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Mostrati risultati da 41 a 60 di 462
Titolo Data di pubblicazione Autore(i) File
LOW-TEMPERATURE MODIFICATIONS IN THE DEFECT STRUCTURE OF AMORPHOUS-SILICON PROBED BY IN-SITU RAMAN-SPECTROSCOPY 1-gen-1993 Battaglia, A; Coffa, S; Priolo, Francesco; Compagnini, Giuseppe Romano; Baratta, Ga file da validare
CONDUCTIVITY CHANGES AND IMPURITY DEFECT INTERACTIONS IN ION-IMPLANTED AMORPHOUS-SILICON 1-gen-1993 Coffa, S; Priolo, Francesco; Poate, Jm; Glarum, Sh file da validare
3-DIMENSIONAL CONCENTRATION PROFILES OF HYBRID DIFFUSERS IN CRYSTALLINE SILICON 1-gen-1993 Coffa, S; Privitera, V; Frisina, F; Priolo, Francesco file da validare
ELECTRICAL AND OPTICAL CHARACTERIZATION OF ER-IMPLANTED SI - THE ROLE OF IMPURITIES AND DEFECTS 1-gen-1993 Priolo, Francesco; Coffa, S; Franzo, G; Spinella, C; Carnera, A; Bellani, V. file da validare
INTERFACE STRUCTURE DURING ION-BEAM-INDUCED EPITAXIAL CRYSTALLIZATION OF SILICON 1-gen-1993 Custer, Js; Battaglia, A; Saggio, M; Priolo, Francesco file da validare
MECHANISMS OF AMORPHIZATION IN ION-IMPLANTED CRYSTALLINE SILICON 1-gen-1993 Campisano, Su; Coffa, S; Raineri, V; Priolo, Francesco; Rimini, E. file da validare
REDUCTION OF SECONDARY DEFECT DENSITY BY C-IMPLANT AND B-IMPLANT IN GEXSI1-X LAYERS FORMED BY HIGH-DOSE GE IMPLANTATION IN (100) SI 1-gen-1993 Lombardo, S; Priolo, Francesco; Campisano, Su; Lagomarsino, S. file da validare
DEFECT PRODUCTION AND ANNEALING IN ION-IMPLANTED AMORPHOUS-SILICON 1-gen-1993 Coffa, S; Priolo, Francesco; Battaglia, A. file da validare
OPTICAL ACTIVATION AND EXCITATION MECHANISMS OF ER IMPLANTED IN SI 1-gen-1993 Coffa, S; Priolo, Francesco; Franzo, G; Bellani, V; Carnera, A; Spinella, C. file da validare
DIFFUSION AND OUTDIFFUSION OF ALUMINUM IMPLANTED INTO SILICON 1-gen-1993 Galvagno, G; Lavia, F; Priolo, Francesco; Rimini, E. file da validare
DIRECT-ENERGY PROCESSES AND PHASE-TRANSITIONS IN SILICON 1-gen-1993 Rimini, E; Priolo, Francesco; Spinella, C. file da validare
ROOM-TEMPERATURE ELECTROLUMINESCENCE FROM ER-DOPED CRYSTALLINE SI 1-gen-1994 Franzo, G; Priolo, Francesco; Coffa, S; Polman, A; Carnera, A. file da validare
DEFECT EVOLUTION DURING ION-BOMBARDMENT OF AMORPHOUS SI PROBED BY IN-SITU CONDUCTIVITY MEASUREMENTS 1-gen-1994 Priolo, Francesco; Coffa, S; Battaglia, A. file da validare
TEMPERATURE-DEPENDENCE AND QUENCHING PROCESSES OF THE INTRA-4F LUMINESCENCE OF ER IN CRYSTALLINE SI 1-gen-1994 Coffa, S; Franzo, G; Priolo, Francesco; Polman, A; Serna, R. file da validare
INTERFACE EVOLUTION AND EPITAXIAL REALIGNMENT IN POLYCRYSTAL SINGLE-CRYSTAL SI STRUCTURES 1-gen-1994 Priolo, Francesco; Benyaich, F; Campisano, Su; Rimini, E; Spinella, C; Cacciato, A; Ward, P; Fallico, G. file da validare
CHANNELING IMPLANTS IN SILICON-CRYSTALS 1-gen-1994 Raineri, V; Privitera, V; Galvagno, G; Priolo, Francesco; Rimini, E. file da validare
NANOCRYSTAL SIZE MODIFICATIONS IN POROUS SILICON BY PREANODIZATION ION-IMPLANTATION 1-gen-1994 Pavesi, L; Giebel, G; Ziglio, F; Mariotto, G; Priolo, Francesco; Campisano, Su; Spinella, C. file da validare
AL-O INTERACTIONS IN ION-IMPLANTED CRYSTALLINE SILICON 1-gen-1994 Galvagno, G; Laferla, A; Spinella, C; Priolo, Francesco; Raineri, V; Torrisi, L; Rimini, E; Carnera, A; Gasparotto, A. file da validare
INTERFACE ROUGHNESS DURING THERMAL AND ION-INDUCED REGROWTH OF AMORPHOUS LAYERS ON SI(001) 1-gen-1994 Lohmeier, M; Devries, S; Custer, Js; Vlieg, E; Finney, Ms; Priolo, Francesco; Battaglia, A. file da validare
DEFECT ACCUMULATION DURING ION IRRADIATION OF CRYSTALLINE SI PROBED BY IN-SITU CONDUCTIVITY MEASUREMENTS 1-gen-1994 Battaglia, A; Coffa, S; Priolo, Francesco; Spinella, C. file da validare
Mostrati risultati da 41 a 60 di 462
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