Puglisi, Orazio Gaetano; Della, Meag | file da validare |
Effects of Heat Treatments on the Properties of Copper Phthalocyanine Films Deposited by Glow-Discharge-Induced Sublimation | 1-gen-2006 | Maggioni, ; Carturan, S; Tonezzer, M; Bonafini, M; Vomiero, A; Quaranta, A; Maurizio, C; Giannici, ; Scandurra, A; D'Acapito, F; Della, M. E. A. G.; Puglisi, Orazio Gaetano | file da validare |
New method for the detection of enzyme immobilized on Si-based glucose biosensors | 1-gen-2006 | Libertino, S; Aiello, V; Fiorenza, P; Fichera, M; Scandurra, A; Sinatra, Fulvia | |
Properties of Au/Si nanostructured films obtained by jet cooled cluster beam deposition | 1-gen-2006 | Compagnini, Giuseppe Romano; D'Urso, Luisa; Cataliotti, R. S.; Puglisi, O.; Scandurra, A.; LA FATA, P. | file da validare |
Curing and electrical conductivity of conductive glues for die attach in microelectronics | 1-gen-2006 | Scandurra, A; Cavallaro, A; Pignataro, S; Tiziani, R; Gobbato, L; Cognetti, C | file da validare |
Structural properties of reactively sputtered W-Si-N thin films | 1-gen-2007 | Vomiero, A; BOSCOLO MARCHI E., QUARANTA A; Della, Mea; G, ; Brusa, R. S.; Mariotto, G; Felisari, L; Frabboni, S; Tonini, R; Ottaviani, G; Mattei, G; Scandurra, A; Puglisi, Orazio Gaetano | file da validare |
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