IRIS
TORRISI, Alberto
 Distribuzione geografica
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Continente #
NA - Nord America 3.490
EU - Europa 1.346
AS - Asia 904
AF - Africa 247
SA - Sud America 156
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 4
Totale 6.156
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Nazione #
US - Stati Uniti d'America 3.368
SG - Singapore 501
CN - Cina 354
IE - Irlanda 346
UA - Ucraina 307
IT - Italia 273
CI - Costa d'Avorio 212
BR - Brasile 143
RU - Federazione Russa 135
CA - Canada 117
DE - Germania 109
SE - Svezia 45
FR - Francia 31
SN - Senegal 28
CH - Svizzera 26
GB - Regno Unito 20
IN - India 11
EU - Europa 9
NL - Olanda 9
AR - Argentina 8
GR - Grecia 8
PL - Polonia 8
UZ - Uzbekistan 7
AT - Austria 6
CZ - Repubblica Ceca 6
IQ - Iraq 6
HK - Hong Kong 5
LB - Libano 4
AU - Australia 3
JP - Giappone 3
MX - Messico 3
AL - Albania 2
BD - Bangladesh 2
BE - Belgio 2
BH - Bahrain 2
DZ - Algeria 2
ES - Italia 2
FI - Finlandia 2
JO - Giordania 2
NG - Nigeria 2
NO - Norvegia 2
PE - Perù 2
TR - Turchia 2
AE - Emirati Arabi Uniti 1
BG - Bulgaria 1
CO - Colombia 1
FK - Isole Falkland (Malvinas) 1
HN - Honduras 1
IL - Israele 1
JM - Giamaica 1
KE - Kenya 1
KW - Kuwait 1
LU - Lussemburgo 1
MA - Marocco 1
MK - Macedonia 1
MY - Malesia 1
NZ - Nuova Zelanda 1
PK - Pakistan 1
PT - Portogallo 1
RO - Romania 1
RS - Serbia 1
SK - Slovacchia (Repubblica Slovacca) 1
VE - Venezuela 1
ZA - Sudafrica 1
Totale 6.156
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Città #
Santa Clara 643
Chandler 508
Houston 422
Jacksonville 359
Dublin 342
Singapore 295
Abidjan 212
Chicago 189
Boardman 155
Cambridge 98
Lawrence 98
Nanjing 98
Andover 97
Catania 96
Bremen 90
Toronto 86
Ashburn 73
Des Moines 58
Civitanova Marche 54
San Mateo 46
Shenyang 41
Nanchang 39
Saint Petersburg 39
Wilmington 37
Ottawa 29
Dakar 28
Changsha 21
Hebei 21
Jiaxing 21
Tianjin 18
Rome 11
San Francisco 11
São Paulo 11
Milan 9
Munich 9
Ann Arbor 8
Shanghai 8
Kunming 7
Los Angeles 7
Norwalk 7
Taizhou 7
Campinas 6
Council Bluffs 6
Jinan 6
Augusta 5
Baghdad 5
Belo Horizonte 5
Brno 5
Cagliari 5
Den Haag 5
Seattle 5
Zhengzhou 5
Fremont 4
Hangzhou 4
Lausanne 4
Liberty Lake 4
Mascalucia 4
Messina 4
Moscow 4
Naples 4
Ningbo 4
Pune 4
Rio de Janeiro 4
San Giovanni la Punta 4
Santa Teresa Di Riva 4
Beijing 3
Cherbourg-Octeville 3
Hong Kong 3
Joinville 3
Kraków 3
London 3
Mountain View 3
Phoenix 3
Sassari 3
St Petersburg 3
Washington 3
Aci Sant'Antonio 2
Almere Stad 2
Amman 2
Amsterdam 2
Araçoiaba da Serra 2
Bari 2
Belpasso 2
Belém 2
Betim 2
Brasília 2
Brussels 2
Cametá 2
Central 2
Curitiba 2
Edinburgh 2
Florianópolis 2
Foggia 2
Fuzhou 2
Goiânia 2
Grafing 2
Guangzhou 2
Helsinki 2
Horgen 2
Jundiaí 2
Totale 4.599
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Nome #
AL-BASED PRECIPITATE EVOLUTION DURING HIGH-TEMPERATURE ANNEALING OF AL IMPLANTED IN SI RID C-5307-2009 469
A Transport and Reaction Model for Simulating Cluster Secondary Ion Mass Spectrometry Depth Profiles of Organic Solids 121
Carbon Quantum Dots as Fluorescence Nanochemosensors for Selective Detection of Amino Acids 116
FATIGUE FAILURE IN PB-SN-AG ALLOY DURING PLASTIC-DEFORMATION - A 3D-SIMS IMAGING STUDY 109
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset 87
Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers 85
A wavelet-PCA method saves high mass resolution information in data treatment of SIMS molecular depth profiles 84
Analytical characterization of poly(pyrrole-3-carboxylic acid) films electrosynthesised on Pt, Ti and Ti/Al/V substrates 81
ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces 80
Evaluation of matrix effects in SIMS quantification of AlxGa1-xAs/GaAs heterostructures - a SNMS approach 78
DIFFUSION AND ELECTRICAL BEHAVIOR OF AL IMPLANTED INTO CAPPED SI RID C-5307-2009 78
SIMS characterization of surface-modified nanostructured titania electrodes for solar energy conversion devices 76
Electrical conductivity of InAs thin films 75
A study of Greek pottery and clay statuettes from the votive Deposit in the sanctuary of Demetra in Catania 75
Application of ESCA to fabrication problems in semiconductor industry 74
Bulk and Surface Characterization of Works of Art from the Monastero dei Benedettini 74
