TORRISI, Alberto
TORRISI, Alberto
SCIENZE CHIMICHE
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania
1996-01-01 Torrisi, Alberto; Arena, Giuseppe; Bellia, G; Contino, Annalinda; Falco, G; Grasso, L; Ingrassia, Salvatore
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009
1993-01-01 Galvagno, G; Scandurra, A; Raineri, V; Spinella, C; Torrisi, Alberto; Laferla, A; Sciascia, V; Rimini, E.
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates
2004-01-01 De Giglio, E; Losito, I; Dagostino, F; Sabbatini, L; Zambonin, Pg; Torrisi, Alberto; Licciardello, Antonino
Application of ESCA to fabrication problems in semiconductor industry
1982-01-01 Torrisi, Alberto; Pignataro, S.; Nocerino, G.
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini
1998-01-01 Arena, Giuseppe; G., Bellia; D. M., Grasso; LA ROSA, Carmelo; P., Rizzarelli; Torrisi, Alberto
C60-SIMS molecular depth profiling of polymers with NO
2014-01-01 Zappalà, G; Motta, V; Vitale, S; Torrisi, Alberto; Licciardello, Antonino
C60-SIMS molecular depth profiling of polymers with NO dosing.
2014-01-01 Zappalà, G; Motta, V; Vitale, S; Torrisi, Alberto; Licciardello, Antonino
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids
2021-01-01 Tuccitto, Nunzio; Fichera, Luca; Ruffino, Roberta; Cantaro, Valentina; Sfuncia, Gianfranco; Nicotra, Giuseppe; Sfrazzetto, Giuseppe Trusso; Li-Destri, Giovanni; Valenti, Andrea; Licciardello, Antonino; Torrisi, Alberto
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry
2019-01-01 Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS
2018-01-01 Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali
2005-01-01 Torrisi, Alberto; Arena, Giuseppe
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009
1993-01-01 Scandurra, A; Galvagno, G; Raineri, V; Frisina, F; Torrisi, Alberto
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study
2000-01-01 Licciardello, Antonino; Renna, L.; Torrisi, Alberto; Pignataro, S.
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study
2000-01-01 Licciardello, Antonino; L., Renna; Torrisi, Alberto; S., Pignataro
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers
2018-01-01 Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection
2008-01-01 Torrisi, Alberto; Tuccitto, N; Licciardello, Antonino
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite
2009-01-01 Torrisi, Alberto; Tuccitto, Nunzio; Licciardello, Antonino
Electrical conductivity of InAs thin films
1984-01-01 G., Burrafato; N. A., Mancini; S., Santagati; S. O., Troja; Torrisi, Alberto; Puglisi, O.
Electrical properties of Electron-Gun Evaporated InAs Thin Films
1984-01-01 Burrafato, G.; Mancini, N. A.; Santagati, S.; Troja, S. O.; Torrisi, Alberto; Puglisi, O.
Erratum to "XPS study of five fluorinated compounds deposited on calcarenite stone. Part I: Unaged samples"
2008-01-01 Torrisi, Alberto
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania | 1-gen-1996 | Torrisi, Alberto; Arena, Giuseppe; Bellia, G; Contino, Annalinda; Falco, G; Grasso, L; Ingrassia, Salvatore | |
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 | 1-gen-1993 | Galvagno, G; Scandurra, A; Raineri, V; Spinella, C; Torrisi, Alberto; Laferla, A; Sciascia, V; Rimini, E. | |
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates | 1-gen-2004 | De Giglio, E; Losito, I; Dagostino, F; Sabbatini, L; Zambonin, Pg; Torrisi, Alberto; Licciardello, Antonino | |
Application of ESCA to fabrication problems in semiconductor industry | 1-gen-1982 | Torrisi, Alberto; Pignataro, S.; Nocerino, G. | |
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini | 1-gen-1998 | Arena, Giuseppe; G., Bellia; D. M., Grasso; LA ROSA, Carmelo; P., Rizzarelli; Torrisi, Alberto | |
C60-SIMS molecular depth profiling of polymers with NO | 1-gen-2014 | Zappalà, G; Motta, V; Vitale, S; Torrisi, Alberto; Licciardello, Antonino | |
C60-SIMS molecular depth profiling of polymers with NO dosing. | 1-gen-2014 | Zappalà, G; Motta, V; Vitale, S; Torrisi, Alberto; Licciardello, Antonino | |
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids | 1-gen-2021 | Tuccitto, Nunzio; Fichera, Luca; Ruffino, Roberta; Cantaro, Valentina; Sfuncia, Gianfranco; Nicotra, Giuseppe; Sfrazzetto, Giuseppe Trusso; Li-Destri, Giovanni; Valenti, Andrea; Licciardello, Antonino; Torrisi, Alberto | |
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry | 1-gen-2019 | Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino | |
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS | 1-gen-2018 | Valenti, Andrea; Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino | |
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali | 1-gen-2005 | Torrisi, Alberto; Arena, Giuseppe | |
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 | 1-gen-1993 | Scandurra, A; Galvagno, G; Raineri, V; Frisina, F; Torrisi, Alberto | |
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study | 1-gen-2000 | Licciardello, Antonino; Renna, L.; Torrisi, Alberto; Pignataro, S. | |
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study | 1-gen-2000 | Licciardello, Antonino; L., Renna; Torrisi, Alberto; S., Pignataro | |
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers | 1-gen-2018 | Tuccitto, Nunzio; Bombace, Alessandra; Torrisi, Alberto; Licciardello, Antonino | |
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection | 1-gen-2008 | Torrisi, Alberto; Tuccitto, N; Licciardello, Antonino | |
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite | 1-gen-2009 | Torrisi, Alberto; Tuccitto, Nunzio; Licciardello, Antonino | |
Electrical conductivity of InAs thin films | 1-gen-1984 | G., Burrafato; N. A., Mancini; S., Santagati; S. O., Troja; Torrisi, Alberto; Puglisi, O. | |
Electrical properties of Electron-Gun Evaporated InAs Thin Films | 1-gen-1984 | Burrafato, G.; Mancini, N. A.; Santagati, S.; Troja, S. O.; Torrisi, Alberto; Puglisi, O. | |
Erratum to "XPS study of five fluorinated compounds deposited on calcarenite stone. Part I: Unaged samples" | 1-gen-2008 | Torrisi, Alberto |