IRIS
TORRISI, Alberto
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 3.615
EU - Europa 1.382
AS - Asia 995
AF - Africa 257
SA - Sud America 224
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 4
Totale 6.486
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 3.483
SG - Singapore 541
CN - Cina 368
IE - Irlanda 346
UA - Ucraina 308
IT - Italia 286
CI - Costa d'Avorio 212
BR - Brasile 205
RU - Federazione Russa 136
CA - Canada 121
DE - Germania 109
SE - Svezia 47
FR - Francia 31
SN - Senegal 28
CH - Svizzera 26
GB - Regno Unito 24
IN - India 19
PL - Polonia 13
AR - Argentina 11
KR - Corea 10
UZ - Uzbekistan 10
EU - Europa 9
IQ - Iraq 9
NL - Olanda 9
GR - Grecia 8
MX - Messico 7
ZA - Sudafrica 7
AT - Austria 6
CZ - Repubblica Ceca 6
ES - Italia 6
BD - Bangladesh 5
HK - Hong Kong 5
BE - Belgio 4
DZ - Algeria 4
JP - Giappone 4
LB - Libano 4
AU - Australia 3
FI - Finlandia 3
PE - Perù 3
PK - Pakistan 3
TR - Turchia 3
AL - Albania 2
AM - Armenia 2
BH - Bahrain 2
JO - Giordania 2
KE - Kenya 2
LT - Lituania 2
MA - Marocco 2
NG - Nigeria 2
NO - Norvegia 2
PT - Portogallo 2
VE - Venezuela 2
AE - Emirati Arabi Uniti 1
AZ - Azerbaigian 1
BG - Bulgaria 1
CO - Colombia 1
CR - Costa Rica 1
FK - Isole Falkland (Malvinas) 1
HN - Honduras 1
IL - Israele 1
JM - Giamaica 1
KW - Kuwait 1
LU - Lussemburgo 1
MK - Macedonia 1
MY - Malesia 1
NI - Nicaragua 1
NZ - Nuova Zelanda 1
OM - Oman 1
RO - Romania 1
RS - Serbia 1
SA - Arabia Saudita 1
SK - Slovacchia (Repubblica Slovacca) 1
UY - Uruguay 1
VN - Vietnam 1
Totale 6.486
Salva come PNG Salva come JPEG
Città #
Santa Clara 646
Chandler 508
Houston 422
Jacksonville 359
Dublin 342
Singapore 335
Abidjan 212
Chicago 191
Boardman 155
Cambridge 98
Lawrence 98
Nanjing 98
Andover 97
Catania 97
Bremen 90
Toronto 86
Ashburn 74
Des Moines 58
Civitanova Marche 54
San Mateo 46
Shenyang 41
Nanchang 39
Saint Petersburg 39
Wilmington 37
Ottawa 29
Dakar 28
Changsha 21
Hebei 21
Jiaxing 21
Tianjin 18
Columbus 15
The Dalles 15
San Francisco 14
São Paulo 13
Rome 12
Hefei 11
Los Angeles 11
Milan 11
Seoul 10
Munich 9
Rio de Janeiro 9
Ann Arbor 8
Shanghai 8
Campinas 7
Kunming 7
Norwalk 7
Taizhou 7
Augusta 6
Baghdad 6
Beijing 6
Council Bluffs 6
Jinan 6
New York 6
Phoenix 6
Warsaw 6
Atlanta 5
Belo Horizonte 5
Brno 5
Cagliari 5
Den Haag 5
Seattle 5
Zhengzhou 5
Brooklyn 4
Brussels 4
Fremont 4
Hangzhou 4
Lausanne 4
Liberty Lake 4
London 4
Mascalucia 4
Messina 4
Moscow 4
Mumbai 4
Naples 4
Ningbo 4
Partanna 4
Pune 4
San Giovanni la Punta 4
Santa Teresa Di Riva 4
Tashkent 4
Washington 4
Campo Grande 3
Chennai 3
Cherbourg-Octeville 3
Hong Kong 3
Johannesburg 3
Joinville 3
Kraków 3
Lima 3
Marano di Napoli 3
Mountain View 3
Osasco 3
Recife 3
Sassari 3
St Petersburg 3
Stockholm 3
Tokyo 3
Aci Sant'Antonio 2
Almere Stad 2
Amman 2
Totale 4.747
Salva come PNG Salva come JPEG
Nome #
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 474
A Transport and Reaction Model for Simulating Cluster Secondary Ion Mass Spectrometry Depth Profiles of Organic Solids 129
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids 122
FATIGUE FAILURE IN PB-SN-AG ALLOY DURING PLASTIC-DEFORMATION - A 3D-SIMS IMAGING STUDY 112
Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers 91
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset 91
A wavelet-PCA method saves high mass resolution information in data treatment of SIMS molecular depth profiles 86
ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces 84
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates 83
Evaluation of matrix effects in SIMS quantification of AlxGa1-xAs/GaAs heterostructures - a SNMS approach 82
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 82
Application of ESCA to fabrication problems in semiconductor industry 80
SIMS characterization of surface-modified nanostructured titania electrodes for solar energy conversion devices 79
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania 78
Electrical conductivity of InAs thin films 77
