IRIS
TORRISI, Alberto
 Distribuzione geografica
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Continente #
NA - Nord America 5.056
EU - Europa 2.235
AS - Asia 2.142
AF - Africa 409
SA - Sud America 360
Continente sconosciuto - Info sul continente non disponibili 213
OC - Oceania 5
Totale 10.420
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Nazione #
US - Stati Uniti d'America 4.877
SG - Singapore 1.091
RU - Federazione Russa 676
CN - Cina 660
IE - Irlanda 340
IT - Italia 338
CI - Costa d'Avorio 311
BR - Brasile 297
UA - Ucraina 296
CA - Canada 143
VN - Vietnam 135
FR - Francia 127
DE - Germania 123
NL - Olanda 112
SE - Svezia 60
KR - Corea 55
GB - Regno Unito 42
NG - Nigeria 39
IN - India 32
SN - Senegal 28
AR - Argentina 27
PL - Polonia 27
CH - Svizzera 26
HK - Hong Kong 25
BD - Bangladesh 20
IQ - Iraq 20
MX - Messico 19
JP - Giappone 17
ES - Italia 13
UZ - Uzbekistan 13
ZA - Sudafrica 12
CO - Colombia 9
EU - Europa 9
PK - Pakistan 9
GR - Grecia 8
ID - Indonesia 8
TR - Turchia 8
CZ - Repubblica Ceca 7
AT - Austria 6
LB - Libano 6
PH - Filippine 6
VE - Venezuela 6
DZ - Algeria 5
EC - Ecuador 5
FI - Finlandia 5
MA - Marocco 5
PE - Perù 5
SA - Arabia Saudita 5
AU - Australia 4
BE - Belgio 4
JM - Giamaica 4
MY - Malesia 4
PT - Portogallo 4
UY - Uruguay 4
AE - Emirati Arabi Uniti 3
AL - Albania 3
BH - Bahrain 3
LT - Lituania 3
PY - Paraguay 3
SY - Repubblica araba siriana 3
TN - Tunisia 3
AM - Armenia 2
BO - Bolivia 2
CR - Costa Rica 2
DO - Repubblica Dominicana 2
EE - Estonia 2
GA - Gabon 2
IL - Israele 2
JO - Giordania 2
KE - Kenya 2
LU - Lussemburgo 2
NO - Norvegia 2
NP - Nepal 2
OM - Oman 2
RS - Serbia 2
AO - Angola 1
AZ - Azerbaigian 1
BA - Bosnia-Erzegovina 1
BG - Bulgaria 1
BN - Brunei Darussalam 1
BS - Bahamas 1
CL - Cile 1
DK - Danimarca 1
EG - Egitto 1
FK - Isole Falkland (Malvinas) 1
GE - Georgia 1
GT - Guatemala 1
HN - Honduras 1
IR - Iran 1
KG - Kirghizistan 1
KH - Cambogia 1
KW - Kuwait 1
MK - Macedonia 1
MN - Mongolia 1
NI - Nicaragua 1
NZ - Nuova Zelanda 1
PA - Panama 1
PR - Porto Rico 1
RO - Romania 1
SI - Slovenia 1
Totale 10.211
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Città #
Santa Clara 657
Singapore 657
Dallas 621
Chandler 502
Houston 433
Jacksonville 347
Dublin 336
Abidjan 311
San Jose 275
Moscow 262
Ashburn 212
Chicago 194
Boardman 150
Beijing 123
Catania 110
Amsterdam 105
Cambridge 96
Lawrence 96
Andover 95
Nanjing 95
Lauterbourg 90
Bremen 89
Toronto 89
Los Angeles 86
Hefei 66
Des Moines 58
Seoul 55
Civitanova Marche 54
Ho Chi Minh City 48
San Mateo 44
Shenyang 41
Saint Petersburg 38
Wilmington 38
Nanchang 37
São Paulo 34
Dakar 28
Ottawa 28
New York 27
Hanoi 25
Hong Kong 22
Buffalo 21
Changsha 21
Hebei 21
Jiaxing 21
Brooklyn 20
Warsaw 20
Abuja 18
Orem 18
Lagos 17
Tianjin 17
Rome 16
Columbus 15
Milan 15
Montreal 15
San Francisco 15
Stockholm 15
The Dalles 15
Atlanta 14
Tokyo 14
Phoenix 13
Baghdad 12
Council Bluffs 12
Rio de Janeiro 11
Denver 10
Mascalucia 10
Campinas 9
Mumbai 9
Munich 9
Poplar 9
Shanghai 9
Ann Arbor 8
Chennai 8
Da Nang 8
Frankfurt am Main 8
Augusta 7
Belo Horizonte 7
Johannesburg 7
Kunming 7
Taizhou 7
Tashkent 7
Haiphong 6
Hangzhou 6
Jinan 6
Messina 6
Naples 6
Norwalk 6
Querétaro 6
Seattle 6
Belpasso 5
Brno 5
Cagliari 5
Charlotte 5
Curitiba 5
Den Haag 5
London 5
Manchester 5
Zhengzhou 5
Biên Hòa 4
Boston 4
Brussels 4
Totale 7.294
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Nome #
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 545
A Transport and Reaction Model for Simulating Cluster Secondary Ion Mass Spectrometry Depth Profiles of Organic Solids 229
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids 197
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania 183
A wavelet-PCA method saves high mass resolution information in data treatment of SIMS molecular depth profiles 170
Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers 153
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates 153
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite 152
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 149
FATIGUE FAILURE IN PB-SN-AG ALLOY DURING PLASTIC-DEFORMATION - A 3D-SIMS IMAGING STUDY 140
Application of ESCA to fabrication problems in semiconductor industry 135
