IRIS
TORRISI, Alberto
 Distribuzione geografica
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Continente #
NA - Nord America 4.514
AS - Asia 1.719
EU - Europa 1.501
AF - Africa 370
SA - Sud America 306
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 4
Totale 8.423
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Nazione #
US - Stati Uniti d'America 4.362
SG - Singapore 894
CN - Cina 625
IE - Irlanda 346
CI - Costa d'Avorio 319
UA - Ucraina 309
IT - Italia 304
BR - Brasile 268
RU - Federazione Russa 184
CA - Canada 132
DE - Germania 112
SE - Svezia 56
VN - Vietnam 41
GB - Regno Unito 36
FR - Francia 34
SN - Senegal 29
CH - Svizzera 26
IN - India 26
KR - Corea 24
PL - Polonia 24
AR - Argentina 21
JP - Giappone 16
HK - Hong Kong 15
MX - Messico 13
NL - Olanda 12
ES - Italia 11
IQ - Iraq 11
UZ - Uzbekistan 10
BD - Bangladesh 9
EU - Europa 9
GR - Grecia 8
ID - Indonesia 8
ZA - Sudafrica 8
TR - Turchia 7
AT - Austria 6
CZ - Repubblica Ceca 6
BE - Belgio 4
DZ - Algeria 4
FI - Finlandia 4
LB - Libano 4
PK - Pakistan 4
AL - Albania 3
AU - Australia 3
BH - Bahrain 3
CO - Colombia 3
LT - Lituania 3
MA - Marocco 3
PE - Perù 3
PT - Portogallo 3
SA - Arabia Saudita 3
VE - Venezuela 3
AE - Emirati Arabi Uniti 2
AM - Armenia 2
CL - Cile 2
GA - Gabon 2
JO - Giordania 2
KE - Kenya 2
MY - Malesia 2
NG - Nigeria 2
NO - Norvegia 2
OM - Oman 2
PH - Filippine 2
UY - Uruguay 2
AZ - Azerbaigian 1
BA - Bosnia-Erzegovina 1
BG - Bulgaria 1
BO - Bolivia 1
CR - Costa Rica 1
DO - Repubblica Dominicana 1
EC - Ecuador 1
EE - Estonia 1
FK - Isole Falkland (Malvinas) 1
GE - Georgia 1
HN - Honduras 1
IL - Israele 1
IR - Iran 1
JM - Giamaica 1
KW - Kuwait 1
LU - Lussemburgo 1
MK - Macedonia 1
MN - Mongolia 1
NI - Nicaragua 1
NZ - Nuova Zelanda 1
PA - Panama 1
PY - Paraguay 1
RO - Romania 1
RS - Serbia 1
SK - Slovacchia (Repubblica Slovacca) 1
SV - El Salvador 1
SY - Repubblica araba siriana 1
TN - Tunisia 1
Totale 8.423
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Città #
Santa Clara 656
Dallas 623
Chandler 508
Singapore 483
Houston 425
Jacksonville 359
Dublin 342
Abidjan 319
Chicago 194
Boardman 155
Ashburn 125
Beijing 120
Catania 103
Cambridge 98
Lawrence 98
Nanjing 98
Andover 97
Bremen 90
Toronto 89
Los Angeles 71
Hefei 68
Des Moines 58
Civitanova Marche 54
San Mateo 46
Shenyang 41
Nanchang 39
Saint Petersburg 39
Wilmington 37
Moscow 35
Dakar 29
Ottawa 29
São Paulo 26
Seoul 24
Buffalo 21
Changsha 21
Hebei 21
Jiaxing 21
New York 21
Tianjin 18
Warsaw 17
Ho Chi Minh City 16
Columbus 15
The Dalles 15
Brooklyn 14
San Francisco 14
Tokyo 14
Hong Kong 13
Atlanta 12
Milan 12
Rome 12
Stockholm 12
Rio de Janeiro 11
Council Bluffs 10
Montreal 9
Munich 9
Ann Arbor 8
Campinas 8
Shanghai 8
Augusta 7
Baghdad 7
Chennai 7
Kunming 7
Norwalk 7
Phoenix 7
Poplar 7
Taizhou 7
Belo Horizonte 6
Hangzhou 6
Hanoi 6
Jinan 6
Mascalucia 6
Amsterdam 5
Brno 5
Cagliari 5
Den Haag 5
Mumbai 5
Orem 5
Seattle 5
Zhengzhou 5
Belpasso 4
Boston 4
Brussels 4
Fremont 4
Johannesburg 4
Jundiaí 4
Lausanne 4
Liberty Lake 4
London 4
Marano di Napoli 4
Messina 4
Naples 4
Ningbo 4
Palermo 4
Paris 4
Partanna 4
Porto Alegre 4
Pune 4
San Giovanni la Punta 4
Santa Teresa Di Riva 4
Tashkent 4
Totale 6.140
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Nome #
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 505
A Transport and Reaction Model for Simulating Cluster Secondary Ion Mass Spectrometry Depth Profiles of Organic Solids 182
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids 152
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania 133
FATIGUE FAILURE IN PB-SN-AG ALLOY DURING PLASTIC-DEFORMATION - A 3D-SIMS IMAGING STUDY 129
A wavelet-PCA method saves high mass resolution information in data treatment of SIMS molecular depth profiles 127
Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers 123
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates 116
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset 113
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 113
Application of ESCA to fabrication problems in semiconductor industry 111
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite 109
ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces 106