Separation and quantitation of metal ions by 4-(2-pyridylazo)resorcinol complexation in capillary electrophoresis-electrospray ionisation mass spectrometry 77
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra 77
RADIATION-ENHANCED DIFFUSION OF NA IN ALKALINE GLASSES 75
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini 75
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 75
Na-surface segregation and oxygen depletion in particle bombardment of alkaline glasses 72
Ion versus neutral irradiation of thin films of amorphous SiO2: an in situ photoelectron spectroscopic study 72
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry 72
STRUCTURAL-PROPERTIES OF THERMAL EVAPORATED SNTE THIN-FILMS 71
Fatigue failure in Pb(95.5)Sn(2)Ag(2.5) solder joints: a combined SIMS/XRD study 71
Unsupervised analysis of big ToF-SIMS datasets: a statistical pattern recognition approach 71
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite 71
Evaluation of five fluorinated compounds as calcarenite protectives 69
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 69
ESCA Study of the Adhesion of Ag, Cu and Ni to Polysiloxane Resins Used on the Semiconductor Industry 69
THE REACTION OF EXTREMELY THIN CO-ZR AND PD-TA LAYERS WITH SI(100) 68
Oxygen Depletion in Electron Beam Bombarded Glass Surfaces Studied by XPS 68
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 68
Probing Archaeological and Artistic Solid Materials by Spatially Resolved Analytical Techniques 66
Preparation and ESCA characterization of poly(vinyl chloride) surface-grafted with heparin-complexing poly(amido amine) chains 65
SNMS quantification of III-V compounds heterostructures 65
ToF-SIMS of metal-complex-based supramolecular chemistry on oxide surfaces 65
Extracting latent chemical information from ToF­SIMS data arising from chemical imaging 65
C60-SIMS molecular depth profiling of polymers with NO dosing. 64
NI SURFACE-CHEMISTRY AND QUALITY OF THE AL/NI BOND IN ELECTRONIC DEVICES 64
User­-independent protocols for the analysis of complex ToF­SIMSdatasets without mass binning, peak picking and peak integration 64
Structural and Electrical Effects on (A1-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 63
Ion versus neutral irradiation of thin films of amorphous SiO2: An in situ X-ray photoelectron spectroscopy study 63
XPS investigation of the effects induced by the silanization on real glass surfaces 61
Segregation of gallium at SiO2/Si interfaces during sputtering with Ga+ ions: experimental and computer simulation study 61
Nitric oxide-assisted SIMS depth profiling of polymers with C60 primary ions 61
Erratum to "XPS study of five fluorinated compounds deposited on calcarenite stone. Part I: Unaged samples" 61
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 61
Smart data treatment of ToF­SIMS spectra and depth profiles of polymer‐based materials 61
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions 61
XPS study of five fluorinated compounds deposited on calcarenite stone: Part I. Unaged samples 60
ESCA and SIMS study of tetrabromobisphenol-A 60
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 60
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 58
Electrical properties of Electron-Gun Evaporated InAs Thin Films 58
XPS study of five fluorinated compounds deposited on calcarenite stone - Part II: Aged samples 58
Formazione di ioni positivi e negativi per impatto elettronico in spettrometria di massa 57
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 57
Structural and electrical effects od (Al-Si) n+ ohmic contact of in situ silicon cleaning bi Ar+ ion bombardment 57
Strategies based on calixcrowns for the detection and removal of cesium ions from alkali-containing solutions 57
C60-SIMS molecular depth profiling of polymers with NO 56
Testing a fluorinated compound as a protective material for calcarenite 55
INFLUENCE OF SURFACE CHEMICAL-COMPOSITION ON THE RELIABILITY OF AL CU BOND IN ELECTRONIC DEVICES 55
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 55