Separation and quantitation of metal ions by 4-(2-pyridylazo)resorcinol complexation in capillary electrophoresis-electrospray ionisation mass spectrometry 74
Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra 72
Characterization of conductive molecular wires assembled onto oxide by means of Time-of-Flight secondary ion mass spectrometry 72
RADIATION-ENHANCED DIFFUSION OF NA IN ALKALINE GLASSES 70
Na-surface segregation and oxygen depletion in particle bombardment of alkaline glasses 69
Ion versus neutral irradiation of thin films of amorphous SiO2: an in situ photoelectron spectroscopic study 69
Molecular depth profiling by nitric oxide-assisted secondary ion mass spectrometry 69
Effects of the substrate on ToF-SIMS spectra of thin films of some fluorinated compounds deposited on calcarenite 68
STRUCTURAL-PROPERTIES OF THERMAL EVAPORATED SNTE THIN-FILMS 66
Fatigue failure in Pb(95.5)Sn(2)Ag(2.5) solder joints: a combined SIMS/XRD study 66
Unsupervised analysis of big ToF-SIMS datasets: a statistical pattern recognition approach 66
Evaluation of five fluorinated compounds as calcarenite protectives 65
Oxygen Depletion in Electron Beam Bombarded Glass Surfaces Studied by XPS 65
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 65
ToF-SIMS of metal-complex-based supramolecular chemistry on oxide surfaces 65
ESCA Study of the Adhesion of Ag, Cu and Ni to Polysiloxane Resins Used on the Semiconductor Industry 65
Probing Archaeological and Artistic Solid Materials by Spatially Resolved Analytical Techniques 64
SNMS quantification of III-V compounds heterostructures 63
THE REACTION OF EXTREMELY THIN CO-ZR AND PD-TA LAYERS WITH SI(100) 62
Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers 62
User­-independent protocols for the analysis of complex ToF­SIMSdatasets without mass binning, peak picking and peak integration 62
Preparation and ESCA characterization of poly(vinyl chloride) surface-grafted with heparin-complexing poly(amido amine) chains 61
Erratum to "XPS study of five fluorinated compounds deposited on calcarenite stone. Part I: Unaged samples" 61
Extracting latent chemical information from ToF­SIMS data arising from chemical imaging 61
Structural and Electrical Effects on (A1-Si)/n+Si Ohmic Contact of in Situ Silicon Cleaning by Ar Ions Bombardment 60
Ion versus neutral irradiation of thin films of amorphous SiO2: An in situ X-ray photoelectron spectroscopy study 60
NI SURFACE-CHEMISTRY AND QUALITY OF THE AL/NI BOND IN ELECTRONIC DEVICES 60
Nitric oxide-assisted SIMS depth profiling of polymers with C60 primary ions 59
C60-SIMS molecular depth profiling of polymers with NO dosing. 59
Smart data treatment of ToF­SIMS spectra and depth profiles of polymer‐based materials 59
Characterization of conductive molecular wires assembled onto oxide by means of ToF-SIMS 58
XPS investigation of the effects induced by the silanization on real glass surfaces 57
Segregation of gallium at SiO2/Si interfaces during sputtering with Ga+ ions: experimental and computer simulation study 57
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 57
ESCA and SIMS study of tetrabromobisphenol-A 57
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 57
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 56
Molecular depth profiles of PMMA by NO-assisted sputtering with high energetic Cs ions 56
XPS study of five fluorinated compounds deposited on calcarenite stone: Part I. Unaged samples 55
Structural and electrical effects od (Al-Si) n+ ohmic contact of in situ silicon cleaning bi Ar+ ion bombardment 54
Electrical properties of Electron-Gun Evaporated InAs Thin Films 54
XPS study of five fluorinated compounds deposited on calcarenite stone - Part II: Aged samples 54
Strategies based on calixcrowns for the detection and removal of cesium ions from alkali-containing solutions 54
Testing a fluorinated compound as a protective material for calcarenite 53
ESCA study of the adhesion of Ag, Cu and Ni to polysiloxane resins used in the semiconductor industry 53
Fenomeni interfacciali in sistemi metallo-resina di interesse nell'industria dei semiconduttori 53
C60-SIMS molecular depth profiling of polymers with NO 53
Novel approaches to data mining in molecular depth profiling: from the simulation to sophisticated data treatment 53