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini 102
Evaluation of matrix effects in SIMS quantification of AlxGa1-xAs/GaAs heterostructures - a SNMS approach 102
SIMS characterization of surface-modified nanostructured titania electrodes for solar energy conversion devices 101
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 97
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 94
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra 94
RADIATION-ENHANCED DIFFUSION OF NA IN ALKALINE GLASSES 93
Na-surface segregation and oxygen depletion in particle bombardment of alkaline glasses 91
Ion versus neutral irradiation of thin films of amorphous SiO2: an in situ photoelectron spectroscopic study 91
C60-SIMS molecular depth profiling of polymers with NO dosing. 91
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 91
Separation and quantitation of metal ions by 4-(2-pyridylazo)resorcinol complexation in capillary electrophoresis-electrospray ionisation mass spectrometry 91
Evaluation of five fluorinated compounds as calcarenite protectives 90
STRUCTURAL-PROPERTIES OF THERMAL EVAPORATED SNTE THIN-FILMS 90
Fatigue failure in Pb(95.5)Sn(2)Ag(2.5) solder joints: a combined SIMS/XRD study 90
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry 90
Electrical conductivity of InAs thin films 88
Oxygen Depletion in Electron Beam Bombarded Glass Surfaces Studied by XPS 87
Unsupervised analysis of big ToF-SIMS datasets: a statistical pattern recognition approach 87
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 86
User­-independent protocols for the analysis of complex ToF­SIMSdatasets without mass binning, peak picking and peak integration 86
Probing Archaeological and Artistic Solid Materials by Spatially Resolved Analytical Techniques 84
ESCA Study of the Adhesion of Ag, Cu and Ni to Polysiloxane Resins Used on the Semiconductor Industry 83
Extracting latent chemical information from ToF­SIMS data arising from chemical imaging 82
THE REACTION OF EXTREMELY THIN CO-ZR AND PD-TA LAYERS WITH SI(100) 81
XPS study of five fluorinated compounds deposited on calcarenite stone: Part I. Unaged samples 81
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali 81
NI SURFACE-CHEMISTRY AND QUALITY OF THE AL/NI BOND IN ELECTRONIC DEVICES 81
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 80
Structural and Electrical Effects on (A1-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 79
Smart data treatment of ToF­SIMS spectra and depth profiles of polymer‐based materials 78
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions 78
Preparation and ESCA characterization of poly(vinyl chloride) surface-grafted with heparin-complexing poly(amido amine) chains 77
Formazione di ioni positivi e negativi per impatto elettronico in spettrometria di massa 77
C60-SIMS molecular depth profiling of polymers with NO 77
ToF-SIMS of metal-complex-based supramolecular chemistry on oxide surfaces 77
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 77
Experimental Implementation of Molecule Shift Keying for Enhanced Molecular Communication 76
SNMS quantification of III-V compounds heterostructures 76
Ion versus neutral irradiation of thin films of amorphous SiO2: An in situ X-ray photoelectron spectroscopy study 76
XPS investigation of the effects induced by the silanization on real glass surfaces 75
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection 75
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 74
Uso di tecniche ESCA e RBS per la caratterizzazione di un film di ossidi di cobalto e cromo deposto su vetro 74
ESCA and SIMS study of tetrabromobisphenol-A 74
Structural and electrical effects od (Al-Si) n+ ohmic contact of in situ silicon cleaning bi Ar+ ion bombardment 73
Electrical properties of Electron-Gun Evaporated InAs Thin Films 73
Erratum to "XPS study of five fluorinated compounds deposited on calcarenite stone. Part I: Unaged samples" 72
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 72
XPS study of five fluorinated compounds deposited on calcarenite stone - Part II: Aged samples 72
Strategies based on calixcrowns for the detection and removal of cesium ions from alkali-containing solutions 72
