IRIS
TORRISI, Alberto
 Distribuzione geografica
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Continente #
NA - Nord America 4.245
EU - Europa 1.414
AS - Asia 1.226
AF - Africa 365
SA - Sud America 251
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 4
Totale 7.514
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Nazione #
US - Stati Uniti d'America 4.106
SG - Singapore 574
CN - Cina 513
IE - Irlanda 346
CI - Costa d'Avorio 319
UA - Ucraina 309
IT - Italia 295
BR - Brasile 227
RU - Federazione Russa 136
CA - Canada 127
DE - Germania 112
SE - Svezia 50
FR - Francia 33
GB - Regno Unito 29
SN - Senegal 28
CH - Svizzera 26
IN - India 24
KR - Corea 21
PL - Polonia 19
AR - Argentina 15
HK - Hong Kong 12
IQ - Iraq 11
JP - Giappone 10
UZ - Uzbekistan 10
EU - Europa 9
NL - Olanda 9
BD - Bangladesh 8
GR - Grecia 8
ES - Italia 7
MX - Messico 7
ZA - Sudafrica 7
AT - Austria 6
CZ - Repubblica Ceca 6
VN - Vietnam 6
TR - Turchia 5
BE - Belgio 4
DZ - Algeria 4
ID - Indonesia 4
LB - Libano 4
PK - Pakistan 4
AL - Albania 3
AU - Australia 3
BH - Bahrain 3
FI - Finlandia 3
PE - Perù 3
VE - Venezuela 3
AM - Armenia 2
JO - Giordania 2
KE - Kenya 2
LT - Lituania 2
MA - Marocco 2
NG - Nigeria 2
NO - Norvegia 2
OM - Oman 2
PH - Filippine 2
PT - Portogallo 2
SA - Arabia Saudita 2
AE - Emirati Arabi Uniti 1
AZ - Azerbaigian 1
BA - Bosnia-Erzegovina 1
BG - Bulgaria 1
CO - Colombia 1
CR - Costa Rica 1
FK - Isole Falkland (Malvinas) 1
GE - Georgia 1
HN - Honduras 1
IL - Israele 1
JM - Giamaica 1
KW - Kuwait 1
LU - Lussemburgo 1
MK - Macedonia 1
MY - Malesia 1
NI - Nicaragua 1
NZ - Nuova Zelanda 1
RO - Romania 1
RS - Serbia 1
SK - Slovacchia (Repubblica Slovacca) 1
SV - El Salvador 1
SY - Repubblica araba siriana 1
TN - Tunisia 1
UY - Uruguay 1
Totale 7.514
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Città #
Santa Clara 655
Dallas 528
Chandler 508
Houston 422
Singapore 363
Jacksonville 359
Dublin 342
Abidjan 319
Chicago 194
Boardman 155
Catania 103
Cambridge 98
Lawrence 98
Nanjing 98
Andover 97
Bremen 90
Toronto 87
Ashburn 85
Beijing 76
Hefei 61
Des Moines 58
Civitanova Marche 54
San Mateo 46
Los Angeles 42
Shenyang 41
Nanchang 39
Saint Petersburg 39
Wilmington 37
Ottawa 29
Dakar 28
Changsha 21
Hebei 21
Jiaxing 21
Seoul 21
São Paulo 19
Tianjin 18
Columbus 15
The Dalles 15
San Francisco 14
New York 13
Rome 12
Warsaw 12
Milan 11
Brooklyn 10
Council Bluffs 10
Hong Kong 10
Munich 9
Rio de Janeiro 9
Tokyo 9
Ann Arbor 8
Campinas 8
Shanghai 8
Atlanta 7
Augusta 7
Baghdad 7
Kunming 7
Norwalk 7
Taizhou 7
Jinan 6
Montreal 6
Phoenix 6
Stockholm 6
Belo Horizonte 5
Brno 5
Cagliari 5
Chennai 5
Den Haag 5
Mascalucia 5
Mumbai 5
Seattle 5
Zhengzhou 5
Brussels 4
Fremont 4
Hangzhou 4
Lausanne 4
Liberty Lake 4
London 4
Marano di Napoli 4
Messina 4
Moscow 4
Naples 4
Ningbo 4
Partanna 4
Pune 4
San Giovanni la Punta 4
Santa Teresa Di Riva 4
Tashkent 4
Washington 4
Campo Grande 3
Cherbourg-Octeville 3
Curitiba 3
Johannesburg 3
Joinville 3
Kraków 3
Lima 3
Manama 3
Manchester 3
Mountain View 3
Osasco 3
Paris 3
Totale 5.660
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Nome #
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 492
A Transport and Reaction Model for Simulating Cluster Secondary Ion Mass Spectrometry Depth Profiles of Organic Solids 157
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids 138
FATIGUE FAILURE IN PB-SN-AG ALLOY DURING PLASTIC-DEFORMATION - A 3D-SIMS IMAGING STUDY 123
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania 113
A wavelet-PCA method saves high mass resolution information in data treatment of SIMS molecular depth profiles 107
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates 103
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset 103
Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers 102
Application of ESCA to fabrication problems in semiconductor industry 101
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 99
ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces 97
Evaluation of matrix effects in SIMS quantification of AlxGa1-xAs/GaAs heterostructures - a SNMS approach 96
