IRIS
TORRISI, Alberto
 Distribuzione geografica
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Continente #
NA - Nord America 2.402
EU - Europa 1.218
AS - Asia 344
AF - Africa 243
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 4
SA - Sud America 4
Totale 4.224
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Nazione #
US - Stati Uniti d'America 2.283
IE - Irlanda 349
CN - Cina 316
UA - Ucraina 314
CI - Costa d'Avorio 214
IT - Italia 155
RU - Federazione Russa 126
CA - Canada 119
DE - Germania 104
SE - Svezia 50
FR - Francia 28
SN - Senegal 28
CH - Svizzera 26
GB - Regno Unito 19
EU - Europa 9
NL - Olanda 9
GR - Grecia 8
PL - Polonia 8
IN - India 7
AT - Austria 6
UZ - Uzbekistan 6
LB - Libano 4
SG - Singapore 4
AU - Australia 3
BR - Brasile 3
JP - Giappone 3
BE - Belgio 2
ES - Italia 2
FI - Finlandia 2
HK - Hong Kong 2
NO - Norvegia 2
BG - Bulgaria 1
CZ - Repubblica Ceca 1
FK - Isole Falkland (Malvinas) 1
IL - Israele 1
LU - Lussemburgo 1
MK - Macedonia 1
MY - Malesia 1
NG - Nigeria 1
NZ - Nuova Zelanda 1
PT - Portogallo 1
RO - Romania 1
RS - Serbia 1
SK - Slovacchia (Repubblica Slovacca) 1
Totale 4.224
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Città #
Chandler 509
Houston 422
Jacksonville 365
Dublin 345
Abidjan 214
Nanjing 100
Cambridge 99
Lawrence 99
Andover 98
Bremen 91
Toronto 87
Ashburn 72
Catania 72
Des Moines 58
Boardman 56
San Mateo 47
Nanchang 40
Saint Petersburg 40
Shenyang 40
Wilmington 37
Ottawa 30
Dakar 28
Hebei 21
Jiaxing 21
Changsha 20
Tianjin 18
San Francisco 10
Ann Arbor 8
Kunming 8
Norwalk 7
Taizhou 7
Jinan 6
Augusta 5
Den Haag 5
Rome 5
Seattle 5
Fremont 4
Grafing 4
Lausanne 4
Liberty Lake 4
Ningbo 4
Pune 4
Santa Teresa Di Riva 4
Zhengzhou 4
Beijing 3
Hangzhou 3
Kraków 3
Moscow 3
Mountain View 3
Sassari 3
Washington 3
Aci Sant'Antonio 2
Almere Stad 2
Amsterdam 2
Bari 2
Belpasso 2
Brussels 2
Central 2
Edinburgh 2
Foggia 2
Frankfurt Am Main 2
Fuzhou 2
Helsinki 2
Horgen 2
Kiev 2
London 2
Madrid 2
Messina 2
Montreal 2
Padova 2
Palermo 2
Redmond 2
Saint-Fons 2
Salerno 2
Shanghai 2
Singapore 2
São Paulo 2
Taormina 2
Tokyo 2
Athens 1
Belgrade 1
Bend 1
Biancavilla 1
Bratislava 1
Canberra 1
Carini 1
Chicago 1
Council Bluffs 1
Dearborn 1
Eboli 1
Guangzhou 1
Hefei 1
Lagos 1
Leawood 1
Lisbon 1
Lower Hutt 1
Ludwigshafen 1
Luxembourg 1
Melbourne 1
Milan 1
Totale 3.225
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Nome #
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 444
A Transport and Reaction Model for Simulating Cluster Secondary Ion Mass Spectrometry Depth Profiles of Organic Solids 94
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids 72
Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers 61
ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces 59
A wavelet-PCA method saves high mass resolution information in data treatment of SIMS molecular depth profiles 59
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates 58
RADIATION-ENHANCED DIFFUSION OF NA IN ALKALINE GLASSES 55
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset 55
FATIGUE FAILURE IN PB-SN-AG ALLOY DURING PLASTIC-DEFORMATION - A 3D-SIMS IMAGING STUDY 53
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania 53
Electrical conductivity of InAs thin films 52
SIMS characterization of surface-modified nanostructured titania electrodes for solar energy conversion devices 52
STRUCTURAL-PROPERTIES OF THERMAL EVAPORATED SNTE THIN-FILMS 51
Evaluation of matrix effects in SIMS quantification of AlxGa1-xAs/GaAs heterostructures - a SNMS approach 51
Separation and quantitation of metal ions by 4-(2-pyridylazo)resorcinol complexation in capillary electrophoresis-electrospray ionisation mass spectrometry 51
ESCA Study of the Adhesion of Ag, Cu and Ni to Polysiloxane Resins Used on the Semiconductor Industry 51
Oxygen Depletion in Electron Beam Bombarded Glass Surfaces Studied by XPS 50