ESCA study of the adhesion of Ag, Cu and Ni to polysiloxane resins used in the semiconductor industry 55
Fenomeni interfacciali in sistemi metallo-resina di interesse nell'industria dei semiconduttori 55
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection 55
SNMS and imaging SIMS study of the interface between Al99Si1 alloy and sputter cleaned silicon interface 55
ToF-SIMS images and spectra of biomimetic calcium silicate-based cements after storage in solutions simulating the effects of human biological fluids 55
ToF-SIMS imaging of mineralization process occurring in cement pastes used a root-end filling materials. An in vitro study 54
Novel approaches to data mining in molecular depth profiling: from the simulation to sophisticated data treatment 54
Experimental Implementation of Molecule Shift Keying for Enhanced Molecular Communication 53
Uso di tecniche ESCA e RBS per la caratterizzazione di un film di ossidi di cobalto e cromo deposto su vetro 53
Functionalization of oxide surfaces by terpyridine phosphonate ligands:surface reactions and anchoring geometry 53
SNMS characterization of ion irradiated GaAs surfaces 53
Stepwise preparation and surface characterisation of polypyridine based metal complexes onto oxide surfaces 52
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 52
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali 52
ToF­SIMS characterization of conductive molecular wires assembled onto oxide substrates 52
Surface (XPS, SIMS) chemical investigation on poly(pyrrole-3-acetic acid) films electrosynthesized on Ti and TiAlV substrates for the development of new bioactive substrates 51
Un nuovo derivato ciclodestrinico per la separazione chinale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 50
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 50
ToF-SIMS imaging of mineralisation process occurring in cement pastes used as root-end filling materials. An in vitro study 50
SIMS and SNMS study of the interface between Al-1%Si alloy and sputter cleaned silicon surface 49
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 49
KINETICS OF BROMINE MIGRATION AND COPPER REACTIONS AT COPPER EPOXY-RESIN INTERFACES 48
SIMS DEPTH PROFILING OF SI/SIO2/SI LAYERS BY USING SELF-SPUTTERED GA+ FROM A GALLIUM LIQUID-METAL ION-SOURCE 47
Two calix-crown based stationary phases, synthesis, chromathographic performance and X-ray photoelectron spectroscopy investigation 47
Nuclear and Electronic Energy Loss of Noble Gas Ions Bombarding Solid Benzene and Relative Chemical Effects 47
Microbial attack on basalts from Etna region: a SIMS and IR study 46
ToF-SIMS study of the effects of the substrate on the fragmentation patterns of some fluorinated compounds 46
Nuclear and electronic energy loss of noble gas ions bombarding solid benzene and related chemical effects 46
INTERFACIAL CHEMISTRY AT REAL RESIN-METAL INTERFACES OF ELECTRONIC DEVICES 42
The 6-derivative of beta-cyclodextrin with succinic acid: a new chiral selector for CD-EKC 42
Fluorinated Phosphoric Ester-based Protective Material for Limestone-made Ancient Monuments, Buildings and Artifacts: an X-ray Photoelectron Spectroscopy Study 41
Studi ESCA della struttura chimica di interfaccia in problemi di adesione 41
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 38
Interfacial instability of liquid interphase improves molecular communication density 37
THE REACTION OF AMORPHOUS CO-ZR LAYERS WITH SI(100) AND SIO2 SUBSTRATES BY ANNEALING IN VACUUM AND NH3 37
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 36
Totale 6.657
Salva come PNG Salva come JPEG
Categoria #
all - tutte 24.043
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 24.043
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021519 9 47 72 0 163 7 70 9 50 1 76 15
2021/2022861 92 122 1 17 193 12 103 30 64 3 32 192
2022/20231.381 104 59 20 205 153 238 0 220 316 5 39 22
2023/2024571 29 146 11 27 19 131 4 31 8 13 104 48
2024/20252.070 32 327 112 90 474 337 65 50 151 178 123 131
2025/202676 76 0 0 0 0 0 0 0 0 0 0 0
Totale 6.693