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini 93
SIMS characterization of surface-modified nanostructured titania electrodes for solar energy conversion devices 87
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 86
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite 85
Fatigue failure in Pb(95.5)Sn(2)Ag(2.5) solder joints: a combined SIMS/XRD study 84
Separation and quantitation of metal ions by 4-(2-pyridylazo)resorcinol complexation in capillary electrophoresis-electrospray ionisation mass spectrometry 84
STRUCTURAL-PROPERTIES OF THERMAL EVAPORATED SNTE THIN-FILMS 83
Electrical conductivity of InAs thin films 83
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra 83
RADIATION-ENHANCED DIFFUSION OF NA IN ALKALINE GLASSES 82
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 82
Evaluation of five fluorinated compounds as calcarenite protectives 81
Na-surface segregation and oxygen depletion in particle bombardment of alkaline glasses 81
Ion versus neutral irradiation of thin films of amorphous SiO2: an in situ photoelectron spectroscopic study 81
C60-SIMS molecular depth profiling of polymers with NO dosing. 81
Unsupervised analysis of big ToF-SIMS datasets: a statistical pattern recognition approach 81
Oxygen Depletion in Electron Beam Bombarded Glass Surfaces Studied by XPS 78
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 77
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry 77
ESCA Study of the Adhesion of Ag, Cu and Ni to Polysiloxane Resins Used on the Semiconductor Industry 77
User­-independent protocols for the analysis of complex ToF­SIMSdatasets without mass binning, peak picking and peak integration 76
NI SURFACE-CHEMISTRY AND QUALITY OF THE AL/NI BOND IN ELECTRONIC DEVICES 75
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 75
Probing Archaeological and Artistic Solid Materials by Spatially Resolved Analytical Techniques 74
THE REACTION OF EXTREMELY THIN CO-ZR AND PD-TA LAYERS WITH SI(100) 74
XPS study of five fluorinated compounds deposited on calcarenite stone: Part I. Unaged samples 74
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 74
Preparation and ESCA characterization of poly(vinyl chloride) surface-grafted with heparin-complexing poly(amido amine) chains 72
Structural and Electrical Effects on (A1-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 72
Extracting latent chemical information from ToF­SIMS data arising from chemical imaging 72
Experimental Implementation of Molecule Shift Keying for Enhanced Molecular Communication 71
SNMS quantification of III-V compounds heterostructures 71
ToF-SIMS of metal-complex-based supramolecular chemistry on oxide surfaces 71
Ion versus neutral irradiation of thin films of amorphous SiO2: An in situ X-ray photoelectron spectroscopy study 71
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions 71
C60-SIMS molecular depth profiling of polymers with NO 70
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection 68
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali 68
Electrical properties of Electron-Gun Evaporated InAs Thin Films 68
XPS investigation of the effects induced by the silanization on real glass surfaces 67
ESCA and SIMS study of tetrabromobisphenol-A 67
Formazione di ioni positivi e negativi per impatto elettronico in spettrometria di massa 66
Erratum to "XPS study of five fluorinated compounds deposited on calcarenite stone. Part I: Unaged samples" 66
Structural and electrical effects od (Al-Si) n+ ohmic contact of in situ silicon cleaning bi Ar+ ion bombardment 66
Smart data treatment of ToF­SIMS spectra and depth profiles of polymer‐based materials 66
Segregation of gallium at SiO2/Si interfaces during sputtering with Ga+ ions: experimental and computer simulation study 65
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 65
XPS study of five fluorinated compounds deposited on calcarenite stone - Part II: Aged samples 65
Strategies based on calixcrowns for the detection and removal of cesium ions from alkali-containing solutions 65
ESCA study of the adhesion of Ag, Cu and Ni to polysiloxane resins used in the semiconductor industry 64
