IRIS
SPAMPINATO, VALENTINA
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 2.249
AS - Asia 1.832
EU - Europa 952
SA - Sud America 219
AF - Africa 151
OC - Oceania 3
Continente sconosciuto - Info sul continente non disponibili 1
Totale 5.407
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 2.158
SG - Singapore 776
CN - Cina 614
RU - Federazione Russa 411
IT - Italia 213
BR - Brasile 182
KR - Corea 174
VN - Vietnam 96
FR - Francia 86
CI - Costa d'Avorio 68
NG - Nigeria 44
UA - Ucraina 44
CA - Canada 41
MX - Messico 41
IE - Irlanda 38
BD - Bangladesh 30
GB - Regno Unito 30
BE - Belgio 24
DE - Germania 21
PL - Polonia 20
HK - Hong Kong 19
IN - India 19
AR - Argentina 18
BJ - Benin 14
IR - Iran 14
NL - Olanda 13
JP - Giappone 12
UZ - Uzbekistan 12
TR - Turchia 11
SE - Svezia 10
TW - Taiwan 10
ES - Italia 9
PK - Pakistan 8
FI - Finlandia 7
IQ - Iraq 7
ZA - Sudafrica 7
AE - Emirati Arabi Uniti 6
AT - Austria 6
PH - Filippine 5
SA - Arabia Saudita 5
CH - Svizzera 4
CO - Colombia 4
CZ - Repubblica Ceca 4
EC - Ecuador 4
ID - Indonesia 4
MA - Marocco 4
VE - Venezuela 4
AU - Australia 3
DZ - Algeria 3
GR - Grecia 3
JM - Giamaica 3
TN - Tunisia 3
CL - Cile 2
EE - Estonia 2
EG - Egitto 2
JO - Giordania 2
KE - Kenya 2
KH - Cambogia 2
LT - Lituania 2
PA - Panama 2
PE - Perù 2
SN - Senegal 2
SY - Repubblica araba siriana 2
BA - Bosnia-Erzegovina 1
BG - Bulgaria 1
BS - Bahamas 1
BY - Bielorussia 1
EU - Europa 1
GY - Guiana 1
HN - Honduras 1
IL - Israele 1
KW - Kuwait 1
MM - Myanmar 1
MY - Malesia 1
NA - Namibia 1
PT - Portogallo 1
PY - Paraguay 1
SC - Seychelles 1
SK - Slovacchia (Repubblica Slovacca) 1
SV - El Salvador 1
TT - Trinidad e Tobago 1
UY - Uruguay 1
Totale 5.407
Salva come PNG Salva come JPEG
Città #
Santa Clara 514
Singapore 417
Dallas 360
Hefei 301
Ashburn 244
San Jose 217
Moscow 173
Seoul 172
Boardman 84
Los Angeles 70
Abidjan 68
Lauterbourg 61
Beijing 60
Catania 57
Chandler 47
Chicago 42
Dublin 38
Jacksonville 35
Ho Chi Minh City 33
Washington 30
Lagos 28
Hanoi 23
Rome 23
Hong Kong 18
Milan 18
Warsaw 18
Council Bluffs 17
Denver 17
Abuja 16
Gustavo Adolfo Madero 15
New York 15
Toronto 15
Cotonou 14
Tehran 14
Buffalo 13
Mexico City 13
Amsterdam 12
Brussels 12
Phoenix 12
Nanjing 11
Paris 11
Andover 10
Cambridge 10
Lawrence 10
Montreal 10
Taipei 10
Tokyo 10
Civitanova Marche 9
Mechelen 9
Stockholm 9
São Paulo 9
Tashkent 9
Houston 8
Mumbai 8
Palermo 8
San Mateo 8
Atlanta 7
Ottawa 7
Acireale 6
Ankara 6
Belpasso 6
Boston 6
Brasília 6
Brooklyn 6
Charlotte 6
Hebei 6
Orem 6
Porto Alegre 6
Shenyang 6
Vienna 6
Bremen 5
Des Moines 5
Haiphong 5
Manchester 5
Nuremberg 5
Poplar 5
Querétaro 5
Rio de Janeiro 5
Assago 4
Baghdad 4
Belo Horizonte 4
Besano 4
Bologna 4
Campinas 4
Johannesburg 4
Mascalucia 4
Messina 4
Naples 4
Orsay 4
Partanna 4
Saint Petersburg 4
San Giovanni la Punta 4
Shanghai 4
Tianjin 4
Biên Hòa 3
Changsha 3
Chennai 3
Contagem 3
Da Nang 3
Dhaka 3
Totale 3.703
Salva come PNG Salva come JPEG
Nome #
An innovative “Up-and-Down” adsorption processes for pyrene removal from acid wastewater as new approach in water remediation 195
Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization 132
ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces 131
Chemical Mapping for Insight into Early 1900s Historical Photographic Films 119
Carbon nanotube EUV pellicle tunability and performance in a scanner-like environment 115
Controlled Density Patterning of Tolylterpyridine-Tagged Oligonucleotides 114