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra 50
Application of ESCA to fabrication problems in semiconductor industry 48
Na-surface segregation and oxygen depletion in particle bombardment of alkaline glasses 48
Ion versus neutral irradiation of thin films of amorphous SiO2: an in situ photoelectron spectroscopic study 48
Preparation and ESCA characterization of poly(vinyl chloride) surface-grafted with heparin-complexing poly(amido amine) chains 48
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini 48
ToF-SIMS of metal-complex-based supramolecular chemistry on oxide surfaces 48
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 48
THE REACTION OF EXTREMELY THIN CO-ZR AND PD-TA LAYERS WITH SI(100) 47
Evaluation of five fluorinated compounds as calcarenite protectives 47
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 47
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 47
Two calix-crown based stationary phases. Synthesis, Chromatographic performance and X-ray photoelectron spectroscopy investigation 45
Fatigue failure in Pb(95.5)Sn(2)Ag(2.5) solder joints: a combined SIMS/XRD study 45
Probing Archaeological and Artistic Solid Materials by Spatially Resolved Analytical Techniques 44
SNMS quantification of III-V compounds heterostructures 44
Erratum to "XPS study of five fluorinated compounds deposited on calcarenite stone. Part I: Unaged samples" 44
Unsupervised analysis of big ToF-SIMS datasets: a statistical pattern recognition approach 44
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite 44
Structural and Electrical Effects on (A1-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 43
ESCA and SIMS study of tetrabromobisphenol-A 42
C60-SIMS molecular depth profiling of polymers with NO dosing. 42
Ion versus neutral irradiation of thin films of amorphous SiO2: An in situ X-ray photoelectron spectroscopy study 42
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry 42
Segregation of gallium at SiO2/Si interfaces during sputtering with Ga+ ions: experimental and computer simulation study 41
Nitric oxide-assisted SIMS depth profiling of polymers with C60 primary ions 41
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 41
NI SURFACE-CHEMISTRY AND QUALITY OF THE AL/NI BOND IN ELECTRONIC DEVICES 40
User­-independent protocols for the analysis of complex ToF­SIMSdatasets without mass binning, peak picking and peak integration 40
XPS investigation of the effects induced by the silanization on real glass surfaces 39
ESCA study of the adhesion of Ag, Cu and Ni to polysiloxane resins used in the semiconductor industry 39
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 39
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 39
Testing a fluorinated compound as a protective material for calcarenite 38
XPS study of five fluorinated compounds deposited on calcarenite stone: Part I. Unaged samples 38
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 38
Formazione di ioni positivi e negativi per impatto elettronico in spettrometria di massa 38
Fenomeni interfacciali in sistemi metallo-resina di interesse nell'industria dei semiconduttori 38
C60-SIMS molecular depth profiling of polymers with NO 38
Electrical properties of Electron-Gun Evaporated InAs Thin Films 38
Strategies based on calixcrowns for the detection and removal of cesium ions from alkali-containing solutions 38
INFLUENCE OF SURFACE CHEMICAL-COMPOSITION ON THE RELIABILITY OF AL CU BOND IN ELECTRONIC DEVICES 37
Structural and electrical effects od (Al-Si) n+ ohmic contact of in situ silicon cleaning bi Ar+ ion bombardment 37
XPS study of five fluorinated compounds deposited on calcarenite stone - Part II: Aged samples 37
Smart data treatment of ToF­SIMS spectra and depth profiles of polymer‐based materials 37
ToF-SIMS imaging of mineralization process occurring in cement pastes used a root-end filling materials. An in vitro study 36
