BOMBACE, ALESSANDRA VITTORIA
 Distribuzione geografica
Continente #
NA - Nord America 392
EU - Europa 157
AS - Asia 131
AF - Africa 44
SA - Sud America 14
Continente sconosciuto - Info sul continente non disponibili 2
OC - Oceania 1
Totale 741
Nazione #
US - Stati Uniti d'America 386
SG - Singapore 77
IT - Italia 52
CN - Cina 47
IE - Irlanda 44
CI - Costa d'Avorio 28
RU - Federazione Russa 16
BR - Brasile 14
DE - Germania 14
SN - Senegal 13
FR - Francia 8
CH - Svizzera 6
CA - Canada 4
GB - Regno Unito 3
PL - Polonia 3
ES - Italia 2
EU - Europa 2
IQ - Iraq 2
NO - Norvegia 2
SE - Svezia 2
UA - Ucraina 2
ZA - Sudafrica 2
AT - Austria 1
AU - Australia 1
BH - Bahrain 1
GR - Grecia 1
HK - Hong Kong 1
HN - Honduras 1
JM - Giamaica 1
JP - Giappone 1
NG - Nigeria 1
NL - Olanda 1
TR - Turchia 1
UZ - Uzbekistan 1
Totale 741
Città #
Santa Clara 96
Chandler 86
Singapore 51
Dublin 40
Chicago 38
Abidjan 28
Boardman 19
Civitanova Marche 19
Dakar 13
Andover 11
Bremen 11
Cambridge 11
Lawrence 11
Nanjing 9
Ashburn 7
Catania 7
Des Moines 6
Saint Petersburg 5
Hebei 4
Wilmington 4
Augusta 3
Kraków 3
Munich 3
San Francisco 3
Shenyang 3
Ann Arbor 2
Belo Horizonte 2
Brasília 2
Cagliari 2
Fuzhou 2
Hangzhou 2
Jiaxing 2
Jinan 2
Madrid 2
Messina 2
Nanchang 2
Redmond 2
Seattle 2
Zhengzhou 2
Zweidlen-Dorf 2
Amsterdam 1
Baghdad 1
Beijing 1
Betim 1
Biancavilla 1
Cametá 1
Cape Town 1
Central 1
Eboli 1
Edinburgh 1
El Progreso 1
Erbil 1
Forest City 1
Goiânia 1
Grenoble 1
Guarujá 1
Istanbul 1
Jacksonville 1
Johannesburg 1
Kingston 1
Lagos 1
Lausanne 1
Manama 1
Marília 1
Mascalucia 1
Melbourne 1
Montreal 1
Moscow 1
Ottawa 1
Paris 1
Ragusa 1
Recife 1
Rome 1
Salto 1
San Giovanni la Punta 1
Saponara 1
São Sebastião 1
Taizhou 1
Taquara 1
Teodoro Sampaio 1
Tianjin 1
Tokyo 1
Toronto 1
Vancouver 1
Totale 565
Nome #
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset 87
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra 72
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 72
A transport and reaction model for simulating secondary ion mass spectrometry depth profiles of polymeric materials 70
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry 69
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 62
User­-independent protocols for the analysis of complex ToF­SIMSdatasets without mass binning, peak picking and peak integration 62
Extracting latent chemical information from ToF­SIMS data arising from chemical imaging 61
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 58
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions 56
ToF­SIMS characterization of conductive molecular wires assembled onto oxide substrates 50
Nunzio Tuccitto, Alessandra Bombace, Alberto Torrisi, Antonino Licciardello 34
ToF-SIMS IMAGING AND DATA MINING APPROACHES FOR ORGANIC STRUCTURED SAMPLES 25
Totale 778
Categoria #
all - tutte 2.742
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.742


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20204 0 0 0 0 0 0 0 0 0 0 3 1
2020/202128 2 0 0 1 21 0 0 1 1 0 2 0
2021/202290 0 13 0 0 31 3 11 3 4 0 2 23
2022/2023237 12 12 6 25 27 36 0 50 58 0 7 4
2023/202491 5 18 3 0 1 22 0 11 0 3 20 8
2024/2025273 5 54 16 26 77 43 0 5 25 22 0 0
Totale 778