Physico-chemical characterization of polyimide passivation layers for high power electronics applications 105
CNT EUV pellicle tunability and performance in a scanner-like environment 104
Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption Mechanism 100
Filling Nanoporous Polymer Thin Films: An Easy Route Toward the Full Control of the 3D Nanostructure 99
Al rich PVD protective coatings: A promising approach to prevent T91 steel corrosion in stagnant liquid lead 98
Defect Mitigation in Area-Selective Atomic Layer Deposition of Ruthenium on Titanium Nitride/Dielectric Nanopatterns 98
Nitric oxide-assisted SIMS depth profiling of polymers with C60 primary ions 96
A flexible organic memory device with a clearly disclosed resistive switching mechanism 93
Area-Selective Atomic Layer Deposition of TiN Using Trimethoxy(octadecyl)silane as a Passivation Layer 92
ToF-SIMS of metal-complex-based supramolecular chemistry on oxide surfaces 90
[Co/Ni]-CoFeB hybrid free layer stack materials for high density magnetic random access memory applications 89
Direct imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors 86
A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication 86
Influence of different cleaning processes on the surface chemistry of gold nanoparticles 84
Black-silicon production process by CF4/H2plasma 84
Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study. (Journal of Physical Chemistry B (2015) 119 (33) (10784-10797) DOI: 10.1021/acs.jpcb.5b05625) 84
Temperature-assisted high-energy-per-atom argon cluster SIMS of layered hybrid nanomaterials 83
A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices 82
Characterisation of nanomaterial hydrophobicity using engineered surfaces 82
Orbitrap™-SIMS analysis of advanced semiconductor inorganic structures 81
Nitric oxide-assisted SIMS depth profiling of polymers with C60 primary ions 80
Stepwise preparation and surface characterisation of polypyridine based metal complexes onto oxide surfaces 79
Functionalization of oxide surfaces by terpyridine phosphonate ligands:surface reactions and anchoring geometry 79
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study 76
Understanding the kinetics of Metal Induced Lateral Crystallization process to enhance the poly-Si channel quality and current conduction in 3-D NAND memory 76
Co Active Electrode Enhances CBRAM Performance and Scaling Potential 76
Nanostructured gold surfaces coated by silica-based layers as SPR and MS imaging platform 75
SIMS Analysis of Thin EUV Photoresist Films 75
Self-focusing SIMS: A metrology solution to area selective deposition 74
Multi-Functionalized Carbon Nano-onions as Imaging Probes for Cancer Cells 74
Material surface engineering for multiplex cell culture in microwell 72
Surface analysis of gold nanoparticles functionalized with thiol-modified glucose SAMs for biosensor applications 71
Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS 70
Combined AFM and ToF-SIMS analyses for the study of filaments in organic resistive switching memories 70
The role of underlayers in EUVL 69
Effect of alumina coatings on corrosion protection of steels in molten lead 69
Effects of Cs+ and Arn+ ion bombardment on the damage of graphite crystals 69
VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS 69
Stratigraphic analysis of intercalated graphite electrodes in aqueous inorganic acid solutions 68
First demonstration of similar to 3500 cm(2)/V-s electron mobility and sufficient BTI reliability (max V-ov up to 0.6V) In0.53Ga0.47As nFET using an IL/LaSiOx/HfO2 gate stack 68