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 36
Uso di tecniche ESCA e RBS per la caratterizzazione di un film di ossidi di cobalto e cromo deposto su vetro 35
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection 35
SNMS and imaging SIMS study of the interface between Al99Si1 alloy and sputter cleaned silicon interface 35
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 35
Novel approaches to data mining in molecular depth profiling: from the simulation to sophisticated data treatment 35
Extracting latent chemical information from ToF­SIMS data arising from chemical imaging 35
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 34
Un nuovo derivato ciclodestrinico per la separazione chinale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 34
Surface (XPS, SIMS) chemical investigation on poly(pyrrole-3-acetic acid) films electrosynthesized on Ti and TiAlV substrates for the development of new bioactive substrates 34
SNMS characterization of ion irradiated GaAs surfaces 34
ToF-SIMS images and spectra of biomimetic calcium silicate-based cements after storage in solutions simulating the effects of human biological fluids 34
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions 34
ToF-SIMS imaging of mineralisation process occurring in cement pastes used as root-end filling materials. An in vitro study 34
Stepwise preparation and surface characterisation of polypyridine based metal complexes onto oxide surfaces 33
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 33
Functionalization of oxide surfaces by terpyridine phosphonate ligands:surface reactions and anchoring geometry 31
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali 31
Nuclear and Electronic Energy Loss of Noble Gas Ions Bombarding Solid Benzene and Relative Chemical Effects 31
ToF-SIMS study of the effects of the substrate on the fragmentation patterns of some fluorinated compounds 30
SIMS DEPTH PROFILING OF SI/SIO2/SI LAYERS BY USING SELF-SPUTTERED GA+ FROM A GALLIUM LIQUID-METAL ION-SOURCE 30
SIMS and SNMS study of the interface between Al-1%Si alloy and sputter cleaned silicon surface 30
KINETICS OF BROMINE MIGRATION AND COPPER REACTIONS AT COPPER EPOXY-RESIN INTERFACES 29
Microbial attack on basalts from Etna region: a SIMS and IR study 28
Nuclear and electronic energy loss of noble gas ions bombarding solid benzene and related chemical effects 28
Two calix-crown based stationary phases, synthesis, chromathographic performance and X-ray photoelectron spectroscopy investigation 28
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 28
ToF­SIMS characterization of conductive molecular wires assembled onto oxide substrates 27
INTERFACIAL CHEMISTRY AT REAL RESIN-METAL INTERFACES OF ELECTRONIC DEVICES 26
Studi ESCA della struttura chimica di interfaccia in problemi di adesione 25
Fluorinated Phosphoric Ester-based Protective Material for Limestone-made Ancient Monuments, Buildings and Artifacts: an X-ray Photoelectron Spectroscopy Study 24
The 6-derivative of beta-cyclodextrin with succinic acid: a new chiral selector for CD-EKC 23
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 20
THE REACTION OF AMORPHOUS CO-ZR LAYERS WITH SI(100) AND SIO2 SUBSTRATES BY ANNEALING IN VACUUM AND NH3 20
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 18
Interfacial instability of liquid interphase improves molecular communication density 6
Totale 4.426
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Categoria #
all - tutte 12.642
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 12.642
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/201973 0 0 0 0 0 0 0 0 0 0 14 59
2019/2020915 277 50 93 166 117 8 64 6 46 0 58 30
2020/2021532 9 48 73 0 165 8 71 9 53 1 78 17
2021/2022869 93 123 1 18 194 12 104 30 65 3 33 193
2022/20231.390 105 59 20 206 154 240 0 222 318 5 39 22
2023/2024410 29 148 11 28 19 132 4 24 8 7 0 0
Totale 4.427