ESCA study of the adhesion of Ag, Cu and Ni to polysiloxane resins used in the semiconductor industry 71
Fenomeni interfacciali in sistemi metallo-resina di interesse nell'industria dei semiconduttori 71
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 71
Segregation of gallium at SiO2/Si interfaces during sputtering with Ga+ ions: experimental and computer simulation study 69
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 69
ToF-SIMS images and spectra of biomimetic calcium silicate-based cements after storage in solutions simulating the effects of human biological fluids 69
Testing a fluorinated compound as a protective material for calcarenite 68
Nitric oxide-assisted SIMS depth profiling of polymers with C60 primary ions 68
Novel approaches to data mining in molecular depth profiling: from the simulation to sophisticated data treatment 68
ToF­SIMS characterization of conductive molecular wires assembled onto oxide substrates 68
Chemical Mapping for Insight into Early 1900s Historical Photographic Films 67
ToF-SIMS imaging of mineralization process occurring in cement pastes used a root-end filling materials. An in vitro study 66
Stepwise preparation and surface characterisation of polypyridine based metal complexes onto oxide surfaces 66
Surface (XPS, SIMS) chemical investigation on poly(pyrrole-3-acetic acid) films electrosynthesized on Ti and TiAlV substrates for the development of new bioactive substrates 66
SNMS and imaging SIMS study of the interface between Al99Si1 alloy and sputter cleaned silicon interface 65
SNMS characterization of ion irradiated GaAs surfaces 65
INFLUENCE OF SURFACE CHEMICAL-COMPOSITION ON THE RELIABILITY OF AL CU BOND IN ELECTRONIC DEVICES 64
Functionalization of oxide surfaces by terpyridine phosphonate ligands:surface reactions and anchoring geometry 64
Nuclear and electronic energy loss of noble gas ions bombarding solid benzene and related chemical effects 64
Microbial attack on basalts from Etna region: a SIMS and IR study 62
Fluorinated Phosphoric Ester-based Protective Material for Limestone-made Ancient Monuments, Buildings and Artifacts: an X-ray Photoelectron Spectroscopy Study 62
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 62
Interfacial instability of liquid interphase improves molecular communication density 61
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 61
SIMS and SNMS study of the interface between Al-1%Si alloy and sputter cleaned silicon surface 61
Nuclear and Electronic Energy Loss of Noble Gas Ions Bombarding Solid Benzene and Relative Chemical Effects 61
ToF-SIMS imaging of mineralisation process occurring in cement pastes used as root-end filling materials. An in vitro study 61
KINETICS OF BROMINE MIGRATION AND COPPER REACTIONS AT COPPER EPOXY-RESIN INTERFACES 60
The 6-derivative of beta-cyclodextrin with succinic acid: a new chiral selector for CD-EKC 60
Un nuovo derivato ciclodestrinico per la separazione chinale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 59
SIMS DEPTH PROFILING OF SI/SIO2/SI LAYERS BY USING SELF-SPUTTERED GA+ FROM A GALLIUM LIQUID-METAL ION-SOURCE 59
INTERFACIAL CHEMISTRY AT REAL RESIN-METAL INTERFACES OF ELECTRONIC DEVICES 57
Two calix-crown based stationary phases, synthesis, chromathographic performance and X-ray photoelectron spectroscopy investigation 56
Studi ESCA della struttura chimica di interfaccia in problemi di adesione 55
ToF-SIMS study of the effects of the substrate on the fragmentation patterns of some fluorinated compounds 54
Structural and Electrical Effects on (Al-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 53
Totale 8.541
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Categoria #
all - tutte 29.049
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 29.049
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021391 0 0 0 0 163 7 70 9 50 1 76 15
2021/2022861 92 122 1 17 193 12 103 30 64 3 32 192
2022/20231.381 104 59 20 205 153 238 0 220 316 5 39 22
2023/2024571 29 146 11 27 19 131 4 31 8 13 104 48
2024/20252.070 32 327 112 90 474 337 65 50 151 178 123 131
2025/20262.013 242 162 783 258 568 0 0 0 0 0 0 0
Totale 8.630