INFLUENCE OF SURFACE CHEMICAL-COMPOSITION ON THE RELIABILITY OF AL CU BOND IN ELECTRONIC DEVICES 52
Effect of the substrate on the fragmentation patterns in ToF-SIMS spectra of fluorinated compounds for stone protection 52
SNMS characterization of ion irradiated GaAs surfaces 52
ToF-SIMS images and spectra of biomimetic calcium silicate-based cements after storage in solutions simulating the effects of human biological fluids 52
Formazione di ioni positivi e negativi per impatto elettronico in spettrometria di massa 51
ToF-SIMS imaging of mineralization process occurring in cement pastes used a root-end filling materials. An in vitro study 51
Stepwise preparation and surface characterisation of polypyridine based metal complexes onto oxide surfaces 51
Dual beam depth profiling with gallium and argon primary ions: a ToF-SIMS study 51
INTERFACE AND THIN-FILM ANALYSIS - COMPARISON OF METHODS, TRENDS 50
Un nuovo derivato ciclodestrinico per la separazione chinale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 50
Composizione verso proprietà macroscopiche: un'applicazione nel campo dei beni culturali 50
ToF­SIMS characterization of conductive molecular wires assembled onto oxide substrates 50
Uso di tecniche ESCA e RBS per la caratterizzazione di un film di ossidi di cobalto e cromo deposto su vetro 49
SNMS and imaging SIMS study of the interface between Al99Si1 alloy and sputter cleaned silicon interface 49
Functionalization of oxide surfaces by terpyridine phosphonate ligands:surface reactions and anchoring geometry 48
Surface (XPS, SIMS) chemical investigation on poly(pyrrole-3-acetic acid) films electrosynthesized on Ti and TiAlV substrates for the development of new bioactive substrates 48
SIMS and SNMS study of the interface between Al-1%Si alloy and sputter cleaned silicon surface 48
ToF-SIMS imaging of mineralisation process occurring in cement pastes used as root-end filling materials. An in vitro study 48
Experimental Implementation of Molecule Shift Keying for Enhanced Molecular Communication 47
ToF-SIMS study of the effects of the substrate on the fragmentation patterns of some fluorinated compounds 46
Un nuovo derivato ciclodestrinico per la separazione chirale del salsolinolo e della ciclobenzaprina in cromatografia elettrocinetica 46
Nuclear and Electronic Energy Loss of Noble Gas Ions Bombarding Solid Benzene and Relative Chemical Effects 46
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 46
SIMS DEPTH PROFILING OF SI/SIO2/SI LAYERS BY USING SELF-SPUTTERED GA+ FROM A GALLIUM LIQUID-METAL ION-SOURCE 45
Microbial attack on basalts from Etna region: a SIMS and IR study 44
Nuclear and electronic energy loss of noble gas ions bombarding solid benzene and related chemical effects 44
Two calix-crown based stationary phases, synthesis, chromathographic performance and X-ray photoelectron spectroscopy investigation 44
KINETICS OF BROMINE MIGRATION AND COPPER REACTIONS AT COPPER EPOXY-RESIN INTERFACES 44
INTERFACIAL CHEMISTRY AT REAL RESIN-METAL INTERFACES OF ELECTRONIC DEVICES 41
The 6-derivative of beta-cyclodextrin with succinic acid: a new chiral selector for CD-EKC 40
Fluorinated Phosphoric Ester-based Protective Material for Limestone-made Ancient Monuments, Buildings and Artifacts: an X-ray Photoelectron Spectroscopy Study 38
Studi ESCA della struttura chimica di interfaccia in problemi di adesione 38
ToF-SIMS characterization of five fluoroalkyl derivatives of possible interest as water repellent for stone protection 37
THE REACTION OF AMORPHOUS CO-ZR LAYERS WITH SI(100) AND SIO2 SUBSTRATES BY ANNEALING IN VACUUM AND NH3 36
ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection 35
Interfacial instability of liquid interphase improves molecular communication density 31
Totale 6.342
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Categoria #
all - tutte 22.218
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 22.218
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202086 0 0 0 0 0 0 0 0 0 0 57 29
2020/2021519 9 47 72 0 163 7 70 9 50 1 76 15
2021/2022861 92 122 1 17 193 12 103 30 64 3 32 192
2022/20231.381 104 59 20 205 153 238 0 220 316 5 39 22
2023/2024571 29 146 11 27 19 131 4 31 8 13 104 48
2024/20251.816 32 327 112 90 474 337 65 50 151 178 0 0
Totale 6.363