statistiche ricercatore

Continente	#
NA - Nord America	229
EU - Europa	126
AF - Africa	42
AS - Asia	40
Continente sconosciuto - Info sul continente non disponibili	2
OC - Oceania	1
Totale	440

Nome	#
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset	55
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra	50
A transport and reaction model for simulating secondary ion mass spectrometry depth profiles of polymeric materials	48
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry	48
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry	42
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers	41
User-independent protocols for the analysis of complex ToFSIMSdatasets without mass binning, peak picking and peak integration	40
Extracting latent chemical information from ToFSIMS data arising from chemical imaging	36
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS	36
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions	34
ToFSIMS characterization of conductive molecular wires assembled onto oxide substrates	27
Nunzio Tuccitto, Alessandra Bombace, Alberto Torrisi, Antonino Licciardello	13
ToF-SIMS IMAGING AND DATA MINING APPROACHES FOR ORGANIC STRUCTURED SAMPLES	7
Totale	477

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2018/2019	13	0	0	0	0	0	0	0	0	0	0	9	4
2019/2020	44	23	10	0	0	0	5	1	1	0	0	3	1
2020/2021	28	2	0	0	1	21	0	0	1	1	0	2	0
2021/2022	90	0	13	0	0	31	3	11	3	4	0	2	23
2022/2023	237	12	12	6	25	27	36	0	50	58	0	7	4
2023/2024	63	5	18	3	0	1	22	0	11	0	3	0	0
Totale													477