IRIS

TORRISI, Alberto

TORRISI, Alberto  

SCIENZE CHIMICHE  

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Risultati 1 - 20 di 101 (tempo di esecuzione: 0.031 secondi).
Titolo Data di pubblicazione Autore(i) File
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania 1-gen-1996 Torrisi, Alberto; Arena, Giuseppe; Bellia, G; Contino, Annalinda; Falco, G; Grasso, L; Ingrassia, Salvatore file da validare
A Transport and Reaction Model for Simulating Cluster Secondary Ion Mass Spectrometry Depth Profiles of Organic Solids 1-gen-2016 Tuccitto, Nunzio; Zappala', Gabriella; Vitale, Stefania; Torrisi, Alberto; Licciardello, Antonino
A wavelet-PCA method saves high mass resolution information in data treatment of SIMS molecular depth profiles 1-gen-2016 Tuccitto, Nunzio; Zappalà, G; Vitale, Stefania; Torrisi, Alberto; Licciardello, Antonino
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 1-gen-1993 Galvagno, G; Scandurra, A; Raineri, V; Spinella, C; Torrisi, Alberto; Laferla, A; Sciascia, V; Rimini, E. file da validare
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates 1-gen-2004 De Giglio, E; Losito, I; Dagostino, F; Sabbatini, L; Zambonin, Pg; Torrisi, Alberto; Licciardello, Antonino file da validare
Application of ESCA to fabrication problems in semiconductor industry 1-gen-1982 Torrisi, Alberto; Pignataro, S.; Nocerino, G. file da validare
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini 1-gen-1998 Arena, Giuseppe; G., Bellia; D. M., Grasso; LA ROSA, Carmelo; P., Rizzarelli; Torrisi, Alberto file da validare
C60-SIMS molecular depth profiling of polymers with NO 1-gen-2014 Zappalà, G; Motta, V; Vitale, S; Torrisi, Alberto; Licciardello, Antonino file da validare
C60-SIMS molecular depth profiling of polymers with NO dosing. 1-gen-2014 Zappalà, G; Motta, V; Vitale, S; Torrisi, Alberto; Licciardello, Antonino file da validare
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids 1-gen-2021 Tuccitto, Nunzio; Fichera, Luca; Ruffino, Roberta; Cantaro, Valentina; Sfuncia, Gianfranco; Nicotra, Giuseppe; Sfrazzetto, Giuseppe Trusso; Li-Destri, Giovanni; Valenti, Andrea; Licciardello, Antonino; Torrisi, Alberto
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 1-gen-2019 Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino file da validare
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 1-gen-2018 Valenti, Andrea; Tuccitto, Nunzio; Bombace, ALESSANDRA VITTORIA; Torrisi, Alberto; Licciardello, Antonino file da validare
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali 1-gen-2005 Torrisi, Alberto; Arena, Giuseppe file da validare
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 1-gen-1993 Scandurra, A; Galvagno, G; Raineri, V; Frisina, F; Torrisi, Alberto file da validare
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 1-gen-2000 Licciardello, Antonino; Renna, L.; Torrisi, Alberto; Pignataro, S. file da validare
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 1-gen-2000 Licciardello, Antonino; L., Renna; Torrisi, Alberto; S., Pignataro file da validare
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 1-gen-2018 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection 1-gen-2008 Torrisi, Alberto; Tuccitto, N; Licciardello, Antonino file da validare
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite 1-gen-2009 Torrisi, Alberto; Tuccitto, Nunzio; Licciardello, Antonino file da validare
Electrical conductivity of InAs thin films 1-gen-1984 G., Burrafato; N. A., Mancini; S., Santagati; S. O., Troja; Torrisi, Alberto; Puglisi, O. file da validare