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini 135
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset 134
ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces 133
Evaluation of five fluorinated compounds as calcarenite protectives 130
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 130
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 130
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 130
STRUCTURAL-PROPERTIES OF THERMAL EVAPORATED SNTE THIN-FILMS 127
RADIATION-ENHANCED DIFFUSION OF NA IN ALKALINE GLASSES 127
SIMS characterization of surface-modified nanostructured titania electrodes for solar energy conversion devices 125
Chemical Mapping for Insight into Early 1900s Historical Photographic Films 124
Evaluation of matrix effects in SIMS quantification of AlxGa1-xAs/GaAs heterostructures - a SNMS approach 117
C60-SIMS molecular depth profiling of polymers with NO dosing. 116
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra 116
THE REACTION OF EXTREMELY THIN CO-ZR AND PD-TA LAYERS WITH SI(100) 114
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry 112
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 111
Fatigue failure in Pb(95.5)Sn(2)Ag(2.5) solder joints: a combined SIMS/XRD study 110
User­-independent protocols for the analysis of complex ToF­SIMSdatasets without mass binning, peak picking and peak integration 108
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali 107
Separation and quantitation of metal ions by 4-(2-pyridylazo)resorcinol complexation in capillary electrophoresis-electrospray ionisation mass spectrometry 106
Extracting latent chemical information from ToF­SIMS data arising from chemical imaging 106
Oxygen Depletion in Electron Beam Bombarded Glass Surfaces Studied by XPS 104
Smart data treatment of ToF­SIMS spectra and depth profiles of polymer‐based materials 104
Na-surface segregation and oxygen depletion in particle bombardment of alkaline glasses 102
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 102
Unsupervised analysis of big ToF-SIMS datasets: a statistical pattern recognition approach 102
C60-SIMS molecular depth profiling of polymers with NO 101
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions 101
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 100
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection 99
Experimental Implementation of Molecule Shift Keying for Enhanced Molecular Communication 98
Ion versus neutral irradiation of thin films of amorphous SiO2: An in situ X-ray photoelectron spectroscopy study 98
ESCA Study of the Adhesion of Ag, Cu and Ni to Polysiloxane Resins Used on the Semiconductor Industry 97
XPS study of five fluorinated compounds deposited on calcarenite stone: Part I. Unaged samples 95
Electrical conductivity of InAs thin films 94
XPS study of five fluorinated compounds deposited on calcarenite stone - Part II: Aged samples 94
Probing Archaeological and Artistic Solid Materials by Spatially Resolved Analytical Techniques 92
Preparation and ESCA characterization of poly(vinyl chloride) surface-grafted with heparin-complexing poly(amido amine) chains 92
Structural and Electrical Effects on (A1-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 92
NI SURFACE-CHEMISTRY AND QUALITY OF THE AL/NI BOND IN ELECTRONIC DEVICES 92
ToF-SIMS of metal-complex-based supramolecular chemistry on oxide surfaces 90
XPS investigation of the effects induced by the silanization on real glass surfaces 89
ToF­SIMS characterization of conductive molecular wires assembled onto oxide substrates 89
ESCA and SIMS study of tetrabromobisphenol-A 88
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 87
SNMS quantification of III-V compounds heterostructures 87
Fenomeni interfacciali in sistemi metallo-resina di interesse nell'industria dei semiconduttori 86
Structural and electrical effects od (Al-Si) n+ ohmic contact of in situ silicon cleaning bi Ar+ ion bombardment 86
Uso di tecniche ESCA e RBS per la caratterizzazione di un film di ossidi di cobalto e cromo deposto su vetro 85
Formazione di ioni positivi e negativi per impatto elettronico in spettrometria di massa 84
Electrical properties of Electron-Gun Evaporated InAs Thin Films 84
