PATANE', SALVATORE
 Distribuzione geografica
Continente #
AS - Asia 199
NA - Nord America 113
EU - Europa 87
SA - Sud America 38
AF - Africa 10
Totale 447
Nazione #
US - Stati Uniti d'America 107
SG - Singapore 77
CN - Cina 67
RU - Federazione Russa 63
BR - Brasile 35
KR - Corea 32
FR - Francia 11
VN - Vietnam 7
BJ - Benin 4
NL - Olanda 4
ID - Indonesia 3
MX - Messico 3
NG - Nigeria 3
ES - Italia 2
GB - Regno Unito 2
HK - Hong Kong 2
IT - Italia 2
KE - Kenya 2
PK - Pakistan 2
AR - Argentina 1
AZ - Azerbaigian 1
CA - Canada 1
DE - Germania 1
DO - Repubblica Dominicana 1
DZ - Algeria 1
EC - Ecuador 1
IL - Israele 1
IN - India 1
IQ - Iraq 1
IR - Iran 1
JM - Giamaica 1
JP - Giappone 1
LT - Lituania 1
NP - Nepal 1
PE - Perù 1
PH - Filippine 1
PL - Polonia 1
TR - Turchia 1
Totale 447
Città #
Hefei 46
Dallas 39
Singapore 36
Seoul 32
Moscow 22
San Jose 20
Ashburn 10
Lauterbourg 8
Los Angeles 7
Cotonou 4
Amsterdam 3
Atlanta 3
Beijing 3
Ho Chi Minh City 3
Lagos 3
New York 3
Seattle 3
São Paulo 3
Brooklyn 2
Caxias do Sul 2
Hong Kong 2
Jakarta 2
Lahore 2
Nairobi 2
Orem 2
Rio de Janeiro 2
Antalya 1
Anápolis 1
Araçatuba 1
Baghdad 1
Baku 1
Barra Bonita 1
Bela Vista de Goiás 1
Betim 1
Buffalo 1
Cachoeiro de Itapemirim 1
Campo Grande 1
Charleston 1
Charlotte 1
Council Bluffs 1
Curitiba 1
Dourados 1
Duque de Caxias 1
Franca 1
Frankfurt am Main 1
Guarapari 1
Guayaquil 1
Hanoi 1
Itaguaçu 1
Itapipoca 1
Jerusalem 1
Kansas City 1
Kingston 1
Londrina 1
Manila 1
Meriden 1
Milford 1
Monclova 1
Montreal 1
New Delhi 1
New Orleans 1
Olindina 1
Passa Tempo 1
Patos de Minas 1
Porto Alegre 1
Poções 1
Raeford 1
Rio Largo 1
Rio das Ostras 1
Rome 1
Royse City 1
Salto de Pirapora 1
Santa Teresa 1
Santiago de los Caballeros 1
Senhora dos Remédios 1
Sidoarjo 1
São Gonçalo 1
São Gonçalo do Amarante 1
Sétif 1
Tehran 1
Thái Nguyên 1
Tokyo 1
Toulouse 1
Uberlândia 1
Uyen Hung 1
Villa Adelina 1
Vĩnh Tường 1
Totale 325
Nome #
An infrared thermal measuring system for automotive applications and reliability improvement. 62
Thermal stress and mechanical strain real time mapping in Intelligent Power Switches device2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) 60
Reliability of planar, Super-Junction and trench low voltage power MOSFETs 50
Reliability Assessment on Power MOSFETs Working in Energy Absorption Mode 50
Lifetime estimation of Super-junction Power MOSFETs under short circuit and repeated avalanche operations 49
An Infrared Thermal Measuring System for Automotive Applications and Reliability Improvement 49
Reliability assessment of Low-Voltage MOSFETs driving inductive loads 48
Comparative reliability assessment of Planar and Trench Gate Power MOSFETs for Automotive Applications 45
Stress Analysis and Lifetime Estimation on Power MOSFETs for Automotive ABS Systems 43
Totale 456
Categoria #
all - tutte 1.541
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 1.541


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2024/2025100 0 0 0 0 0 18 0 11 9 19 16 27
2025/2026355 32 59 55 27 44 66 27 5 15 13 12 0
2026/20271 1 0 0 0 0 0 0 0 0 0 0 0
Totale 456