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 64
Nitric oxide-assisted SIMS depth profiling of polymers with C60 primary ions 64
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 64
Novel approaches to data mining in molecular depth profiling: from the simulation to sophisticated data treatment 64
Testing a fluorinated compound as a protective material for calcarenite 63
Uso di tecniche ESCA e RBS per la caratterizzazione di un film di ossidi di cobalto e cromo deposto su vetro 63
Fenomeni interfacciali in sistemi metallo-resina di interesse nell'industria dei semiconduttori 63
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 62
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 61
SNMS and imaging SIMS study of the interface between Al99Si1 alloy and sputter cleaned silicon interface 60
ToF-SIMS imaging of mineralization process occurring in cement pastes used a root-end filling materials. An in vitro study 60
SNMS characterization of ion irradiated GaAs surfaces 60
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 60
INFLUENCE OF SURFACE CHEMICAL-COMPOSITION ON THE RELIABILITY OF AL CU BOND IN ELECTRONIC DEVICES 59
Stepwise preparation and surface characterisation of polypyridine based metal complexes onto oxide surfaces 59
Functionalization of oxide surfaces by terpyridine phosphonate ligands:surface reactions and anchoring geometry 59
ToF-SIMS images and spectra of biomimetic calcium silicate-based cements after storage in solutions simulating the effects of human biological fluids 58
ToF­SIMS characterization of conductive molecular wires assembled onto oxide substrates 58
SIMS and SNMS study of the interface between Al-1%Si alloy and sputter cleaned silicon surface 57
Un nuovo derivato ciclodestrinico per la separazione chinale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 56
Surface (XPS, SIMS) chemical investigation on poly(pyrrole-3-acetic acid) films electrosynthesized on Ti and TiAlV substrates for the development of new bioactive substrates 56
ToF-SIMS imaging of mineralisation process occurring in cement pastes used as root-end filling materials. An in vitro study 56
Microbial attack on basalts from Etna region: a SIMS and IR study 55
SIMS DEPTH PROFILING OF SI/SIO2/SI LAYERS BY USING SELF-SPUTTERED GA+ FROM A GALLIUM LIQUID-METAL ION-SOURCE 54
Interfacial instability of liquid interphase improves molecular communication density 53
KINETICS OF BROMINE MIGRATION AND COPPER REACTIONS AT COPPER EPOXY-RESIN INTERFACES 53
Nuclear and Electronic Energy Loss of Noble Gas Ions Bombarding Solid Benzene and Relative Chemical Effects 53
Nuclear and electronic energy loss of noble gas ions bombarding solid benzene and related chemical effects 52
The 6-derivative of beta-cyclodextrin with succinic acid: a new chiral selector for CD-EKC 52
Fluorinated Phosphoric Ester-based Protective Material for Limestone-made Ancient Monuments, Buildings and Artifacts: an X-ray Photoelectron Spectroscopy Study 51
ToF-SIMS study of the effects of the substrate on the fragmentation patterns of some fluorinated compounds 50
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 50
Two calix-crown based stationary phases, synthesis, chromathographic performance and X-ray photoelectron spectroscopy investigation 50
INTERFACIAL CHEMISTRY AT REAL RESIN-METAL INTERFACES OF ELECTRONIC DEVICES 47
Studi ESCA della struttura chimica di interfaccia in problemi di adesione 47
Structural and Electrical Effects on (Al-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 44
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 42
Totale 7.645
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Categoria #
all - tutte 26.882
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 26.882
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021463 0 0 72 0 163 7 70 9 50 1 76 15
2021/2022861 92 122 1 17 193 12 103 30 64 3 32 192
2022/20231.381 104 59 20 205 153 238 0 220 316 5 39 22
2023/2024571 29 146 11 27 19 131 4 31 8 13 104 48
2024/20252.070 32 327 112 90 474 337 65 50 151 178 123 131
2025/20261.104 242 162 700 0 0 0 0 0 0 0 0 0
Totale 7.721