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Titolo Data di pubblicazione Autore(i) File
Structural and electrical effects od (Al-Si) n+ ohmic contact of in situ silicon cleaning bi Ar+ ion bombardment 1-gen-1991 Santangelo, A; Lanza, P; Viscuso, O; Magro, C; Scandurra, A; Licciardello, A; Torrisi, Alberto
Structural and Electrical Effects on (A1-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 1-gen-1991 Santangelo, A; Lanza, P; Viscuso, O; Magro, C; Scandurra, A; Licciardello, Antonino; Torrisi, A.
FATIGUE FAILURE IN PB-SN-AG ALLOY DURING PLASTIC-DEFORMATION - A 3D-SIMS IMAGING STUDY 1-gen-1992 Scandurra, A; Licciardello, Antonino; Torrisi, Alberto; Lamantia, A; Puglisi, O.
SIMS and SNMS study of the interface between Al-1%Si alloy and sputter cleaned silicon surface 1-gen-1992 Licciardello, Antonino; Torrisi, Alberto; Scandurra, A; Santangelo, A.
SNMS and imaging SIMS study of the interface between Al99Si1 alloy and sputter cleaned silicon interface 1-gen-1992 Torrisi, Alberto; Scandurra, A; Santangelo, A; Licciardello, A.
Fatigue failure in Pb(95.5)Sn(2)Ag(2.5) solder joints: a combined SIMS/XRD study 1-gen-1992 Scandurra, A.; Torrisi, Alberto; Spoto, Giuseppe; Fragalà, I; Puglisi, O.
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 1-gen-1993 Galvagno, G; Scandurra, A; Raineri, V; Spinella, C; Torrisi, Alberto; Laferla, A; Sciascia, V; Rimini, E.
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 1-gen-1993 Scandurra, A; Galvagno, G; Raineri, V; Frisina, F; Torrisi, Alberto
Evaluation of matrix effects in SIMS quantification of AlxGa1-xAs/GaAs heterostructures - a SNMS approach 1-gen-1994 Torrisi, Alberto; Scandurra, A; Licciardello, Antonino
SNMS characterization of ion irradiated GaAs surfaces 1-gen-1996 Scandurra, A; Licciardello, Antonino; Torrisi, Alberto; Weigert, R; Puglisi, O.
Wear Effects in Retrieved Acetabular UHMW-PE Cups 1-gen-1996 Ambrosio, G.; Carotenuto, G.; Marletta, Giovanni; Nicolais, L.; Scandurra, A.
Improved cell adhesion to ion beam-irradiated polymer surfaces 1-gen-1997 Pignataro, B; Conte, E; Scandurra, A; Marletta, Giovanni
SNMS quantification of III-V compounds heterostructures 1-gen-1997 Torrisi, Alberto; Cantiano, M; Scandurra, A; Licciardello, Antonino
Effects of O2 and Ar-Plasma treatments on hydrogen and helium evolution in implanted silicon wafers during annealing 1-gen-2003 D'Urso, Luisa; Gozzo, L; Scandurra, A; Puglisi, O.
Electrical transconduction through organic layers Si-C bonded to silicon substrates 1-gen-2003 Scandurra, A; Indelli, G; Compagnini, Giuseppe Romano; Pignataro, S.
Ionic Polymer metal composites : manufacture,chemical and electrical characterization 1-gen-2004 Bonomo, C.; Scandurra, A.; Giannone, P.; Graziani, Salvatore; Fortuna, L.; Pignataro, S.
XPS study of the molecular damage of polyimide precursor monomers deposited by glow discharge-induced sublimation 1-gen-2005 G., MAGGIONI T; Negro, E; Carturana, S; Quaranta, A; Scandurra, A; Puglisi, Orazio Gaetano; Della, Meag
The role of N in the resputtering inhibition of Si in W-Si-N reactively sputtered thin layers 1-gen-2005 Vomiero, A; BOSCOLO MARCHI, E; Mariotto, G; DELLA MEA, G; Scandurra, A; Puglisi, Orazio Gaetano
Effects of Heat Treatments on the Properties of Copper Phthalocyanine Films Deposited by Glow-Discharge-Induced Sublimation 1-gen-2006 Maggioni, ; Carturan, S; Tonezzer, M; Bonafini, M; Vomiero, A; Quaranta, A; Maurizio, C; Giannici, ; Scandurra, A; D'Acapito, F; DELLA M. E. A., G; Puglisi, Orazio Gaetano
New method for the detection of enzyme immobilized on Si-based glucose biosensors 1-gen-2006 Libertino, S; Aiello, V; Fiorenza, P; Fichera, M; Scandurra, A; Sinatra, Fulvia
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