Understanding Selectivity Loss Mechanisms in Selective Material Deposition by Area Deactivation on 10 nm Cu/SiO 2 Patterns 68
Physico-chemical characterization of ultra thin films of functional supramolecular systems on surfaces 67
Organic and perovskite solar cells for space applications 65
Nitric oxide-assisted cluster- SIMS depth profiling of polymers 65
Porous silicon-cyclodextrin based polymer composites for drug delivery applications 63
Operationally Stable Perovskite Light Emitting Diodes with High Radiance 63
Nanomechanical Characterization of Organic Surface Passivation Films on 50 nm Patterns during Area-Selective Deposition 60
Ferroelectric La-Doped ZrO2/HfxZr1−xO2 Bilayer Stacks with Enhanced Endurance 60
Molecular depth profiling of polycarbonate by nitric oxide-assisted C60 SIMS 59
OrbiSIMS depth profiling of semiconductor materials - useful yield and depth resolution 59
Surface analysis of zinc-porphyrin functionalized carbon nano-onions 58
Efficient long-range conduction in cable bacteria through nickel protein wires 58
Spectroscopy: A new route towards critical-dimension metrology of the cavity etch of nanosheet transistors 57
Light-Induced Degradation of Perovskite Solar Cells: The Influence of 4-Tert-Butyl Pyridine and Gold 57
50 nm gate length FinFET biosensor the outlook for single-molecule detection 56
The influence of AlN nucleation layer on RF transmission loss of GaN buffer on high resistivity Si (111) substrate 56
Modulation of surface bio-functionality by using gold nanostructures on protein repellent surfaces 53
Enhanced Laterally Resolved ToF-SIMS and AFM Imaging of the Electrically Conductive Structures in Cable Bacteria 53
Seed layer impact on structural and magnetic properties of [Co/Ni] multilayers with perpendicular magnetic anisotropy 52
Surface analysis in the semiconductor industry: Present use and future possibilities 51
The Influence of AlN Nucleation Layer on Radio Frequency Transmission Loss of AlN‐on‐Si Heterostructure 50
Hybrid perovskites depth profiling with variable-size argon clusters and monatomic ions beams 47
On the development of a reliable gate stack for future technology nodes based on III-V materials 42
Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS 39
Reactive High-Energy-Per-Molecule Oxygen Clusters for Reliable ToF-SIMS Depth Profiling of Hybrid Nanomaterials 26
GHz-Scanning Acoustic Microscopy combined with ToF-SIMS/AFM for wafer-level failure analysis of bonding interfaces 23
Towards Carrier Profiling in Nanometer-wide Si Fins with Micro Four-Point Probe 20
Dopant Activation Depth Profiling for Highly Doped Si:P By Scanning Spreading Resistance Microscopy (SSRM) and Differential Hall Effect Metrology (DHEM) 15
Self-Focusing SIMS Enables Quantitative Dopant Analysis in Nanoscale Silicon Devices beyond Conventional Spatial Resolution Limits 2
Solid-State 3D Electrochemiluminescence Platform: Depth-Tuned Ru Complexes Positioning for Label-Free High-Resolution Imaging 1
Totale 5.526
Salva come PNG Salva come JPEG
Categoria #
all - tutte 18.477
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 18.477
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/202282 10 15 0 0 17 0 10 1 9 0 3 17
2022/2023211 12 6 0 12 23 17 0 23 30 9 65 14
2023/2024479 4 25 45 28 42 137 10 43 8 14 56 67
2024/20251.469 18 129 58 30 387 248 40 14 143 127 89 186
2025/20263.134 220 443 460 213 445 500 351 66 139 134 74 89
2026/202718 18 0 0 0 0 0 0 0 0 0 0 0
Totale 5.526