Testing a fluorinated compound as a protective material for calcarenite 82
Stepwise preparation and surface characterisation of polypyridine based metal complexes onto oxide surfaces 82
ToF-SIMS images and spectra of biomimetic calcium silicate-based cements after storage in solutions simulating the effects of human biological fluids 82
Strategies based on calixcrowns for the detection and removal of cesium ions from alkali-containing solutions 82
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 81
Nitric oxide-assisted SIMS depth profiling of polymers with C60 primary ions 81
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 81
Erratum to "XPS study of five fluorinated compounds deposited on calcarenite stone. Part I: Unaged samples" 81
Novel approaches to data mining in molecular depth profiling: from the simulation to sophisticated data treatment 81
Functionalization of oxide surfaces by terpyridine phosphonate ligands:surface reactions and anchoring geometry 80
Surface (XPS, SIMS) chemical investigation on poly(pyrrole-3-acetic acid) films electrosynthesized on Ti and TiAlV substrates for the development of new bioactive substrates 80
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 80
Nuclear and Electronic Energy Loss of Noble Gas Ions Bombarding Solid Benzene and Relative Chemical Effects 80
ToF-SIMS imaging of mineralization process occurring in cement pastes used a root-end filling materials. An in vitro study 79
Nuclear and electronic energy loss of noble gas ions bombarding solid benzene and related chemical effects 79
INFLUENCE OF SURFACE CHEMICAL-COMPOSITION ON THE RELIABILITY OF AL CU BOND IN ELECTRONIC DEVICES 78
Segregation of gallium at SiO2/Si interfaces during sputtering with Ga+ ions: experimental and computer simulation study 78
SNMS and imaging SIMS study of the interface between Al99Si1 alloy and sputter cleaned silicon interface 78
Un nuovo derivato ciclodestrinico per la separazione chinale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 77
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 76
ToF-SIMS imaging of mineralisation process occurring in cement pastes used as root-end filling materials. An in vitro study 76
SNMS characterization of ion irradiated GaAs surfaces 75
Interfacial instability of liquid interphase improves molecular communication density 74
Microbial attack on basalts from Etna region: a SIMS and IR study 74
Fluorinated Phosphoric Ester-based Protective Material for Limestone-made Ancient Monuments, Buildings and Artifacts: an X-ray Photoelectron Spectroscopy Study 73
SIMS and SNMS study of the interface between Al-1%Si alloy and sputter cleaned silicon surface 73
The 6-derivative of beta-cyclodextrin with succinic acid: a new chiral selector for CD-EKC 73
SIMS DEPTH PROFILING OF SI/SIO2/SI LAYERS BY USING SELF-SPUTTERED GA+ FROM A GALLIUM LIQUID-METAL ION-SOURCE 69
KINETICS OF BROMINE MIGRATION AND COPPER REACTIONS AT COPPER EPOXY-RESIN INTERFACES 69
Structural and Electrical Effects on (Al-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 67
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 67
Studi ESCA della struttura chimica di interfaccia in problemi di adesione 67
Two calix-crown based stationary phases, synthesis, chromathographic performance and X-ray photoelectron spectroscopy investigation 65
INTERFACIAL CHEMISTRY AT REAL RESIN-METAL INTERFACES OF ELECTRONIC DEVICES 65
ToF-SIMS study of the effects of the substrate on the fragmentation patterns of some fluorinated compounds 61
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 53
THE REACTION OF AMORPHOUS CO-ZR LAYERS WITH SI(100) AND SIO2 SUBSTRATES BY ANNEALING IN VACUUM AND NH3 53
Totale 10.420
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Categoria #
all - tutte 34.825
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 34.825
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022753 0 120 1 16 189 12 101 30 61 3 31 189
2022/20231.358 102 59 20 203 148 234 0 216 310 5 39 22
2023/2024559 29 142 11 26 19 128 4 31 8 13 100 48
2024/20252.034 32 319 109 89 466 332 64 50 148 176 120 129
2025/20263.805 238 161 770 251 620 749 452 67 243 118 79 57
2026/2027125 76 49 0 0 0 0 0 0 0 0 0 0
Totale 10.420